Deposition of Al-N Co-doped p-type Zn0.95Mg0.05O thin films

Zhongxiang Jian,Zhizhen Ye,Guohua Gao,Yangfan Lü,Binghui Zhao,Yujia Zeng,Liping Zhu
2007-01-01
Chinese Journal of Semiconductors
Abstract:Al-N codoped p-type Zn0.95Mg0.05O thin films were deposited on glass substrates by DC reactive magnetron sputtering, N2O was used as the N doping source. The XRD patterns showed that the introduction of Mg and Al has no effect on the crystallinity of the films, the films all showed c-axis preferential orientation. A conversion of conduction type was confirmed by Hall effect measurement in a range of temperature from 400 to 530°C. The lowest reliable room temperature resistivity was found to be 58.5 Ω·cm, with a carrier concentration of 1.95 × 1017 cm-3 and a Hall mobility of 0.546 cm2/(V·s). The p-type behavior is stable. The optical transmittance spectra reveal blue shift in optical bandgap for the p-type Zn0.95Mg0.05O comparing with that for pure ZnO, which confirms the effective incorporation of Mg. The band gap of alloy is controllable.
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