Copper-Based Multimetal-Contact Rf Mems Switch

Zhaoqun Jiang,Zhuhao Gong,Zewen Liu
DOI: https://doi.org/10.1109/icept.2016.7583193
2016-01-01
Abstract:A novel multilayer stack Au/Cu/Au is proposed to increase the hardness of contact material of RF MEMS switch. The nanoindentation test results indicate that the hardness of Au/Cu/Au is 7 times higher than electroplated Au-film. The root-mean-square roughness of Au/Cu/Au is 13.7nm, while that of electroplated Au is 30.2nm. The pull-in voltage of the designed switch is 36.6V, the switch-on time is 39μs and the switch-off time is 8μs. The measured insertion loss is better than -0.5dB and the isolation is better than -25dB up to 20GHz.
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