Sketched oxide single-electron transistor
Guanglei Cheng,Pablo F. Siles,Feng Bi,Cheng Cen,Daniela F. Bogorin,Chung Wung Bark,Chad M. Folkman,Jae-Wan Park,Chang-Beom Eom,Gilberto Medeiros-Ribeiro,Jeremy Levy
DOI: https://doi.org/10.1038/nnano.2011.56
IF: 38.3
2011-01-01
Nature Nanotechnology
Abstract:Devices that confine and process single electrons represent an important scaling limit of electronics 1 , 2 . Such devices have been realized in a variety of materials and exhibit remarkable electronic, optical and spintronic properties 3 , 4 , 5 . Here, we use an atomic force microscope tip to reversibly ‘sketch’ single-electron transistors by controlling a metal–insulator transition at the interface of two oxides 6 , 7 , 8 . In these devices, single electrons tunnel resonantly between source and drain electrodes through a conducting oxide island with a diameter of ∼1.5 nm. We demonstrate control over the number of electrons on the island using bottom- and side-gate electrodes, and observe hysteresis in electron occupation that is attributed to ferroelectricity within the oxide heterostructure. These single-electron devices may find use as ultradense non-volatile memories, nanoscale hybrid piezoelectric and charge sensors, as well as building blocks in quantum information processing and simulation platforms.