Carbon Nanotube - Substrate Interface Characteristics Studied Via TEM

TS Zheleva,SJ Kilpatrick,MH Ervin,X Li,A Cao,PM Ajayan

DOI: https://doi.org/10.1017/s1431927606067262

IF: 4.0991

2006-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

What problem does this paper attempt to address?

In-Situ HR-TEM Characterizations on Individual Carbon Nanotubes During Its Manipulation, Deformation and Growth

Chuanhong Jin,Kazu Suenaga,Sumio Iijima

DOI: https://doi.org/10.1017/s1431927609092691

IF: 4.0991

2009-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
In-situ Fabrication, Manipulation and Property Measurements of Single Nanotubes and Nanowires with Near Atomic Resolution

L-M Peng,Q Chen,JY Wang,MS Wang,ZY Zhang,CH Jin,XL Wei

DOI: https://doi.org/10.1017/s1431927606069510

IF: 4.0991

2006-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005
HR-TEM of Carbon Network, Towards Individual C-C Bond Imaging

K. Suenaga,Y. Sato,Z. Liu,M. Koshino,C. Jin

DOI: https://doi.org/10.1017/s1431927609092460

IF: 4.0991

2009-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
High-Resolution Transmission Electron Microscopy Imaging Of Carbon Nanostructures

Kazu Suenaga,Yuta Sato,Zheng Liu,Masanori Koshino,Chuanhong Jin

2012-01-01

Abstract:Here we show how a high-resolution transmission electron microscopy can be applied to characterize the carbon nanostructures. Direct imaging of the hexagonal network of carbon nanotube enables us to determine the chiral index and to visualize the topological defects, such as pentagons and heptagons. Individual molecular imaging has also become possible, and atomic structure of fullerene molecules (C-60 and C-80) has been successfully identified at a single-molecular basis. Some recent progress for in situ observation of the carbon nanotube/fullerene growth and the defect dynamics is also presented.
Observations of Carbon Nanotube Field Emission Failure in the Transmission Electron Microscope

MS Wang,JY Wang,CH Jin,Q Chen,LM Peng

DOI: https://doi.org/10.4028/www.scientific.net/msf.475-479.4071

2005-01-01

Materials Science Forum

Abstract:The failure of individual multiwall carbon nanotubes (CNTs) during electron field emission was investigated in situ inside the transmission electron microscope (TEM). Long time emission of a single CNT at the level of tens µA or higher may lead to unrecoverable damage to the CNT. High-resolution TEM observations of the emission failure process shown that the failure was usually companied by structure damage or break of the CNT, and the failure or degradation of the emission characteristics of the CNT was typically initiated at the CNT/substrate contact, defect site or at the open end via the field evaporation or oxidation of the tip of the CNT.
Electron Microscopy of Nanodevices: in Situ and Ex Situ Characterization of Structure and Transport Properties of Carbon Nanotubes

JM Zuo,T Kim,Q Chen,LM Peng,EA Olson

DOI: https://doi.org/10.1017/s1431927608082445

IF: 4.0991

2008-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008
Direct Mechanical Measurement of the Tensile Strength and Elastic Modulus of Multiwalled Carbon Nanotubes

BG Demczyk,Wang Ym,John Cumings,M Hetman,Wei-Qiang Han,A. Zettl,R.O. Ritchie

DOI: https://doi.org/10.1017/s1431927606062933

IF: 4.0991

2006-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006
Probing the Mechanical Properties of Nanostructures in the TEM

A. M. Minor,J. Ye,C. Chisholm,R. K. Mishra,Z. W. Shan,O. L. Warren

DOI: https://doi.org/10.1017/s1431927609096901

IF: 4.0991

2009-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Transmission Electron Microscopy and Transistor Characteristics of the Same Carbon Nanotube

JC Meyer,D Obergfell,S Roth,SH Yang,SF Yang

DOI: https://doi.org/10.1063/1.1805701

IF: 4

2004-01-01

Applied Physics Letters

Abstract:A technique is presented which allows one to combine TEM investigations with transport measurements and potentially a wide range of other investigations on the same nanoobject. Using this technique, we have obtained high-resolution transmission electron microscopy images and transport investigations including transfer characteristics on the same single-walled carbon nanotube. The transfer characteristics show ambipolar transport. This observation is discussed taking into account TEM information on tube diameter, number of tubes in the bundle, and possible tube filling with fullerenes (peapods).
Molecular Dynamics Simulations of Thermal Transport of Carbon Nanotube Interfaces

Shijun Zhou,Shan Qing,Xiaohui Zhang,Haoming Huang,Menglin Hou,Zhou,Qing,Zhang,Huang,Hou

DOI: https://doi.org/10.3390/en17061506

IF: 3.2

2024-03-22

Energies

Abstract:In this paper, non-equilibrium molecular dynamics simulations are used to study the interfacial heat exchange capacity of one-dimensional carbon nanotube nested structures. When the radius of the CNT substrate is increased from 1.356 to 2.712 nm, the ITC has a great enhancement from 1.340 to 2.949 nw/k. After this, we investigate the effects of overlap length, CNT length, and van der Waals interaction strength on the thermal resistance of the interface between carbon nanotubes. Firstly, we found that the nesting depth can significantly increase the ITC, and the increase in ITC is more obvious at an overlap length of 40 Å than at 30 Å. After this, the effect of length on the interfacial thermal conductivity is investigated, and the interfacial thermal conductivity is enhanced by 33.8% when the length is increased to 30 nm. Finally, the effect of van der Waals interaction strength was investigated, and the ITC increased from 1.60 nW/K to 2.71 nW/K when the scale factor was increased from 1 to 2.

energy & fuels
Exploring the Mechanical Properties of Nanostructures and Nanomaterials inside a TEM

Zhi-Wei Shan,Andrew M. Minor,SA S Asif,Oden L. Warren

DOI: https://doi.org/10.1017/s1431927608085474

IF: 4.0991

2008-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008
Measuring the Mechanical Behavior of Individual Nanoparticles Inside a TEM

Zhi-Wei Shan,Andrew M. Minor,S. A. Syed Asif,Oden L. Warren

DOI: https://doi.org/10.1017/s1431927606064488

IF: 4.0991

2006-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005
Imaging the symmetry breaking of molecular orbitals in carbon nanotubes

Hong Lin,Jérôme Lagoute,Vincent Repain,Cyril Chacon,Yann Girard,François Ducastelle,Hakim Amara,Annick Loiseau,Patrick Hermet,Luc Henrard,Sylvie Rousset

DOI: https://doi.org/10.1103/PhysRevB.81.235412

2009-11-24

Abstract:Carbon nanotubes have attracted considerable interest for their unique electronic properties. They are fascinating candidates for fundamental studies of one dimensional materials as well as for future molecular electronics applications. The molecular orbitals of nanotubes are of particular importance as they govern the transport properties and the chemical reactivity of the system. Here we show for the first time a complete experimental investigation of molecular orbitals of single wall carbon nanotubes using atomically resolved scanning tunneling spectroscopy. Local conductance measurements show spectacular carbon-carbon bond asymmetry at the Van Hove singularities for both semiconducting and metallic tubes, demonstrating the symmetry breaking of molecular orbitals in nanotubes. Whatever the tube, only two types of complementary orbitals are alternatively observed. An analytical tight-binding model describing the interference patterns of ? orbitals confirmed by ab initio calculations, perfectly reproduces the experimental results.

Materials Science
Quantitative Tem Tensile Testing on 1d Nano-Structural Materials

Z. W. Shan,J. Oh,A. M. Minor,S. A. S. Asif,O. L. Warren

DOI: https://doi.org/10.1017/s1431927609098584

IF: 4.0991

2009-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Scanning Electron Microscopy Imaging of Single-Walled Carbon Nanotubes on Substrates

Dongqi Li,Jin Zhang,Yujun He,Yan Qin,Yang Wei,Peng Liu,Lina Zhang,Jiaping Wang,Qunqing Li,Shoushan Fan,Kaili Jiang

DOI: https://doi.org/10.1007/s12274-017-1505-7

IF: 9.9

2017-01-01

Nano Research

Abstract:Scanning electron microscopy (SEM) plays an indispensable role in nanoscience and nanotechnology because of its high efficiency and high spatial resolution in characterizing nanomaterials. Recent progress indicates that the contrast arising from different conductivities or bandgaps can be observed in SEM images if single-walled carbon nanotubes (SWCNTs) are placed on a substrate. In this study, we use SWCNTs on different substrates as model systems to perform SEM imaging of nanomaterials. Substantial SEM observations are conducted at both high and low acceleration voltages, leading to a comprehensive understanding of the effects of the imaging parameters and substrates on the material and surface-charge signals, as well as the SEM imaging. This unified picture of SEM imaging not only furthers our understanding of SEM images of SWCNTs on a variety of substrates but also provides a basis for developing new imaging recipes for other important nanomaterials used in nanoelectronics and nanophotonics.
Direct nanomechanical characterization of carbon nanotube - titanium interfaces

Chenglin Yi,Soumendu Bagchi,Christopher M. Dmuchowski,Feilin Gou,Xiaoming Chen,Cheol Park,Huck Beng Chew,Changhong Ke

DOI: https://doi.org/10.1016/j.carbon.2018.02.069

IF: 10.9

2018-01-01

Carbon

Abstract:Interfacial interactions between carbon nanotubes (CNTs) and metal matrices play a critical role in the bulk mechanical properties of CNT-reinforced metal matrix nanocomposites (MMNC), but their load-transfer mechanisms remain not well understood. In this paper, we conduct single-nanotube pull-out studies with in situ scanning electron microscopy to quantify the mechanical strength of binding interfaces in carbon nanotube (CNT)-reinforced titanium (Ti) nanocomposites. Our nanomechanical pull-out measurements reveal a shear lag effect in the load transfer on the CNT-Ti interface. The interfacial shear strength and the maximum load-bearing capacity of the tested CNT-Ti interfaces are quantified to be about 37.8 MPa and 245 nN, respectively, both of which are substantially higher than the reported values for CNT-Al interfaces. Density functional theory calculations reveal that the experimentally observed strong CNT-Ti binding interface is attributed to strong chemisorption interactions of Ti atoms on CNT surfaces, albeit moderated by the weakening effect of the oxide layer. The research findings are useful to better understand the load transfer process on the tube-metal interface and the reinforcing mechanism of nanotubes, and ultimately contribute to the optimal design and performance of nanotube-reinforced MMNC.
Transport and TEM on the Same Individual Carbon Nanotubes and Peapods

D Obergfell,JC Meyer,M Haluska,A Khlobystov,SH Yang,LZ Fan,DF Liu,S Roth

DOI: https://doi.org/10.1063/1.2103928

2005-01-01

AIP Conference Proceedings

Abstract:For the first time, full transistor characteristics - both output and transfer characteristics - in field-effect transistor configuration have been recorded and TEM investigations have been performed on the same individual nanotubes and metallofullerene peapods. Usual approaches for combining transport and TEM on the same nanotube only allow for measuring the current voltage characteristics, but no gate dependence can be acquired. Applying our new method of underetching a Si/SiO2 substrate from the edge of a chip after the transport measurements, we can additionally get the transfer characteristics I-sd(V-g), i.e. the gate response of the current, which provides crucial information about the electronic properties of the system investigated. After the transport measurements and the etching process the samples can be viewed in the TEM, which enables us to check, whether a contacted nanotube is really a single tube or a thin bundle and whether a tube is filled with fullerenes indeed. Gaining this additional structural information by TEM can significantly help to interpret electrical transport data correctly.
Study on Application of Carbon Nanotubes in Micro-electrodes for MEMS

Xing WEI,Zhong-yu HOU,Dong XU,Ya-fei ZHANG,Bing-chu CAI

2007-01-01

Abstract:Screen printing was used to form carbon nanotube films(CNTF) on the metal substrate after carbon nanotubes were made into slurry liquid,then the surface resistance and the roughness of the films were measured by the four point probe meter and the profile meter,respectively.The results show that the CNTF exhibits a high conductivity and low roughness when it was formed by the procedure of which carbon nanotubes were firstly mixed with organic solvent by the proportion of 10%-12%(wt) carbon nanotubes after they were gone through ball milled for 1h,and then the formed slurry was coated on the substrate by screen printing to form film and the film was dried in a vacuum oven at 100 ℃ for 1h,and the film was finally sintered at 350 ℃ for 40 min.According to the results,the technical parameters have been optimized and the micro-electrodes of carbon nanotubes for MEMS were fabricated by the micro-fabrication technology.
Carbon nanotubes adhesion and nanomechanical behavior from peeling force spectroscopy

Julien Buchoux,Ludovic Bellon,Sophie Marsaudon,Jean-Pierre Aimé

DOI: https://doi.org/10.1140/epjb/e2011-20204-1

2010-12-17

Abstract:Applications based on Single Walled Carbon Nanotube (SWNT) are good example of the great need to continuously develop metrology methods in the field of nanotechnology. Contact and interface properties are key parameters that determine the efficiency of SWNT functionalized nanomaterials and nanodevices. In this work we have taken advantage of a good control of the SWNT growth processes at an atomic force microscope (AFM) tip apex and the use of a low noise (1E-13 m/rtHz) AFM to investigate the mechanical behavior of a SWNT touching a surface. By simultaneously recording static and dynamic properties of SWNT, we show that the contact corresponds to a peeling geometry, and extract quantities such as adhesion energy per unit length, curvature and bending rigidity of the nanotube. A complete picture of the local shape of the SWNT and its mechanical behavior is provided.

Mesoscale and Nanoscale Physics
TEM Study of Microstructure of Superhard C-Bn/wc-co Interface

H. Shen,K. Sun,X. Xiang,X. Zu

DOI: https://doi.org/10.1017/s1431927613010222

IF: 4.0991

2013-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Carbon Nanotube - Substrate Interface Characteristics Studied Via TEM

In-Situ HR-TEM Characterizations on Individual Carbon Nanotubes During Its Manipulation, Deformation and Growth

In-situ Fabrication, Manipulation and Property Measurements of Single Nanotubes and Nanowires with Near Atomic Resolution

HR-TEM of Carbon Network, Towards Individual C-C Bond Imaging

High-Resolution Transmission Electron Microscopy Imaging Of Carbon Nanostructures

Observations of Carbon Nanotube Field Emission Failure in the Transmission Electron Microscope

Electron Microscopy of Nanodevices: in Situ and Ex Situ Characterization of Structure and Transport Properties of Carbon Nanotubes

Direct Mechanical Measurement of the Tensile Strength and Elastic Modulus of Multiwalled Carbon Nanotubes

Probing the Mechanical Properties of Nanostructures in the TEM

Transmission Electron Microscopy and Transistor Characteristics of the Same Carbon Nanotube

Molecular Dynamics Simulations of Thermal Transport of Carbon Nanotube Interfaces

Exploring the Mechanical Properties of Nanostructures and Nanomaterials inside a TEM

Measuring the Mechanical Behavior of Individual Nanoparticles Inside a TEM

Imaging the symmetry breaking of molecular orbitals in carbon nanotubes

Quantitative Tem Tensile Testing on 1d Nano-Structural Materials

Scanning Electron Microscopy Imaging of Single-Walled Carbon Nanotubes on Substrates

Direct nanomechanical characterization of carbon nanotube - titanium interfaces

Transport and TEM on the Same Individual Carbon Nanotubes and Peapods

Study on Application of Carbon Nanotubes in Micro-electrodes for MEMS

Carbon nanotubes adhesion and nanomechanical behavior from peeling force spectroscopy

TEM Study of Microstructure of Superhard C-Bn/wc-co Interface