Electrothermal modeling of coaxial through silicon via (TSV) for three-dimensional ICs

Wensheng Zhao,Xiaopeng Wang,XiaoLong Xu,Wenyan Yin
DOI: https://doi.org/10.1109/EDAPS.2010.5683012
2010-01-01
Abstract:An equivalent lumped- element circuit model of coaxial TSV is proposed in this paper, in which both frequency-and temperature-dependent elements are extracted using the partialelement equivalent-circuit (PEEC) method. One important aspect of coaxial TSV modelling is its capacitance extraction, in which MOS effects are taken into account. The circuit model is also reduced to a transmission line one, with its transmission characteristics predicted theoretically for the silicon material but with different resistivities.
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