Hydrogen‐assisted Nitrogen‐acceptor Doping in ZnO

J. G. Lu,S. Fujita
DOI: https://doi.org/10.1002/pssa.200778867
2008-01-01
Abstract:N-doped ZnO (ZnO:N) thin films were prepared by atmospheric pressure mist chemical vapor deposition. The as-grown ZnO:N film was of high resistivity with ambiguous carrier type, while the annealed sample showed p-type conductivity with a resistivity of 22.3 Omega cm and hole concentration of 5.49 x 10(17) cm(-3). The crystallinity of ZnO films was improved by the annealing treatment. Unintentionally H impurities introduced into the as-grown film could be annealed out and a near-edge absorption related to the N states in band gap was present in the annealed sample, which was indicative of the appearance of activated N in ZnO during the annealing process. A hydrogen-assisted nitrogen-acceptor doping mechanism was proposed to explain the observation of p-type ZnO. (c) 2008 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
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