Measuring Electronic Transport in a Single Carbon Nanotube Inside the SEM

Q Chen,S Wang,XL Liang,S Gao,MS Wang,LM Peng

DOI: https://doi.org/10.1109/icsict.2004.1435086

2004-01-01

Abstract:Direct measurements on the electronic transport in a single carbon nanotube (CNT) were carried out inside the scanning electron microscope (SEM) using a nanoprobes system. Good contacts have been established between the probing nanotip and the CNT, and field effect on the current-voltage (I-V) curves has been demonstrated using a nanoprobe as a gate. Our results show that by using a nanoprobes system it is possible to perform reliably the electronic transport measurements on nanostructures of various shape and composition that are visible in the SEM.