Direct Observations of Retention Failure in Ferroelectric Memories by in Situ Transmission Electron Microscopy

P. Gao,C. Nelson,J. Jokisaari,Y. Zhang,X. Pan,S. Baek,C. Bark,C. Eom
DOI: https://doi.org/10.1017/s1431927612011087
IF: 4.0991
2012-01-01
Microscopy and Microanalysis
Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
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