Fabrication and Characteristics of the Low-Resistive P-Type ZnO Thin Films by DC Reactive Magnetron Sputtering

C Wang,ZG Ji,JH Xi,J Du,ZZ Ye
DOI: https://doi.org/10.1016/j.matlet.2005.10.057
IF: 3
2006-01-01
Materials Letters
Abstract:ZnO thin films were deposited onto glass substrates by DC reactive magnetron sputtering using pure zinc disk as sputtering target and Ar–N2–O2 mixture as sputtering gas. The influence of N2-to-O2 ratio as well as annealing treatment on the structural and electrical characteristics of the films was studied. By optimizing the N2-to-O2 ratio, low-resistive p-type ZnO thin films were obtained. The film prepared at N2-to-O2 ratio of 20:10 and annealed at 450 °C for 3 h has the lowest resistivity (8.34 Ω cm) and the highest hole concentration (7.47×1018 cm−3).
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