B23-O-04Probing the Atomic and Electronic Structure in Materials Through Aberration-Corrected Scanning Transmission Electron Microscopy

Lin Gu,Xin-An Yang
DOI: https://doi.org/10.1093/jmicro/dfv162
2015-01-01
Microscopy
Abstract:Atoms are the basic building block of materials, understanding materials on a fundamental level requires probing the locations and properties of all the atoms [ 1 ] . The success of aberration correction has revolutionized the transmission electron microscopy, both imaging and spectroscopy in aberration-corrected electron microscopy with atomic resolution have been achieved [ 2 ] . In particular, the advent of annular bright field imaging (ABF) in aberration-corrected scanning transmission electron microscopy (STEM) has enabled direct visualization of the configuration of light atoms that play a non-trivial role in relevant materials [ 3 ] , which provides an unprecedented opportunity to identify both light and heavy atoms in materials when combined with high angle annular dark field (HAADF) imaging in STEM sensitive to heavy atoms [ 4 ] . In this talk, we will present our recent efforts on probing the atomic and electronic structure of materials (energy storage materials, catalysts, strongly correlated oxides, etc.) using a suit of techniques based on aberration-corrected STEM.
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