Formation of CeSi2 on the Si surface upon high current pulsed Ce-ion implantation

X.Q. Cheng,X.J. Tang,B.X. Liu
DOI: https://doi.org/10.1016/S0925-8388(03)00679-0
IF: 6.2
2004-01-01
Journal of Alloys and Compounds
Abstract:Cerium-ion implantation was conducted to synthesize Ce-disilicide films on silicon wafers, using a metal vapor vacuum arc ion source. The continuous CeSi2 films were directly obtained at relatively low temperature with neither external heating nor post-annealing and the surface morphology varied with the variation of the implantation parameters. The formation mechanism of the CeSi2 phase is also discussed in terms of the temperature rise caused by ion beam heating and the ion dose in the far-from-equilibrium process of high current pulsed Ce-ion implantation.
What problem does this paper attempt to address?