In Situ Electron Microscopy Characterization of Optoelectronic Nanostructures and Nanodevices

M Gao,C Li,W Li,Z Liu,L-M Peng

DOI: https://doi.org/10.1017/s1431927610059842

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

What problem does this paper attempt to address?

In-situ Fabrication, Manipulation and Property Measurements of Single Nanotubes and Nanowires with Near Atomic Resolution

L-M Peng,Q Chen,JY Wang,MS Wang,ZY Zhang,CH Jin,XL Wei

DOI: https://doi.org/10.1017/s1431927606069510

IF: 4.0991

2006-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005
Electron Microscopy of Nanodevices: in Situ and Ex Situ Characterization of Structure and Transport Properties of Carbon Nanotubes

JM Zuo,T Kim,Q Chen,LM Peng,EA Olson

DOI: https://doi.org/10.1017/s1431927608082445

IF: 4.0991

2008-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008
In situ comprehensive characterization of optoelectronic nanomaterials for device purposes.

Chengyao Li,Min Gao,Chen Ding,Xiaoxian Zhang,Lihuan Zhang,Qing Chen,Lian-Mao Peng

DOI: https://doi.org/10.1088/0957-4484/20/17/175703

IF: 3.5

2009-01-01

Nanotechnology

Abstract:We have combined optical fiber probe and nanoprobe techniques in a scanning electron microscope, which enables in situ optical, electrical and structural characterization of optoelectronic nanomaterials and nanodevices. The nanoprobe technique, employing sharp metal tips, is used for in situ nano-manipulation, contact and electrical measurement. The fiber probe, coupled to a spectrometer or a laser and controlled by a nano-manipulator, allows local optical detection or excitation. We show in situ assembly of a light emitter and photodetector based on individual nanostructures, demonstrating the potential application of the above technique in building prototype optoelectronic devices and selecting suitable nanostructures for device purposes. In addition, the angular resolving power of the fiber probe detection is demonstrated to be useful for studying nanoscale waveguides.
Surface Form Metrology of Micro-Optics

Bin Xu,Zhigang Jia,Xinghui Li,Yuan-Liu Chen,Yuki Shimizu,So Ito,Wei Gao

DOI: https://doi.org/10.1117/12.2019243

2013-01-01

Abstract:This keynote starts from an overview of micro-optics from fundamental functions, fabrication methods and applications in precision engineering and nanotechnology. State-of-the-art measuring systems for surface form metrology of microoptics with micro-structured surfaces, including diffractive micro-optics such as diffraction gratings and refractive micro-optics such as micro lenses and micro-lens arrays, are then be presented. The measuring systems introduced in the presentation are classified into scanning probe microscope-based systems, mechanical stylus profiling systems and optical evaluation systems. Related research activities carried out in the authors' group are also highlighted.
Practical Aspects of Atomic-Scale In Situ Investigation of Electrochemistry in All-Solid Lithium-Ion Batteries

Bin Liu,Young-Min Kim,Raymond R. Unocic,Chengdu Liang,Nancy J. Dudney,Miaofang Chi,Z. Shan,Shirley Meng

DOI: https://doi.org/10.1017/s1431927612008872

IF: 4.0991

2012-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
In Situ TEM Studies of Ferroelectric Thin Films

P Gao,C Nelson,J Jokisaari,S Baek,C Eom,E Wang,X Pan

DOI: https://doi.org/10.1017/s1431927611007689

IF: 4.0991

2011-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Nanostructured Plasmonic Devices and Their Applications

Min Qiu,Qiang Li,Weichun Zhang,Lijun Meng,Ding Zhao,Xi Chen,Yiting Chen,Min Yan

DOI: https://doi.org/10.1109/icait.2013.6621503

2013-01-01

Abstract:In this talk, we will review our recent works on nanostructured plasmonic devices, and their applications in high performance light absorption, photothermal effects, and partly in photonic integrations.
Development of in Situ Optical–electrical MEMS Platform for Semiconductor Characterization

Cai Songhua,Gu Chenyi,Wei Yifan,Gu Min,Pan Xiaoqing,Wang Peng

DOI: https://doi.org/10.1016/j.ultramic.2018.07.007

IF: 2.994

2018-01-01

Ultramicroscopy

Abstract:In situ transmission electron microscopy (TEM) technology has become one of the fastest growing areas in TEM research in recent years. This technique allows researchers to investigate the dynamic response of materials to external stimuli inside the microscope. Optoelectronic functional semiconducting materials play an irreplaceable role in several key fields such as clean energy, communications, and pollution disposal. The ability to observe the dynamic behavior of these materials under real working conditions using advanced TEM technologies would provide an in-depth understanding of their working mechanisms, enabling further improvement of their properties. In this work, we designed a microelectromechanical-system-chip-based system to illuminate a sample inside a transmission electron microscope. This system allows simultaneous in situ optical and electrical measurements, which are crucial for optoelectronic semiconductor characterization.
In Situ Optical Imaging-Enabled New Insights into Nanoscale Photofunctional Materials: Visualization, Manipulation, and Beyond

Hua Su,Wei Wang

DOI: https://doi.org/10.1021/acs.jpclett.3c00963

2023-06-08

Abstract:Photofunctional materials, especially semiconductors and plasmonic metals, have attracted increasing interest for solar energy harvesting and utilization. Structurally engineering these materials into the nanoscale remarkably enhances their efficiencies. However, this also exacerbates the structural complexities and heterogeneous activities among individuals and compromises the efficiencies of traditional bulk-level activity measurements. Over the last decades, in situ optical imaging has...

chemistry, physical,physics, atomic, molecular & chemical,nanoscience & nanotechnology,materials science, multidisciplinary
Scanning Nano Beam Electron Diffraction and Applications to Characterization of High Entropy Alloys

H. Xing,K. Kim,J.M. Zuo,M.A. Hemphill,G.Y. Wang,C.W. Tsai,J.W. Yeh,K.A. Dahmen,P.K. Liaw

DOI: https://doi.org/10.1017/s143192761300559x

IF: 4.0991

2013-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
In Situ Device-Level TEM Characterization Based on Ultra-Flexible Multilayer MoS2 Micro-Cantilever

Chaojian Hou,Kun Wang,Wenqi Zhang,Donglei Chen,Xiaokai Wang,Lu Fan,Chunyang Li,Jing Zhao,Lixin Dong

DOI: https://doi.org/10.1002/adma.202301439

Abstract:Current state-of-the-art in situ transmission electron microscopy (TEM) characterization technology has been capable of statically or dynamically nanorobotic manipulating specimens, affording abundant atom-level material attributes. However, an insurmountable barrier between material attributes investigations and device-level application explorations exists due to immature in situ TEM manufacturing technology and sufficient external coupled stimulus. These limitations seriously prevent the development of in situ device-level TEM characterization. Herein, a representative in situ opto-electromechanical TEM characterization platform is put forward by integrating an ultra-flexible micro-cantilever chip with optical, mechanical, and electrical coupling fields for the first time. On this platform, static and dynamic in situ device-level TEM characterizations are implemented by utilizing molybdenum disulfide (MoS2 ) nanoflake as channel material. E-beam modulation behavior in MoS2 transistors is demonstrated at ultra-high e-beam acceleration voltage (300 kV), stemming from inelastic scattering electron doping into MoS2 nanoflakes. Moreover, in situ dynamic bending MoS2 nanodevices without/with laser irradiation reveals asymmetric piezoresistive properties based on electromechanical effects and secondary enhanced photocurrent based on opto-electromechanical coupling effects, accompanied by real-time monitoring atom-level characterization. This approach provides a step toward advanced in situ device-level TEM characterization technology with excellent perception ability and inspires in situ TEM characterization with ultra-sensitive force feedback and light sensing.
Determination of Atomic Structures of Crystal Defects, Interfaces and Surfaces Via Aberration-Corrected Transmission Electron Microscopy

J Zhu,R Yu,ZY Cheng,T Ling,N Lu,L Xie,ZD Cheng,HH Zhou,XY Zhong

DOI: https://doi.org/10.1017/s1431927610059131

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Recent Advances on in Situ SEM Mechanical and Electrical Characterization of Low-Dimensional Nanomaterials.

Chenchen Jiang,Haojian Lu,Hongti Zhang,Yajing Shen,Yang Lu

DOI: https://doi.org/10.1155/2017/1985149

2017-01-01

Scanning

Abstract:In the past decades, in situ scanning electron microscopy (SEM) has become a powerful technique for the experimental study of low-dimensional (1D/2D) nanomaterials, since it can provide unprecedented details for individual nanostructures upon mechanical and electrical stimulus and thus uncover the fundamental deformation and failure mechanisms for their device applications. In this overview, we summarized recent developments on in situ SEM-based mechanical and electrical characterization techniques including tensile, compression, bending, and electrical property probing on individual nanostructures, as well as the state-of-the-art electromechanical coupling analysis. In addition, the advantages and disadvantages of in situ SEM tests were also discussed with some possible solutions to address the challenges. Furthermore, critical challenges were also discussed for the development and design of robust in situ SEM characterization platform with higher resolution and wider range of samples. These experimental efforts have offered in-depth understanding on the mechanical and electrical properties of low-dimensional nanomaterial components and given guidelines for their further structural and functional applications.
In-situ Environmental Scanning Electron Microscopy for Probing the Properties of Advanced Energy Materials

Xing Li,Xianlong Wei,Qing Chen

DOI: https://doi.org/10.1504/ijnm.2016.079214

2016-01-01

International Journal of Nanomanufacturing

Abstract:The unique properties of nanomaterials have made them potential candidates in energy applications. Due to the different structures and properties of nanomaterials, it is very important to study individual nanomaterials and correlate their properties to structures. In this review, we summarise in-situ electron microscopy methods for probing important properties of the nanomaterials for energy applications and their property-structure relationships, with an emphasis on those developed in our laboratory. Through the in-situ nanomanipulation conducted in a scanning electron microscope, the mechanical, electromechanical properties and photoelectronic properties of energy materials can be clarified and correlated to their structures. With the environmental atmosphere, electrochemical reactions occurred in batteries can be directly observed. Combined with the above measurements, the mechanical stability, mechanism and duration of the energy materials can be evaluated, based on which the performance of the materials can be improved and novel applications can be explored.
High-Spatial and High-Energy Resolution EELS Studies of Chemical and Electronic Properties of Interfaces and Nanostructures

K Dudeck,M Couillard,N Gauquelin,L Gunawan,S Hosseini Vajargah,S Lazar,D Rossouw,Y Shao,G Zhu,G Botton

DOI: https://doi.org/10.1017/s1431927611004843

IF: 4.0991

2011-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Direct Observations of Retention Failure in Ferroelectric Memories by in Situ Transmission Electron Microscopy

P. Gao,C. Nelson,J. Jokisaari,Y. Zhang,X. Pan,S. Baek,C. Bark,C. Eom

DOI: https://doi.org/10.1017/s1431927612011087

IF: 4.0991

2012-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Nanostructures and Nanodevices Special Fabrication and Characterization

Wang Guang-long,Gao Min,Feng Li-shuang,Dun Yi,Hou Jian-guo,Tang Jie

DOI: https://doi.org/10.4028/www.scientific.net/kem.483.243

2011-01-01

Key Engineering Materials

Abstract:The nanostructures and nanodevices special fabrication technology including electron beam lithography (EBL), focused ion beam (FIB) technology, microcontact printing (μCP) and nanoimprinting were introduced in this paper. The examples of Y-shape waveguide coupler and high precision nanopattern of China Seal were designed and fabricated based the EBL and FIB technology respectively. Their structures can be characterized by scanning electron microscopy (SEM), scanning tunnel microscopy (STM) and atom force microscopy (AFM) etc. The C60 molecular on a Si (111)-(7×7) surface in variable temperature is deposited and detected by STM. The fabricated pattern and structures results indicated that the novel fabrication and characterization technology is very important and effective tools in nanoscale science field.
Synthesis and Property of Nanostructured ZnS

Xiaosheng Fang,Oyoshio Bando,Dmitri Golberg

DOI: https://doi.org/10.1017/s1431927609092721

2009-01-01

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Scanning Plasmon-Enhanced Microscopy for Simultaneous Optoelectrical Characterization

Joanna Symonowicz,Atif Jan,Han Yan,Manish Chhowalla,Giuliana Di Martino

DOI: https://doi.org/10.1021/acsnano.4c04671

IF: 17.1

2024-07-30

ACS Nano

Abstract:Scanning microscopy methods are crucial for the advancement of nanoelectronics. However, the vertical nanoprobes in such techniques suffer limitations such as the fragility at the tip-sample interface, complex instrumentation, and the lack of in operando functionality in several cases. Here, we introduce scanning plasmon-enhanced microscopy (SPEM) and demonstrate its capabilities on MoS(2) and WSe(2) nanosheets. SPEM combines a nanoparticle-on-mirror (NPoM) configuration with a portable...

materials science, multidisciplinary,chemistry, physical,nanoscience & nanotechnology
In-situ manipulating,fabricating and measuring nanostructures inside SEM

CHEN Qing,WEI Xian-Long

DOI: https://doi.org/10.3969/j.issn.1000-6281.2011.06.001

2011-01-01

Abstract:In-situ measuring nanomaterials and nanostructures inside electron microscopes is one of the most important methods to understand the relationship between structure and property of nanomaterials.Furthermore,manipulating and fabricating nanomaterials and nanostructures inside electron microscopes also enable studies of new structures and new devices.Because scanning electron microscope(SEM) has large sample chamber,can easily hold multi probes and various kinds of probes for measurements and manipulations,can host multi detectors so that can characterize the same sample from different point of view,in-situ study in SEM has special applications in the study of nanomaterials and nanodevices.This review focuses on the progresses made in our laboratory in in-situ SEM in the recent years,including mainly the developments of in-situ methods of manipulation,fabrication and measurement,and the studies on the mechanical and electronic properties of carbon nanotubes.

In Situ Electron Microscopy Characterization of Optoelectronic Nanostructures and Nanodevices

In-situ Fabrication, Manipulation and Property Measurements of Single Nanotubes and Nanowires with Near Atomic Resolution

Electron Microscopy of Nanodevices: in Situ and Ex Situ Characterization of Structure and Transport Properties of Carbon Nanotubes

In situ comprehensive characterization of optoelectronic nanomaterials for device purposes.

Surface Form Metrology of Micro-Optics

Practical Aspects of Atomic-Scale In Situ Investigation of Electrochemistry in All-Solid Lithium-Ion Batteries

In Situ TEM Studies of Ferroelectric Thin Films

Nanostructured Plasmonic Devices and Their Applications

Development of in Situ Optical–electrical MEMS Platform for Semiconductor Characterization

In Situ Optical Imaging-Enabled New Insights into Nanoscale Photofunctional Materials: Visualization, Manipulation, and Beyond

Scanning Nano Beam Electron Diffraction and Applications to Characterization of High Entropy Alloys

In Situ Device-Level TEM Characterization Based on Ultra-Flexible Multilayer MoS2 Micro-Cantilever

Determination of Atomic Structures of Crystal Defects, Interfaces and Surfaces Via Aberration-Corrected Transmission Electron Microscopy

Recent Advances on in Situ SEM Mechanical and Electrical Characterization of Low-Dimensional Nanomaterials.

In-situ Environmental Scanning Electron Microscopy for Probing the Properties of Advanced Energy Materials

High-Spatial and High-Energy Resolution EELS Studies of Chemical and Electronic Properties of Interfaces and Nanostructures

Direct Observations of Retention Failure in Ferroelectric Memories by in Situ Transmission Electron Microscopy

Nanostructures and Nanodevices Special Fabrication and Characterization

Synthesis and Property of Nanostructured ZnS

Scanning Plasmon-Enhanced Microscopy for Simultaneous Optoelectrical Characterization

In-situ manipulating,fabricating and measuring nanostructures inside SEM