Abstract:Determining the metallicity and semiconductivity of a multi-walled carbon nanotube (MWCNT) bundle plays a particularly vital role in its interconnection with the metal electrode of an integrated circuit. In this paper, an effective method is proposed to determine the electrical transport properties of an MWCNT bundle using a current–voltage characteristic curve during its electrical breakdown. We established the reliable electrical nanoscale contact between the MWCNT bundle and metal electrode using a robotic manipulation system under scanning electron microscope (SEM) vacuum conditions. The experimental results show that the current–voltage curve appears as saw-tooth-like current changes including up and down steps, which signify the conductance and breakdown of carbon shells in the MWCNT bundle, respectively. Additionally, the power law nonlinear behavior of the current–voltage curve indicates that the MWCNT bundle is semiconducting. The molecular dynamics simulation explains that the electron transport between the inner carbon shells, between the outermost carbon shells and gold metal electrode and between the outermost carbons shells of two adjacent individual three-walled carbon nanotubes (TWCNTs) is through their radial deformation. Density functional theory (DFT) calculations elucidate the electron transport mechanism between the gold surface and double-wall carbon nanotube (DWCNT) and between the inner and outermost carbon shells of DWCNT using the charge density difference, electrostatic potential and partial density of states.

Evaluating bandgap distributions of carbon nanotubes via scanning electron microscopy imaging of the Schottky barriers.

Quantitative Analysis of Current-Voltage Characteristics of Semiconducting Nanowires: Decoupling of Contact Effects

Quantitative analysis of electron field-emission characteristics of individual carbon nanotubes: The importance of the tip structure

Direct discrimination between semiconducting and metallic single-walled carbon nanotubes with high spatial resolution by SEM

Scanning Electron Microscopy Imaging of Single-Walled Carbon Nanotubes on Substrates

Direct Identification of Metallic and Semiconducting Single-Walled Carbon Nanotubes in Scanning Electron Microscopy.

Measuring the Electronic Bandgap of Carbon Nanotube Networks in Non-Ideal p-n Diodes

Schottky Barrier Formation at Metal Electrodes and Semiconducting Carbon Nanotubes

Electron Beam Interaction with Carbon Nanotubes in Scanning Electron Microscope: Mechanisms and Applications

Scanning Electron Microscopy Imaging of Single-Walled Carbon Nanotubes and Devices

Estimation of the Band Gap of Carbon Nanotube Bundles

Measuring Electronic Transport in a Single Carbon Nanotube Inside the SEM

Gate-tunable Contact-Induced Fermi-level Shift in Semimetal

Schottky barriers at metal-finite semiconducting carbon nanotube interfaces

Quantitative Thermal Imaging of Single-Walled Carbon Nanotube Devices by Scanning Joule Expansion Microscopy.

Electrochemical identification of metallic and semiconducting single-walled carbon nanotubes using the water gate effect.

Electrical Conductivity of Multiwall Carbon Nanotube Bundles Contacting with Metal Electrodes by Nano Manipulators inside SEM

Investigation on Junction Contacts of Semiconducting Carbon Nanotube Networks Using Conductive Atomic Force Microscopy

Tunneling Spectroscopy in Carbon Nanotube-Hexagonal Boron Nitride-Carbon Nanotube Heterojunctions

Study on Electronic Properties of Single-Wall Carbon Nanotubes

Electronic Structures and Transportation Properties of Sub-60 Nm Long Single-Walled Carbon Nanotubes