A Preliminary-Study of the Formation of Wsi2 by High-Current W-Ion Implantation

DH ZHU,HB LU,K TAO,BX LIU
DOI: https://doi.org/10.1088/0953-8984/5/31/014
1993-01-01
Abstract:Two differently structured WSi2 phases were formed by direct W ion implantation, for the first time, into silicon wafers using a metal vapour vacuum arc ion source. Implantation of W ions was conducted with an extract voltage of 40 kV, various beam densities from 50 to 115 muA cm-2 and a fixed dose of 5 x 10(17) CM-2. It was found that the formation Of WSi2 with either a hexagonal or a tetragonal structure depended on the ion current density. The temperature rise caused by beam heating and the beam-striking time related to the dose were calculated, and they were responsible for the formation and evolution related to the differently structured WSi2 phases.
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