Perspective on Atomic-Resolution Vibrational Electron Energy-Loss Spectroscopy

Benedikt Haas,Christoph T. Koch,Peter Rez
2024-10-01
Abstract:Instrumentation developments in electron energy-loss spectroscopy (EELS) in the scanning transmission electron microscope (STEM) one decade ago paved the way for combining milli-electronvolt energy resolution in spectroscopy with Ångström-sized electron probes, unlocking unexplored realms for solid state physics at the nanometer-scale. The fundamental understanding of the scattering processes involved has made it possible to separate atomically localized signals, providing insights into vibrations at the atomic scale. In this Letter, we outline the experimental, conceptual and theoretical advances in this field and also make comparisons with tip-based optical techniques before discussing future perspectives of this exciting technique. Optimization of dark-field signal collection will play a fundamental role in making this technique more widely applicable to a range of materials problems. The benefits of adding momentum-resolution will also be discussed and a powerful acquisition scheme proposed.
Mesoscale and Nanoscale Physics
What problem does this paper attempt to address?
The main problem that this paper attempts to solve is: how to study the atomic - level vibration characteristics in solid materials at the nanoscale through the technique of vibrational electron energy - loss spectroscopy (vibrational EELS) with atomic resolution. Specifically, the article explores the following key issues: 1. **Experimental, Conceptual and Theoretical Progress**: - The paper summarizes the development of EELS technology in scanning transmission electron microscopy (STEM) in the past decade, especially how to combine milli - electron - volt energy resolution and Å - level electron probes to reveal solid - state physical phenomena at the nanoscale. - It introduces how to separate the atomic - local signal by understanding the scattering process, providing insights into atomic - scale vibrations. 2. **Comparison with Tip - Based Optical Technologies**: - The article compares vibrational EELS with tip - based optical technologies and discusses their respective advantages and limitations. 3. **Future Prospects**: - It proposes the importance of optimizing dark - field signal collection to make this technology more widely applicable to various material problems. - It discusses the benefits of adding momentum resolution and proposes a powerful data acquisition scheme. 4. **Specific Applications and Technical Details**: - It describes how high - resolution imaging is achieved in electron microscopy, especially in STEM - EELS. - It explores how to achieve atomic - resolution vibrational EELS by correcting geometric aberrations and using high - angle scattering angles. - It analyzes the influence of different scattering mechanisms (such as dipole scattering and impact scattering) and proposes a method of suppressing non - local backgrounds through the dark - field EELS geometry. 5. **Experimental Verification and Theoretical Models**: - It shows several experimental evidences of atomic - resolution vibrational EELS, including two - dimensional defects in SiC, Si point defects in graphene, and changes in the phonon density of states at Si grain boundaries. - It discusses theoretical models for simulating and interpreting experimental results, such as the frequency - resolved frozen - phonon multi - slice method (FRFPMS) and Bloch - wave - based methods. Overall, this paper aims to promote the development of vibrational EELS technology, enabling it to study the vibration characteristics of materials more accurately at the atomic scale and providing guidance for future experimental and theoretical research.