Formation of Lasi2-X Layers on Si by High-Current La Ion Implantation

XJ Tang,XQ Cheng,RS Wang,BX Liu
DOI: https://doi.org/10.1143/jjap.42.2834
IF: 1.5
2003-01-01
Japanese Journal of Applied Physics
Abstract:Lanthanum ion implantation into Si was conducted using a metal vapor vacuum arc ion source, and the continuous and relatively stable LaSi2-x layers on the Si surface with a strong texture and low electrical resistivity were directly obtained with neither external heating nor post annealing. The optimal experimental parameters for synthesizing LaSi2-x are an ion current density of 52.8 muA/cm(2), corresponding to a formation temperature of around 390degreesC, and an implantation dose of 2 x 10(17) ions/cm(2). In addition, the formation mechanism of the LaSi2-x phase is discussed, in terms of the temperature rise caused by ion beam heating and the ion dose in the process of implantation.
What problem does this paper attempt to address?