Acceptor Formation Mechanisms Determination from Electrical and Optical Properties of P-Type ZnO Doped with Lithium and Nitrogen

X. H. Wang,B. Yao,Z. P. Wei,D. Z. Sheng,Z. Z. Zhang,B. H. Li,Y. M. Lu,D. X. Zhao,J. Y. Zhang,X. W. Fan,L. X. Guan,C. X. Cong
DOI: https://doi.org/10.1088/0022-3727/39/21/010
2006-01-01
Abstract:A lithium (Li) and nitrogen (N) dual-doped p-type ZnO film ( ZnO : ( Li, N)) was deposited on c-plane sapphire by RF-magnetron sputtering of Zn-2 at.% Li alloy using mixed gases of oxygen and nitrogen and then annealing in N-2 flow. It has a carrier concentration of 3.07 x 10(16) cm(-3) and Hall mobility of 1.74 cm(2) V-1 s(-1). XPS measurement shows that there are Li-Zn-N complexes in the p-type ZnO : ( Li, N), which are demonstrated by photoluminescence measured at various temperatures and different excitation powers to be acceptors and responsible for p-type conductivity of the ZnO : ( Li, N). The optical level of the LiZn-N complex acceptor is estimated to be about 126 meV by measurement of emission energy of free electron to the acceptor level.
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