Determination of Atomic Structures of Crystal Defects, Interfaces and Surfaces Via Aberration-Corrected Transmission Electron Microscopy

J Zhu,R Yu,ZY Cheng,T Ling,N Lu,L Xie,ZD Cheng,HH Zhou,XY Zhong

DOI: https://doi.org/10.1017/s1431927610059131

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

What problem does this paper attempt to address?

Quantitative Aberration-corrected Transmission Electron Microscopy

L. Houben,C. L. Jia,K. Tillmann,K. Urban

DOI: https://doi.org/10.1017/s1431927604555745

IF: 4.0991

2004-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at the Pre-Meeting Congress: Materials Research in an Aberration-Free Environment, at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, July 31 and August 1, 2004.
Atomic Cluster Structure Identification Using Aberration-corrected Scanning Transmission Electron Microscopy

D. He,A. Logsdail,R. Johnston,R. Palmer,F. Yin,Z. Li,R. Aveyard,J. Yuan

DOI: https://doi.org/10.1017/s1431927612004527

IF: 4.0991

2012-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Measuring Atoms in Oxide Heterostructures by Quantitative Aberration-Corrected Transmission Electron Microscopy

K.W. Urban,C.-L. Jia

DOI: https://doi.org/10.1017/s1431927613004911

IF: 4.0991

2013-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Probing Asymmetric Interfaces of LaMnO3 / SrMnO3 Superlattices with Aberration-Corrected Scanning Transmission Electron Microscopy

AB Shah,SJ May,JG Wen,X Zhai,JN Eckstein,A Bhattacharya,JM Zuo

DOI: https://doi.org/10.1017/s1431927608083529

IF: 4.0991

2008-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008
Progress in Aberration-Corrected High-Resolution Transmission Electron Microscopy of Crystalline Solids

K Tillmann,J Barthel,L Houben,C L Jia,M Lentzen,A Thust,K Urban

DOI: https://doi.org/10.1007/978-1-4020-8615-1_30

2008-01-01

Abstract:With impressive improvements in instrumental resolution and a Simultaneous minimisation of image delocalisation, high-resolution transmission electron microscopy is presently enjoying increased popularity in the atomic-scale imaging of lattice imperfections in a variety of solids. In the present overview, recent progress in spherical aberration corrected imaging performed in troika with the ultra-precise measurement of residual wave aberrations and the numerical retrieval of the exit plane wavefunction from focal series of micrographs is illustrated by highlighting their combined use for the atomic-scale measurement of common lattice imperfections observed in compound semiconductors and high-temperature superconductors.
Direct Mapping of Confined Interfacial States in Oxides Using Aberration Corrected STEM and EELS

AB Shah,JM Zuo,QM Ramasse,JG Wen,X Zhai,A. Bhattacharya,JN Eckstein

DOI: https://doi.org/10.1017/s143192761005631x

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
High-resolution Transmission Electron Microscopy and Spectroscopy of Epitaxial Metal Oxides

Hongchu Du,Chun-Lin Jia

DOI: https://doi.org/10.1016/b978-0-08-102945-9.00014-9

2022-01-01

Abstract:Quantitative determination of local atomic and electronic structures at surfaces, interfaces, and defects and elucidation of their dynamics and influences on materials, nanostructures, and devices, thereby to develop structure–property relationships at the atomic level remains the ultimate goal of microscopy in materials sciences. The reigning paradigms are imaging and spectroscopy techniques based on aberration-corrected transmission electron microscopy (TEM). Aberration-corrected TEM provides scientists great opportunities to routinely resolve structural details, to map both compositional and bonding information, and to explore properties of thin films at the atomic scale. In chapter 13, we introduce first imaging and spectroscopic techniques based on both the conventional coherent and the scanning imaging modes of current state-of-the-art aberration-corrected transmission electron microscopes. We show then examples for application of these techniques in characterization of structural, compositional, and bonding details of interfaces and defects in thin films of metal oxides at the atomic scale.
Applications of Aberration-corrected TEM and STEM in Complex Oxides and Nanostructured Materials

S Lazar,L-Y Chang,L Gunawan,Y Shao,GA Botton

DOI: https://doi.org/10.1017/S1431927609098663

IF: 4.0991

2009-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
High-Spatial and High-Energy Resolution EELS Studies of Chemical and Electronic Properties of Interfaces and Nanostructures

K Dudeck,M Couillard,N Gauquelin,L Gunawan,S Hosseini Vajargah,S Lazar,D Rossouw,Y Shao,G Zhu,G Botton

DOI: https://doi.org/10.1017/s1431927611004843

IF: 4.0991

2011-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Electrical Activity of Defects in CdTe Solar Cells via Aberration-corrected STEM

Chen Li,Yelong Wu,Andrew R. Lupini,Anas Mouti,Jonathan D. Poplawsky,Wan-Jian Yin,Naba R. Paudel,M.A. Jassim,Y. Yan,S. J. Pennycook

DOI: https://doi.org/10.1017/S1431927613003668

IF: 4.0991

2013-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Ultrastructure of a Metal/Superconductor Interface Revealed by Atomic-Resolution STEM Techniques

Y Xin,LF Allard,ZQ Mao

DOI: https://doi.org/10.1017/s1431927608087126

IF: 4.0991

2008-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008
Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope

Peng Wang,Angus I. Kirkland,Peter D. Nellist,Adrian J. D’Alfonso,Andrew J. Morgan,Leslie J. Allen,Ayako Hashimoto,Masaki Takeguchi,Kazutaka Mitsuishi,Masayuki Shimojo

DOI: https://doi.org/10.1017/s1431927612004515

IF: 4.0991

2012-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
ABERRATION-CORRECTED TRANSMISSION ELECTRON MICROSCOPE,ATOMIC HYPERFINE STRUCTURE AND CHARACTERISTICS OF MATERIALS INTERFACE——Summary of 82th Shuangqing Forum

于荣,杜奎,杨志卿,钟虓,郑雁军,车成卫

DOI: https://doi.org/10.16262/j.cnki.1000-8217.2013.03.001

2013-01-01

Abstract:Aberration-corrected transmission electron microscope offers for the first time the materials researchers a possibility for characterizing materials structure at a sub-angstrom resolution level.This may bring important changes in materials science.Under this background,the 82nd Shuangqing Forum was held during 21st-23rd,October 2012 in Beijing,themed as "Walk into a sub-angstrom world:atomic hyperfine structure and characteristics in materials interface engineering".Thirty-eight experts and scholars from 23 universities and research institutions,both from domestic and abroad,attended the forum.The topics include the developments of Aberration-corrected transmission electron microscope,and its application in the observation and modulation of materials interface.After a lively discussion,the forum reached summarization of the key scientific issues of the field,and suggested highlights in the further Funding scheme.
In Situ and Quantitative Tensile Study of Deformation Twinning in Submicron-Sized Mg Crystals Inside a Transmission Electron Microscope

B Liu,Z Shan,X Zhang,J Sun,E Ma

DOI: https://doi.org/10.1017/s1431927611003084

IF: 4.0991

2011-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Aberration-Corrected TEM Study of Defects in III-V Films Grown on Si

SH Vajargah,M Couillard,Y Shao,S Tavakoli,R Kleiman,J Preston,GA Botton

DOI: https://doi.org/10.1017/s1431927610062033

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Scanning Nano Beam Electron Diffraction and Applications to Characterization of High Entropy Alloys

H. Xing,K. Kim,J.M. Zuo,M.A. Hemphill,G.Y. Wang,C.W. Tsai,J.W. Yeh,K.A. Dahmen,P.K. Liaw

DOI: https://doi.org/10.1017/s143192761300559x

IF: 4.0991

2013-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Experimental Measurements and Theoretical Calculations of the Atomic Structure of Materials with Subangstrom Resolution and Picometer Precision

Jing Zhu,Rong Yu

DOI: https://doi.org/10.1007/s11434-014-0138-4

2013-01-01

Chinese Science Bulletin (Chinese Version)

Abstract:Lattice defects are unavoidable structural units in materials and play an important role in determining material properties.Compared with the periodic structure of crystals,the atomic configurations of the lattice defects are determined by the coordinates of a large number of atoms,making it difficult to experimentally investigate them.In computational materials science,multiparameter optimization is also a difficult problem and experimental verification is usually required to determine the possibility of obtaining the structure and properties predicted by calculations.Using our recent studies on oxide surfaces as examples,we introduce the method of integrated aberration-corrected electron microscopy and the first-principles calculations to analyze the atomic structure of lattice defects.The atomic configurations of defects were measured using quantitative high-resolution electron microscopy at subangstrom resolution and picometer precision,and then the electronic structure and dynamic behavior of materials can be studied at the atomic scale using the firstprinciples calculations.The two methods complement each other and can be combined to increase the understanding of the atomic structure of materials in both the time and space dimensions,which will benefit materials design at the atomic scale.
Establishment of Annular Dark-Field Scanning Confocal Electron Microscopy using a Double Aberration-Corrected Microscope

A Hashimoto,P Wang,M Shimojo,K Mitsuishi,AI Kirkland,PD Nellist,M Takeguchi

DOI: https://doi.org/10.1017/S1431927610058022

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
3D Structure Determination from Hrtem and Electron Diffraction Tomography

Xiaodong Zou,Daliang Zhang,Peter Oleynikov,Junliang Sun,Sven Hovmoller

DOI: https://doi.org/10.1017/s1431927609099413

IF: 4.0991

2009-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Advanced Transmission Electron Microscopy for Functional Polymer Systems

J Loos,E Sourty,S van Bavel,K Lu

DOI: https://doi.org/10.1017/s1431927608082081

IF: 4.0991

2008-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Determination of Atomic Structures of Crystal Defects, Interfaces and Surfaces Via Aberration-Corrected Transmission Electron Microscopy

Quantitative Aberration-corrected Transmission Electron Microscopy

Atomic Cluster Structure Identification Using Aberration-corrected Scanning Transmission Electron Microscopy

Measuring Atoms in Oxide Heterostructures by Quantitative Aberration-Corrected Transmission Electron Microscopy

Probing Asymmetric Interfaces of LaMnO3 / SrMnO3 Superlattices with Aberration-Corrected Scanning Transmission Electron Microscopy

Progress in Aberration-Corrected High-Resolution Transmission Electron Microscopy of Crystalline Solids

Direct Mapping of Confined Interfacial States in Oxides Using Aberration Corrected STEM and EELS

High-resolution Transmission Electron Microscopy and Spectroscopy of Epitaxial Metal Oxides

Applications of Aberration-corrected TEM and STEM in Complex Oxides and Nanostructured Materials

High-Spatial and High-Energy Resolution EELS Studies of Chemical and Electronic Properties of Interfaces and Nanostructures

Electrical Activity of Defects in CdTe Solar Cells via Aberration-corrected STEM

Ultrastructure of a Metal/Superconductor Interface Revealed by Atomic-Resolution STEM Techniques

Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope

ABERRATION-CORRECTED TRANSMISSION ELECTRON MICROSCOPE,ATOMIC HYPERFINE STRUCTURE AND CHARACTERISTICS OF MATERIALS INTERFACE——Summary of 82th Shuangqing Forum

In Situ and Quantitative Tensile Study of Deformation Twinning in Submicron-Sized Mg Crystals Inside a Transmission Electron Microscope

Aberration-Corrected TEM Study of Defects in III-V Films Grown on Si

Scanning Nano Beam Electron Diffraction and Applications to Characterization of High Entropy Alloys

Experimental Measurements and Theoretical Calculations of the Atomic Structure of Materials with Subangstrom Resolution and Picometer Precision

Establishment of Annular Dark-Field Scanning Confocal Electron Microscopy using a Double Aberration-Corrected Microscope

3D Structure Determination from Hrtem and Electron Diffraction Tomography

Advanced Transmission Electron Microscopy for Functional Polymer Systems