Fabrication of P-Type ZnO Thin Films Via DC Reactive Magnetron Sputtering by Using Na As the Dopant Source

L. L. Yang,Z. Z. Ye,L. P. Zhu,Y. J. Zeng,Y. F. Lu,B. H. Zhao
DOI: https://doi.org/10.1007/s11664-006-0047-7
IF: 2.1
2007-01-01
Journal of Electronic Materials
Abstract:The Na-doped p-type ZnO thin films were prepared by DC reactive magnetron sputtering. Two types of substrates were used for separate testing purposes: silicon wafers for crystallinity measurements and glass slides for electrical and optical transmittance measurements. The lowest room-temperature resistivity under the optimal condition was 59.9 Ω cm, with a Hall mobility of 0.406 cm2 V−1s−1 and a carrier concentration of 2.57 × 1017 cm−3. The Na-doped ZnO thin films possessed a good crystallinity with c-axis orientation and a high transmittance (∼85%) in the visible region. The effects of the substrate temperature on the crystallinity and the electrical properties were discussed.
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