Growth Ambient Dependent Electrical Properties of Lithium and Nitrogen Dual-Doped Zno Films Prepared by Radio-Frequency Magnetron Sputtering

T. T. Zhao,T. Yang,B. Yao,C. X. Cong,Y. R. Sui,G. Z. Xing,Y. Sun,S. C. Su,H. Zhu,D. Z. Shen
DOI: https://doi.org/10.1016/j.tsf.2009.09.008
IF: 2.1
2010-01-01
Thin Solid Films
Abstract:Lithium (Li) and nitrogen (N) dual-doped ZnO films with wurtzite structure were prepared by radio-frequency magnetron sputtering ZnO target with Li3N in growth ambient of pure Ar and the mixture of Ar and O2, respectively, and then post annealing techniques. The film showed week p-type conductivity as the ambient was pure Ar, but stable p-type conductivity with a hole concentration of 3.46×1017cm−3, Hall mobility of 5.27cm2/Vs and resistivity of 3.43Ω cm when the ambient is the mixture of Ar and O2 with the molar ratio of 60:1. The stable p-type conductivity is due to substitution of Li for Zn (LiZn) and formation of complex of interstitial Li (Lii) and substitutional N at O site, the former forms a LiZn acceptor, and the latter depresses compensation of Lii donor for LiZn acceptor. The level of the LiZn acceptor is estimated to be 131.6meV by using temperature-dependent photoluminescence spectrum measurement and Haynes rule. Mechanism about the effect of the ambient on the conductivity is discussed in the present work.
What problem does this paper attempt to address?