Study of Ge Epitaxial Growth on Si Substrates by Cluster Beam Deposition

JL Xu,JY Feng
DOI: https://doi.org/10.1016/s0022-0248(02)00951-x
IF: 1.8
2002-01-01
Journal of Crystal Growth
Abstract:Ge epitaxial layers with reasonable quality were grown on Si (111) substrates by cluster beam deposition (CBD) process. Molecular dynamics study of the low energy Ge clusters deposition process utilizing the Stillinger–Weber two- and three-body interaction potentials was carried out to compare the experimental results. Both experimental and simulation results prove that the substrate temperature plays a dominant role in the epitaxial growth of Ge films in CBD process. The influence mechanisms of temperature are discussed.
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