ABERRATION-CORRECTED TRANSMISSION ELECTRON MICROSCOPE,ATOMIC HYPERFINE STRUCTURE AND CHARACTERISTICS OF MATERIALS INTERFACE——Summary of 82th Shuangqing Forum

于荣,杜奎,杨志卿,钟虓,郑雁军,车成卫
DOI: https://doi.org/10.16262/j.cnki.1000-8217.2013.03.001
2013-01-01
Abstract:Aberration-corrected transmission electron microscope offers for the first time the materials researchers a possibility for characterizing materials structure at a sub-angstrom resolution level.This may bring important changes in materials science.Under this background,the 82nd Shuangqing Forum was held during 21st-23rd,October 2012 in Beijing,themed as "Walk into a sub-angstrom world:atomic hyperfine structure and characteristics in materials interface engineering".Thirty-eight experts and scholars from 23 universities and research institutions,both from domestic and abroad,attended the forum.The topics include the developments of Aberration-corrected transmission electron microscope,and its application in the observation and modulation of materials interface.After a lively discussion,the forum reached summarization of the key scientific issues of the field,and suggested highlights in the further Funding scheme.
What problem does this paper attempt to address?