p-Type conduction in Al–N co-doped ZnO films

Guodong Yuan,Zhizhen Ye,Liping Zhu,Yujia Zeng,Jingyun Huang,Qing Qian,Jianguo Lu
DOI: https://doi.org/10.1016/j.matlet.2004.02.056
IF: 3
2004-01-01
Materials Letters
Abstract:p-Type conduction in ZnO thin films was realized by Al–N co-doping method. The ZnO films were prepared on α-Al2O3 (0001) substrates by DC reactive magnetron sputtering technique. AlxZn1−x (x=0.1) target and ammonia gas were used as the source of Al and N, respectively. The growth temperature was varied from 400 to 600 °C. The ZnO films deposited at 450 °C showed p-type conduction, with a resistivity of 278 Ω cm, a Hall mobility of 1.32 cm2/V s and a carrier density of 1.7×1016 cm−3. X-ray diffraction (XRD) measurements showed that all of the Al–N co-doped ZnO films grown at different temperature were of completely (002)-preferred orientation. Second ion mass spectroscopy (SIMS) tests proved that the presence of Al facilitated the incorporation of N into ZnO. The p-type ZnO thin films possess a transmittance of about 90% in the visible region and a band gap of 3.28 eV at room temperature.
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