In Situ TEM Studies of Ferroelectric Thin Films

P Gao,C Nelson,J Jokisaari,S Baek,C Eom,E Wang,X Pan

DOI: https://doi.org/10.1017/s1431927611007689

IF: 4.0991

2011-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

What problem does this paper attempt to address?

Study of Thin-Film Ferroelectric Heterostructures by TEM and PFM

J Jokisaari,C Nelson,S Kim,P Gao,S Baek,C Eom,X Pan

DOI: https://doi.org/10.1017/s1431927611008117

IF: 4.0991

2011-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
An in Situ TEM Study of Ferroelastic Domain Mobility

P. Gao,J. Jokisaari,C. Nelson,S.-H. Baek,M. Trassin,C.W. Bark,R. Ramesh,C.-B. Eom,X. Pan

DOI: https://doi.org/10.1017/s1431927613009495

IF: 4.0991

2013-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Direct Observations of Retention Failure in Ferroelectric Memories by in Situ Transmission Electron Microscopy

P. Gao,C. Nelson,J. Jokisaari,Y. Zhang,X. Pan,S. Baek,C. Bark,C. Eom

DOI: https://doi.org/10.1017/s1431927612011087

IF: 4.0991

2012-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
In-situ Fabrication, Manipulation and Property Measurements of Single Nanotubes and Nanowires with Near Atomic Resolution

L-M Peng,Q Chen,JY Wang,MS Wang,ZY Zhang,CH Jin,XL Wei

DOI: https://doi.org/10.1017/s1431927606069510

IF: 4.0991

2006-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005
In-Situ Cross-Sectional Switching of Multiferroic BiFeO3 Thin Films

C Nelson,P Gao,J Jokisaari,B Winchester,Y Gu,C Heikes,A Melville,C Adamo,S Baek,C Folkman,C Eom,D Schlom,L Chen,X Pan

DOI: https://doi.org/10.1017/s1431927611007677

IF: 4.0991

2011-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
PFM and TEM Characterization of Polarization in Ferroelectric BFO under Changing Mechanical Constraints

J.R. Jokisaari,P. Gao,X. Pan

DOI: https://doi.org/10.1017/s1431927613011628

IF: 4.0991

2013-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
In-Situ HR-TEM Characterizations on Individual Carbon Nanotubes During Its Manipulation, Deformation and Growth

Chuanhong Jin,Kazu Suenaga,Sumio Iijima

DOI: https://doi.org/10.1017/s1431927609092691

IF: 4.0991

2009-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Microstructure of Ferroelectric BaTiO3 Thin Films on Ti Substrate

J He,JC Jiang,EI Meletis,Z Yuan,J Liu,J Weaver,CL Chen,B Lin,V Giurgiutiu,RY Guo,A Bhalla

DOI: https://doi.org/10.1017/s143192760808745x

IF: 4.0991

2008-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008
In Situ TEM Observation of Domain Nucleation and Domain Wall-Defect Interactions in Bismuth Ferrite Under Applied DC Bias

CR Winkler,LW Martin,CL Johnson,ML Taheri

DOI: https://doi.org/10.1017/s1431927610060782

IF: 4.0991

2010-07-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

materials science, multidisciplinary,microscopy
In Situ TEM Tensile Tests of Nanoscale Mg Samples Oriented for Basal Slip

Q. Yu,A. Minor,L. Qi,J. Li,R. Mishra

DOI: https://doi.org/10.1017/s1431927612005545

IF: 4.0991

2012-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
In Situ Electron Microscopy Characterization of Optoelectronic Nanostructures and Nanodevices

M Gao,C Li,W Li,Z Liu,L-M Peng

DOI: https://doi.org/10.1017/s1431927610059842

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Magnetism In-Situ TEM

Renchao Che,Yong Peng,He Tian

DOI: https://doi.org/10.1007/978-981-19-6845-7_7

2023-01-01

Abstract:The development of the in-situ TEM techniques corresponds to the progress in nano-scale research and it cannot be isolated with the development of electron microscopy. In the 1931, the first transmission electron microscope in the world was invented by Ruska and Knoll, and the detectable spatial resolution of science has made great progress. Until now, the most advanced TEM can easily achieve a spatial resolution below 0.5 Å, which was beyond imagination 100 years ago. Meanwhile, the relevant in-situ experiments have been put forward. The in-situ magnetic technique is one of the core in-situ TEM techniques. Since the 1960s, magnetism in-situ TEM has realized numerous observations of magnetic configurations, magnetization dynamics and magnetic properties. In the progress of magnetism, the magnetism in-situ TEM plays an essential role. This chapter will briefly introduce the history, principle and latest progress in the technologies of magnetism in-situ TEM.
In Situ TEM-EELS Studies of Degradation and Thermal Stability of High-Energy Cathodes for Li-Ion Batteries

Feng Wang,Shou-Hang Bo,Lihua Zhang,Chao Ma,Grey Clare,Peter Khalifah,Yimei Zhu,Jason Graetz

DOI: https://doi.org/10.1149/ma2012-02/8/638

2012-06-04

ECS Meeting Abstracts

Abstract:Abstract not Available.
In-situ Switching of a Ferroelectric Film Through a Non-ferroelectric Layer and Direct Scanning Probe Analysis of the Same Cross Section

J.R. Jokisaari,P. Gao,X.Q. Pan

DOI: https://doi.org/10.1017/s1431927614010022

IF: 4.0991

2014-01-01

Microscopy and Microanalysis

Abstract:An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
In Situ Tem Nanomechanics

Yu Q.,Legros M.,Minor A. M.

DOI: https://doi.org/10.1557/mrs.2014.306

IF: 5

2015-01-01

MRS Bulletin

Abstract:In situ transmission electron microscopy (TEM) nanomechanical testing has benefited from a number of recent technical developments related to both how deformation is imaged and how deformation is induced and measured inside a TEM instrument. These developments have led to new insights into the deformation mechanisms of a wide range of metals and alloys, as well as measurements of the unusual mechanical properties of small-scale objects such as whiskers and nanocrystals. Herein, we describe this recent progress through selected highlights of recent findings on the dynamic behavior of defects such as dislocations, twins, and grain boundaries.
In-situ TEM Characterization of Ultra-robust Memristors Based on Fully Layered Two-dimensional Materials

Songhua Cai,Miao Wang,Xiaoqing Pan,J. Joshua Yang,Feng Miao,Peng Wang

DOI: https://doi.org/10.1017/s1431927618009911

IF: 4.0991

2018-01-01

Microscopy and Microanalysis

Abstract:1. National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences and Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing, China. 2. School of Physics, Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing, China. 3. Department of Chemical Engineering and Materials Science and Department of Physics and Astronomy, University of California, Irvine, CA, USA. 4. Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, MA, USA.
In-situ TEM and Spectroscopy Studies of Nanoscale Perpendicular Magnetic Tunnel Junction

Hwanhui Yun,Deyuan Lyu,Yang Lv,Brandon R. Zink,Pravin Khanal,Bowei Zhou,Weigang Wang,Jian-Ping Wang,K. Andre Mkhoyan

DOI: https://doi.org/10.1017/s1431927622003750

IF: 4.0991

2022-07-23

Microscopy and Microanalysis

Abstract://static.cambridge.org/content/id/urn%3Acambridge.org%3Aid%3Aarticle%3AS1431927622003750/resource/name/firstPage-S1431927622003750a.jpg

materials science, multidisciplinary,microscopy
Microstructure-Dependent Thermal Stability of Super-Tetragonal Nanocomposite Films through In Situ TEM/EELS Study

Mengsha Li,Chenyue Qiu,Stas Dogel,Pingfan Chen,Doug D Perovic,Jane Y Howe

DOI: https://doi.org/10.1021/acsami.2c16084

2022-11-23

Abstract:Smart microstructure design in nanocomposite films allows us to tailor physical properties such as ferroelectricity and thermal stability to broaden applications of next-generation electronic devices. Here, we study the thermal stability of self-assembled PbTiO3 (PTO)/PbO nanocomposite films with nano-spherical and nanocolumnar microstructures by utilizing an environmental transmission electron microscopy (TEM) combined with electron energy loss spectroscopy (EELS). The real-time study reveals that the microstructure-dependent interphase strain has an effect on the stabilization of the tetragonal phase. Compared to the nano-spherical configuration, the nanocomposite film with the nanocolumnar microstructure can maintain the giant tetragonality of ∼1.20 up to 450 °C, and the tetragonal phase is predicted to be stable at elevated temperatures > 600 °C. Moreover, the temperature-dependent EELS further demonstrates the sensitivity of the chemical bonding of Pb and Ti with O to the PTO lattice distortion, correlating the structural variation and electronic properties at different temperatures. Such in situ heating TEM study provides insights into the thermal stability of nanocomposites with different microstructures and facilitates the advancement of power electronics applications in harsh environments.
In situ Transmission Electron Microscopy Studies of Electric-field-induced Phenomena in Ferroelectrics

Xiaoli Tan,Hui He,Jian-Ku Shang

DOI: https://doi.org/10.1557/jmr.2005.0213

IF: 2.7

2005-07-01

Journal of Materials Research

Abstract:High electric fields were delivered to specimens during imaging in the transmission electron microscopy (TEM) chamber to reveal details of electric field-induced phenomena in ferroelectric oxides. These include the polarization switching in nanometer-sized ferroelectric domains and the grain boundary cavitation in a commercial lead zirconate titanate (PZT) polycrystalline ceramic, the domain wall fracture in a Pb(Mg 1/3 Nb 2/3 )O 3 –PbTiO 3 single crystal, and the transformation of incommensurate modulations in Pb 0.99 Nb 0.02 [(Zr 1− x Sn x ) 1− y Ti y ] 0.98 O 3 (PZST100 x /100 y /2) polycrystalline ceramics. In the PZT ceramic, a cavitation process was uncovered for the electric field-induced intergranular fracture. In the ferroelectric single crystal, a preexisting crack was observed to deflect and to follow a 90° domain wall, indicating the presence of severe incompatible piezoelectric strains at thedomain wall. In the antiferroelectric PZST ceramics, the electric field-induced antiferroelectric-to-ferroelectric phase transformation was accompanied with the disappearance of incommensurate modulations.

materials science, multidisciplinary
Fabrication and Electric Measurements of Nanostructures Inside Transmission Electron Microscope

Qing Chen,Lan-Mao Peng

DOI: https://doi.org/10.1016/j.ultramic.2011.01.043

IF: 2.994

2011-01-01

Ultramicroscopy

Abstract:Using manipulation holders specially designed for transmission electron microscope (TEM), nanostructures can be characterized, measured, modified and even fabricated in-situ. In-situ TEM techniques not only enable real-time study of structure-property relationships of materials at atomic scale, but also provide the ability to control and manipulate materials and structures at nanoscale. This review highlights in-situ electric measurements and in-situ fabrication and structure modification using manipulation holder inside TEM.

In Situ TEM Studies of Ferroelectric Thin Films

Study of Thin-Film Ferroelectric Heterostructures by TEM and PFM

An in Situ TEM Study of Ferroelastic Domain Mobility

Direct Observations of Retention Failure in Ferroelectric Memories by in Situ Transmission Electron Microscopy

In-situ Fabrication, Manipulation and Property Measurements of Single Nanotubes and Nanowires with Near Atomic Resolution

In-Situ Cross-Sectional Switching of Multiferroic BiFeO3 Thin Films

PFM and TEM Characterization of Polarization in Ferroelectric BFO under Changing Mechanical Constraints

In-Situ HR-TEM Characterizations on Individual Carbon Nanotubes During Its Manipulation, Deformation and Growth

Microstructure of Ferroelectric BaTiO3 Thin Films on Ti Substrate

In Situ TEM Observation of Domain Nucleation and Domain Wall-Defect Interactions in Bismuth Ferrite Under Applied DC Bias

In Situ TEM Tensile Tests of Nanoscale Mg Samples Oriented for Basal Slip

In Situ Electron Microscopy Characterization of Optoelectronic Nanostructures and Nanodevices

Magnetism In-Situ TEM

In Situ TEM-EELS Studies of Degradation and Thermal Stability of High-Energy Cathodes for Li-Ion Batteries

In-situ Switching of a Ferroelectric Film Through a Non-ferroelectric Layer and Direct Scanning Probe Analysis of the Same Cross Section

In Situ Tem Nanomechanics

In-situ TEM Characterization of Ultra-robust Memristors Based on Fully Layered Two-dimensional Materials

In-situ TEM and Spectroscopy Studies of Nanoscale Perpendicular Magnetic Tunnel Junction

Microstructure-Dependent Thermal Stability of Super-Tetragonal Nanocomposite Films through In Situ TEM/EELS Study

In situ Transmission Electron Microscopy Studies of Electric-field-induced Phenomena in Ferroelectrics

Fabrication and Electric Measurements of Nanostructures Inside Transmission Electron Microscope