Deposition of Al-N Co-Doped P-Type Zn0.95Mg0.05O Thin Films

Jian Zhongxiang,Ye Zhizhen,Gao Guohua,Lu Yangfan,Zhao Binghui,Zeng Yujia,Zhu Liping
DOI: https://doi.org/10.3969/j.issn.1674-4926.2007.03.020
2007-01-01
Chinese Journal of Semiconductors
Abstract:Al-N codoped p-type Zn0.95Mg0.05O thin films were deposited on glass substrates by DC reactive manetron sputtering, N2O was used as the N doping source. The XRD patterns showed that the introduction of Mg and Al has no effect on the crystallinity of the films, the films all showed c-axis preferential orientation.A conversion of conduction type was confirmed by Hall effect measurement in a range of temperature from 400 to 530℃.The lowest reliable room temperature resistivity was found to be 58.5Ω·cm,with a carrier concentration of 1.95e17cm-3 and a Hall mobility of 0.546cm2/(V·s).The p-type behavior is stable.The optical transmittance spectra reveal blue shift in optical bandgap for the p-type Zn0.95Mg0.05O comparing with that for pure ZnO,which confirms the effective incorporation of Mg.The band gap of alloy is controllable.
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