Abstract:The relationship between property and structure is one of the most important fundamental questions in the field of nanomaterials and nanodevices. Understanding the multiproperties of a given nano-object also aids in the development of novel nanomaterials and nanodevices. In this paper, we develop for the first time a comprehensive platform for in situ multiproperty measurements of individual nanomaterials using a scanning electron microscope (SEM). Mechanical, electrical, electromechanical, optical, and photoelectronic properties of individual nanomaterials, with lengths that range from less than 200 nm to 20 μm, can be measured in situ with an SEM on the platform under precisely controlled single-axial strain and environment. An individual single-walled carbon nanotube (SWCNT) was measured on the platform. Three-terminal electronic measurements in a field effect transistor structure showed that the SWCNT was semiconducting and agreed with the structure characterization by transmission electron microscopy after the in situ measurements. Importantly, we observed a bandgap increase of this SWCNT with increasing axial strain, and for the first time, the experimental results quantitatively agree with theoretical predictions calculated using the chirality of the SWCNT. The vibration performance of the SWCNT, a double-walled CNT, and a triple-walled CNT were also studied as a function of axial strain, and were proved to be in good agreement with classical beam theory, although the CNTs only have one, two, or three atomic layers, respectively. Our platform has wide applications in correlating multiproperties of the same individual nanostructures with their atomic structures.

Scanning Electron Microscopy Imaging of Single-Walled Carbon Nanotubes on Substrates

Scanning Electron Microscopy Imaging of Single-Walled Carbon Nanotubes and Devices

Electron Beam Interaction with Carbon Nanotubes in Scanning Electron Microscope: Mechanisms and Applications

High-Resolution Transmission Electron Microscopy Imaging Of Carbon Nanostructures

Direct discrimination between semiconducting and metallic single-walled carbon nanotubes with high spatial resolution by SEM

Nanoscale Imaging of Surface Topography and Reactivity with the Scanning Electrochemical Microscope

Direct Identification of Metallic and Semiconducting Single-Walled Carbon Nanotubes in Scanning Electron Microscopy.

Study on Electronic Properties of Single-Wall Carbon Nanotubes

Imaging mechanism and contrast separation in low-voltage scanning electron microscopy imaging of carbon nanotube arrays on SiO2/Si substrate

Imaging Mechanism of Carbon Nanotubes on Insulating and Conductive Substrates Using a Scanning Electron Microscope

Evaluating bandgap distributions of carbon nanotubes via scanning electron microscopy imaging of the Schottky barriers.

Imaging mechanism and contrast separation in low-voltage scanning electron microscopy imaging of carbon nanotube arrays on SiO 2 /Si substrate

In situ measurements on individual thin carbon nanotubes using nanomanipulators inside a scanning electron microscope

Thermomechanical Modeling of Scanning Joule Expansion Microscopy Imaging of Single-Walled Carbon Nanotube Devices

Measuring Electronic Transport in a Single Carbon Nanotube Inside the SEM

In Situmultiproperty Measurements of Individual Nanomaterials in SEM and Correlation with Their Atomic Structures

Scanning Tunneling Microscopy and Spectroscopy Studies of Single Wall Carbon Nanotubes

Imaging 0.4nm Single-Walled Carbon Nanotubes With Atomic Force Microscopy

High-throughput Imaging and Spectroscopy of Individual Carbon Nanotubes in Devices with Light Microscopy

True-color real-time imaging and spectroscopy of carbon nanotubes on substrates using enhanced Rayleigh scattering

Electrochemical Identification of Metallic and Semiconducting Single-Walled Carbon Nanotubes