P-Type ZnO Thin Films Fabricated by Dc Magnetron Reactive Sputtering Method at Different Substrate Temperatures

Er-Mei Jian,Zhizhen Ye,Wei-Chang Liu,Haiping He,Xiuquan Gu,Liping Zhu,Binghui Zhao
2008-01-01
Abstract:p-type ZnO thin films have been realized via co-doping of In and N by using dc reactive magnetron sputtering method. X-ray diffraction (XRD) measurement showed that all films possessed a good crystallinity with c-axis preferential orientation. The lowest reliable room-temperature resistivity was found to be 35.6 Ω•cm with carrier concentration of 1.57×10^18 cm^(-3) and Hall mobility of 0.111 cm^2•V^(-1)•s^(-1). X-ray photo-electron spectroscopy confirms that In had been incorporated into the ZnO films effectively and the presence of In enhanced the incorporation of N. The transmittance spectrum revealed that the transmittance of all films was about 90% in the visible region.
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