Single-atom electron microscopy for energy-related nanomaterials

Mingquan Xu,Aowen Li,Meng Gao,Wu Zhou
DOI: https://doi.org/10.1039/d0ta04918b
IF: 11.9
2020-01-01
Journal of Materials Chemistry A
Abstract:The advances in aberration correction have enabled atomic-resolution imaging and spectroscopy in scanning transmission electron microscopy (STEM) under low primary voltages and pushed their detection limit down to the single-atom level.
materials science, multidisciplinary,chemistry, physical,energy & fuels
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