Fabrication of Prsi2 Layers and Associated Morphology on Si Surface by A Single-Step High Current Pr-Ion Implantation

XQ Cheng,BX Liu
DOI: https://doi.org/10.1016/s0925-8388(02)00399-7
IF: 6.2
2002-01-01
Journal of Alloys and Compounds
Abstract:PrSi2 layers were fabricated on Si wafers with metal vapor vacuum arc ion implantation without in-situ-heating or post-annealing. Under optimal experiment conditions, the obtained PrSi2 layers were of good crystalline structure and featured plain and continuous morphology. In addition, the formation mechanism of the PrSi2 layers is also discussed in terms of the temperature rise caused by ion beam heating as well as the variation of ion implantation dose.
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