Electron Microscopy of Nanodevices: in Situ and Ex Situ Characterization of Structure and Transport Properties of Carbon Nanotubes

JM Zuo,T Kim,Q Chen,LM Peng,EA Olson
DOI: https://doi.org/10.1017/s1431927608082445
IF: 4.0991
2008-01-01
Microscopy and Microanalysis
Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008
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