Synthesis and Characterization of Al-N Codoped Zn_(1-x)Mg_xO Thin Films

Gao Guohua,Ye Zhizhen,Jian Zhongxiang,Lu Yangfan,Hu Shaohua,Zhao Binghui
2007-01-01
Abstract:The Al-N codoped Zn1-xMgxO thin films were deposited on glass and single-crystal Si substrates by DC reactive magnetron sputtering.The thin films possess a good crystallinity with c-axis orientation,confirmed by XRD patterns.Via Hall effect measurement,the result shows that the resistivity of the p-Zn0.9Mg0.1O thin film is 8.28 Ω·cm,the hole concentration and mobility are 1.09×1019 cm-3 and 0.069 cm2/V·s.The transmittance spectra reveal a distinct blue shift between Al-N codoped Zn1-xMgxO and undoped ZnO thin films.With good rectifying characteristics,and low current leakage under the bias voltage,the I-V characteristics of the p-Zn0.9Mg0.1O/n-Si heterojunction confirms the p-type conduction of the Al-N codoped Zn0.9Mg0.1O thin film.
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