Formation of TaSi2 and associated fractal growth on Si surface upon high current pulsed Ta-ion implantation

X.Q. Cheng,R.S. Wang,X.J. Tang,B.X. Liu
DOI: https://doi.org/10.1016/S0925-8388(03)00491-2
IF: 6.2
2004-01-01
Journal of Alloys and Compounds
Abstract:Using a metal vapor vacuum arc ion source, tantalum ion implantation was conducted to synthesize TaSi2 phases on silicon wafers, and the continuous and stable TaSi2 layers were directly obtained with neither external heating nor post-annealing. Interestingly, under some specific conditions, the formed TaSi2 grains organized themselves in a fractal pattern featuring self-similarity. The mechanism of the TaSi2 formation as well as the growth of the fractal pattern is discussed in terms of the temperature rise caused by the energetic Ta ions beam heating effect and the dose adjustment during high current pulsed Ta-ion implantation far from equilibrium.
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