Study of Incubation Layers in Microcrystalline Silicon Solar Cells

Zhang Xiaodan,Zhao Ying,Gao Yantao,Zhu Feng,Wei Changchun,Sun Jian,Geng Xinhua,Xiong Shaozhen
DOI: https://doi.org/10.3969/j.issn.1674-4926.2006.06.015
2006-01-01
Abstract:The structure of microcrystalline silicon thin film solar cells prepared by very high frequency plasma enhanced chemical vapor deposition,is studied.Raman measurements indicate that there is an amorphous incubation layer at the p/i interface in the solar cells.The thickness of the incubation layer increases with increasing silane concentration and decreasing discharge power.A suitable silane concentration and discharge power can be used to reduce the thickness of the incubation layer.
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