3D Structure Determination from Hrtem and Electron Diffraction Tomography

Xiaodong Zou,Daliang Zhang,Peter Oleynikov,Junliang Sun,Sven Hovmoller

DOI: https://doi.org/10.1017/s1431927609099413

IF: 4.0991

2009-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

What problem does this paper attempt to address?

HR-TEM of Carbon Network, Towards Individual C-C Bond Imaging

K. Suenaga,Y. Sato,Z. Liu,M. Koshino,C. Jin

DOI: https://doi.org/10.1017/s1431927609092460

IF: 4.0991

2009-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Structure Determination of IM-5 by Electron Microscopy Alone

Junliang Sun,Zhanbing He,Sven Hovmoller,Xiaodong Zou,Fabian Gramm,Christian Baerlocher,Lynne B. McCusker

DOI: https://doi.org/10.1107/s0108767309095300

2009-01-01

Acta Crystallographica Section A Foundations of Crystallography

Abstract:Possible methods for collecting complete 3D electron diffraction data from crystals much smaller than 1μm 3 are described.Data can be collected on a CCD camera and automatically extracted by computer.The critical question of data quality is addressed -can electron diffraction data compete with X-ray diffraction data in terms of resolution, completeness and quality of intensities?
FA 3-MS 03-P 01 Collecting 3 D Electron Diffraction Data for Crystal Structure Determination

Sven Hovmöllera,Daliang Zhanga,Daniel Grünera,Xiaodong Zoua,Peter Oleynikova,Junliang Sun,Xiaodong Zou,Christian,Baerlocherc,Entico Mugnaiolia,Ira Rozhdestvenskaya,Michael Czankc

2009-01-01

Abstract:FA3-MS03-P02 Structure Determination of IM-5 by Electron Microscopy Alone. Junliang Suna,b, Zhanbing Hea, Sven Hovmöllera, Xiaodong Zoua,b, Fabian Grammc, Christian Baerlocherc, Lynne B. McCuskerc. aStructural Chemistry, Stockholm University, Sweden. bBerzelii Centre EXSELENT on Porous Materials, Stockholm University, Sweden. cLaboratory of Crystallography, ETH Zurich, Switzerland. E-mail: junliangs@struc.su.se
Determination of Atomic Structures of Crystal Defects, Interfaces and Surfaces Via Aberration-Corrected Transmission Electron Microscopy

J Zhu,R Yu,ZY Cheng,T Ling,N Lu,L Xie,ZD Cheng,HH Zhou,XY Zhong

DOI: https://doi.org/10.1017/s1431927610059131

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Crystal Structure Determination from EM Images and Electron Diffraction Patterns

Sven Hovmöller,Xiaodong Zou,Thomas E. Weirich

DOI: https://doi.org/10.1016/s1076-5670(02)80066-0

2002-01-01

Abstract:This chapter discusses the crystal structure determination from electron microscopy (EM) images and electron diffraction patterns. It is possible to perform ab initio crystal structure determinations by high-resolution transmission electron microscopy (HRTEM) and selected-area electron diffraction (SAED). The various steps in a crystal structure determination—recording and quantifying HRTEM images and electron diffraction (ED) data, analyzing and processing these data to retrieve the projected potential of the crystal, and determining and refining atomic positions—are described in the chapter. Extension to three-dimensional structure determination is also discussed. To solve a structure by crystallography, both the amplitudes and the phases of the largest structure factors is focused. Diffraction patterns contain only the amplitude part of the structure factors: the phase part is lost. It is possible to get both the phases and the amplitudes of the structure factors directly from EM images. Crystal structures can be solved from HRTEM images and refined with SAED data to accuracy comparable to that achieved with X-ray diffraction data but from much smaller crystals. The experimental conditions of defocus and sample thickness, which are only guessed in image simulation procedures, can be determined experimentally, as can astigmatism and crystal tilt.
Structure Determination of Zeolites and Ordered Mesoporous Materials by Electron Crystallography

Junliang Sun,Xiaodong Zou

DOI: https://doi.org/10.1039/c0dt00666a

IF: 4

2010-01-01

Dalton Transactions

Abstract:Structure determination of porous materials is important for understanding the materials properties and exploiting their applications. Compared to X-ray diffraction, electron crystallography has two unique advantages. Crystals that are too small to be studied by X-ray diffraction can be studied by electron crystallography. The structure factor phase information, which is lost in diffraction, can be obtained from high resolution transmission electron microscopy (HRTEM) images. Here we will present different techniques and applications of electron crystallography for structure determination of zeolites and ordered mesoporous materials, based on electron diffraction data and/or HRTEM images. Electron crystallography and X-ray diffraction are complementary in many aspects. Their combinations show great potentials for structure determination of complex porous materials.
Collecting 3D Electron Diffraction Data for Crystal Structure Determination

Sven Hovmoller,Daliang Zhang,Daniel Gruner,Xiaodong Zou,Peter Oleynikov

DOI: https://doi.org/10.1107/s0108767309095312

2009-01-01

Abstract:Possible methods for collecting complete 3D electron diffraction data from crystals much smaller than 1μm 3 are described.Data can be collected on a CCD camera and automatically extracted by computer.The critical question of data quality is addressed -can electron diffraction data compete with X-ray diffraction data in terms of resolution, completeness and quality of intensities?
Solving Three-Dimensional Structures of Nano- and Intergrown Porous Silicates by Combining Electron Crystallography and Powder X-ray Diffraction

Xiaodong Zou,Tom Willhammar,Wei Wan,Junliang Sunand Peter Oleynikov

DOI: https://doi.org/10.1107/s0108767312097991

2012-01-01

Abstract:Electron crystallography has two main advantages in structure solution compared to X-ray diffraction: 1) crystals millions times smaller than what is needed for X-ray diffraction can be studied and 2) the crystallographic structure factor phases are present in high resolution transmission electron microscopy (HRTEM) images [1].In order to make electron crystallography more feasible for non-TEM experts, we have developed two methods; 1)rotation electron diffraction (RED) [2] for collectingcomplete 3D electron diffraction data that transforms a TEM into a single nano-crystal diffractometer and 2)structure projection reconstruction [3] that determines the defocus values from a through-focus series of HRTEM images.Each image in the series is corrected for the effects of contrast transfer function and then combined into a structure projection image.The method works for both crystalline and non-crystalline objects.Here we show how these two methods are used to solve the structures of complex intergrown zeolites ITQ-39 [4].The structure was confirmed by simulations of powder X-ray diffraction from the disordered model.The methods are general and can be applied to any crystalline materials, where the crystals are too small or the structures too complicated to be solved by X-ray powder diffraction alone, especially for those crystals containing defects.
Atomic Cluster Structure Identification Using Aberration-corrected Scanning Transmission Electron Microscopy

D. He,A. Logsdail,R. Johnston,R. Palmer,F. Yin,Z. Li,R. Aveyard,J. Yuan

DOI: https://doi.org/10.1017/s1431927612004527

IF: 4.0991

2012-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Accurate structure determination of nanocrystals by continuous precession electron diffraction tomography

Yihan Shen,Wenjia Sun,Yang Liu,Zhengyang Zhou,Junliang Sun

DOI: https://doi.org/10.1007/s40843-021-1941-6

2022-01-01

Science China Materials

Abstract:三维电子衍射已逐渐成为人们探索微观世界的强有力的工具. 本文中, 我们展示了一种新的三维电子衍射数据收集方法, 命名为连续旋转旋进电子衍射断层扫描(cPEDT), 该方法是旋进电子衍射断层扫描 (PEDT)与连续旋转电子衍射(cRED)的结合. 使用cPEDT方法, 可以避免PEDT方法中步进式过程引入的不必要的电子剂量, 同时利用cPEDT 收集到的数据也可以进行动力学精修从而确定材料的精确结构. 该方法可以促进三维电子衍射在一些电子束敏感材料上的应用, 如金属-有机框架(MOF)、共价有机框架(COF), 以及一些有机物.
Three-dimensional atomic-scale structure of size-selected nanoclusters on surfaces

Z. Y. Li,N. P. Young,M. Vece,S. Palomba,R. E. Palmer,A. L. Bleloch,B. C. Curley,R. L. Johnston,J. Jiang,J. Yuan

DOI: https://doi.org/10.1007/978-3-540-85156-1_67

2008-01-01

Abstract:An unambiguous determination of the three-dimensional structure of nanoparticles is challenging. Electron tomography requires a series of images taken for many different specimen orientations. This approach is ideal for stable and stationary structures. But ultrasmall nanoparticles are intrinsically structurally unstable and may interact with the incident electron beam, constraining the electron beam density that can be used and the duration of the observation. Here we demonstrate that high-angle annular dark field (HAADF) in a spherical-aberration-corrected scanning transmission electron microscopy (STEM), coupled with imaging simulation, can be used to obtain a snapshot of the size, shape, orientation and atomic arrangement of size-selected metallic nanoclusters.
High-resolution 3D X-ray diffraction microscopy: 3D mapping of deformed metal microstructures

Mustafacan Kutsal,Henning Friis Poulsen,Grethe Winther,Henning Osholm Sørensen,Carsten Detlefs

DOI: https://doi.org/10.1107/S1600576722007361

2022-08-30

Abstract:Three-dimensional X-ray diffraction microscopy, 3DXRD, has become an established tool for orientation and strain mapping of bulk polycrystals. However, it is limited to a finite spatial resolution of ∼1.5-3 µm. Presented here is a high-resolution modality of the technique, HR-3DXRD, for 3D mapping of submicrometre-sized crystallites or subgrains with high spatial and angular resolution. Specifically, the method is targeted to visualization of metal microstructures at industrially relevant degrees of plastic deformation. Exploiting intrinsic crystallographic properties of such microstructures, the high resolution is obtained by placing a high-resolution imaging detector in between the near-field and far-field regimes. This configuration enables 3D mapping of deformation microstructure by determining the centre of mass and volume of the subgrains and generating maps by tessellation. The setup is presented, together with a data analysis approach. Full-scale simulations are used to determine limitations and to demonstrate HR-3DXRD on realistic phantoms. Misalignments in the setup are shown to cause negligible shifts in the position and orientation of the subgrains. Decreasing the signal-to-noise ratio is observed to lead primarily to a loss in the number of determined diffraction spots. Simulations of an α-Fe sample deformed to a strain of ε vM = 0.3 and comprising 828 subgrains show that, despite the high degree of local texture, 772 of the subgrains are retrieved with a spatial accuracy of 0.1 µm and an orientation accuracy of 0.0005°.
Structure Determination of Modulated Structures by Powder X-ray Diffraction and Electron Diffraction

Zhengyang Zhou,Lukas Palatinus,Junliang Sun

DOI: https://doi.org/10.1039/c6qi00219f

IF: 7.779

2016-01-01

Inorganic Chemistry Frontiers

Abstract:The combination of PXRD and ED is applied to determine modulated structures which resist solution by more conventional methods.
Accurate structure models and absolute configuration determination using dynamical effects in continuous-rotation 3D electron diffraction data

Paul B. Klar,Yaşar Krysiak,Hongyi Xu,Gwladys Steciuk,Jung Cho,Xiaodong Zou,Lukas Palatinus

DOI: https://doi.org/10.1038/s41557-023-01186-1

IF: 24.274

2023-04-21

Nature Chemistry

Abstract:Continuous-rotation 3D electron diffraction methods are increasingly popular for the structure analysis of very small organic molecular crystals and crystalline inorganic materials. Dynamical diffraction effects cause non-linear deviations from kinematical intensities that present issues in structure analysis. Here, a method for structure analysis of continuous-rotation 3D electron diffraction data is presented that takes multiple scattering effects into account. Dynamical and kinematical refinements of 12 compounds—ranging from small organic compounds to metal–organic frameworks to inorganic materials—are compared, for which the new approach yields significantly improved models in terms of accuracy and reliability with up to fourfold reduction of the noise level in difference Fourier maps. The intrinsic sensitivity of dynamical diffraction to the absolute structure is also used to assign the handedness of 58 crystals of 9 different chiral compounds, showing that 3D electron diffraction is a reliable tool for the routine determination of absolute structures.

chemistry, multidisciplinary
Solving complex nanostructures with ptychographic atomic electron tomography

Philipp M Pelz,Sinéad M Griffin,Scott Stonemeyer,Derek Popple,Hannah DeVyldere,Peter Ercius,Alex Zettl,Mary C Scott,Colin Ophus

DOI: https://doi.org/10.1038/s41467-023-43634-z

2023-11-30

Abstract:Transmission electron microscopy (TEM) is essential for determining atomic scale structures in structural biology and materials science. In structural biology, three-dimensional structures of proteins are routinely determined from thousands of identical particles using phase-contrast TEM. In materials science, three-dimensional atomic structures of complex nanomaterials have been determined using atomic electron tomography (AET). However, neither of these methods can determine the three-dimensional atomic structure of heterogeneous nanomaterials containing light elements. Here, we perform ptychographic electron tomography from 34.5 million diffraction patterns to reconstruct an atomic resolution tilt series of a double wall-carbon nanotube (DW-CNT) encapsulating a complex ZrTe sandwich structure. Class averaging the resulting tilt series images and subpixel localization of the atomic peaks reveals a Zr11Te50 structure containing a previously unobserved ZrTe2 phase in the core. The experimental realization of atomic resolution ptychographic electron tomography will allow for the structural determination of a wide range of beam-sensitive nanomaterials containing light elements.
The First Stable High Silica Zeolite with Extra-Large 24-Ring Channels

T. Willhammar,Yifeng Yun,Junliang Sun,A. Burton,M. Afeworki,K. Strohmaier,J. Cheng,X. Zou

2013-01-01

Abstract:Electron crystallography has evolved as a powerful method for structural characterization of a wide range of materials. It has two significant advantages over other methods for structure determination, e.g. X-ray diffraction. Electrons interact much more strongly with matter compared to X-rays and they can be focused by electromagnetic lenses to form images with atomic resolution. These advantages make electron crystallography a unique tool for characterization of crystalline materials suffering from small crystal size and complex or disordered structures. Zeolites are a class of microporous materials with significance in several applications. They often possess complex and disordered structures, which demand large efforts in the structure determination. Over the last years, two new electron crystallographic methods have been developed; the rotation electron diffraction (RED) and the structure projection reconstruction from a through-focus series of high resolution transmission electron microscopy (HRTEM) images. In this thesis, they will be applied for structure determination of four new zeolite structures, including EMM-25 and EMM-23 with two ordered structures, and ITQ-39 and ITQ-38 with disordered structures. Each of the structure solutions have different challenges to overcome. The high silica borosilicate EMM-25 was solved by the RED method. The aluminosilicate EMM-23 was solved by a combination of HRTEM and RED. The structure solution of two materials with disordered structures, ITQ-39 and ITQ-38, will be described. For materials containing disorders, structure projection images are of utmost importance. Furthermore, the mesoporosity inside hierarchically porous ZSM-5 crystals was studied by a combination of focused ion beam (FIB) and HRTEM imaging. The last part of this thesis explores STEM imaging for use in structure determination from 3D reconstruction.
Crystal Structure Study for Nano-Sized Zeolites with Rotation Electron Diffraction

Hong Chen,Leifeng Liu,Wei Wan,Junliang Sun

DOI: https://doi.org/10.1107/s0108767312098005

2012-01-01

Abstract:Electron crystallography has two main advantages in structure solution compared to X-ray diffraction: 1) crystals millions times smaller than what is needed for X-ray diffraction can be studied and 2) the crystallographic structure factor phases are present in high resolution transmission electron microscopy (HRTEM) images [1].In order to make electron crystallography more feasible for non-TEM experts, we have developed two methods; 1)rotation electron diffraction (RED) [2] for collectingcomplete 3D electron diffraction data that transforms a TEM into a single nano-crystal diffractometer and 2)structure projection reconstruction [3] that determines the defocus values from a through-focus series of HRTEM images.Each image in the series is corrected for the effects of contrast transfer function and then combined into a structure projection image.The method works for both crystalline and non-crystalline objects.Here we show how these two methods are used to solve the structures of complex intergrown zeolites ITQ-39 [4].The structure was confirmed by simulations of powder X-ray diffraction from the disordered model.The methods are general and can be applied to any crystalline materials, where the crystals are too small or the structures too complicated to be solved by X-ray powder diffraction alone, especially for those crystals containing defects.
Collecting 3d Electron Diffraction Data by the Rotation Method

Daliang Zhang,Peter Oleynikov,Sven Hovmoller,Xiaodong Zou

DOI: https://doi.org/10.1524/zkri.2010.1202

2010-01-01

Abstract:A new method for collecting complete three-dimensional electron diffraction data is described. Diffraction data is collected by combining electron beam tilt at many very small steps, with rotation of the crystal in a few but large steps. A number of practical considerations are discussed, as well as advantages and disadvantages compared to other methods of collecting electron diffraction data.
Structure Determination of Submicron-Sized Porous Materials by EM and XRD

J. Sun

DOI: https://doi.org/10.1107/s205327331409069x

2014-01-01

Abstract:Structure determination of submicron-sized porous materials is always a great challenge for widening their industrial application. There are a few reasons for this challenge, such as 1) their big unit cell dimensions cause serious peak overlapping in powder X-ray diffraction (PXRD); 2) typical disordered guest molecules in the big portion of pores lower the resolution; 3) their relatively low stability prevents an easy application of high resolution transmission electron microscope image (HRTEM) and STEM techniques. PXRD and electron diffraction (ED) techniques are complimentary for the structure determination of such materials. The PXRD technique gives very accurate intensities and the major difficulty for the structure determination from PXRD is the peak overlapping while there is almost no peak overlapping in ED since the single-crystal-like ED patterns can be obtained from nano-sized crystals. For the ED techniques, the intensities suffer severely from dynamical effects which make it less reliable for the structure determination in many cases. The combination of them can overcome both shortcomings and solve most difficulties in the structure determination of submicron-sized porous materials. Here we will use a few examples to demonstrate how this combination facilitates the structure determination, such as ITQ-37, PKU-16, PKU-3, ITQ51.
A New Principle Of Orientation Determination For 3d Electron Diffraction Microscopy

Haihua Liu,Henning Friis Poulsen,Søren Schmidt,Henning Osholm Sørensen,A Godfrey,Xiaoxu Huang

2010-01-01

Abstract:This paper presents a new approach for orientation determination from dark field images in connection with three-dimension electron diffraction microscopy. It is based on the technique of conical scanning dark-field imaging. Software for automatic data acquisition and processing has been developed. As an example of an application, a map is generated of the crystallographic orientation distribution in nanotwinned copper. The results demonstrate that a spatial resolution of 1nm and an angular resolution of 1 are feasible.

3D Structure Determination from Hrtem and Electron Diffraction Tomography

HR-TEM of Carbon Network, Towards Individual C-C Bond Imaging

Structure Determination of IM-5 by Electron Microscopy Alone

FA 3-MS 03-P 01 Collecting 3 D Electron Diffraction Data for Crystal Structure Determination

Determination of Atomic Structures of Crystal Defects, Interfaces and Surfaces Via Aberration-Corrected Transmission Electron Microscopy

Crystal Structure Determination from EM Images and Electron Diffraction Patterns

Structure Determination of Zeolites and Ordered Mesoporous Materials by Electron Crystallography

Collecting 3D Electron Diffraction Data for Crystal Structure Determination

Solving Three-Dimensional Structures of Nano- and Intergrown Porous Silicates by Combining Electron Crystallography and Powder X-ray Diffraction

Atomic Cluster Structure Identification Using Aberration-corrected Scanning Transmission Electron Microscopy

Accurate structure determination of nanocrystals by continuous precession electron diffraction tomography

Three-dimensional atomic-scale structure of size-selected nanoclusters on surfaces

High-resolution 3D X-ray diffraction microscopy: 3D mapping of deformed metal microstructures

Structure Determination of Modulated Structures by Powder X-ray Diffraction and Electron Diffraction

Accurate structure models and absolute configuration determination using dynamical effects in continuous-rotation 3D electron diffraction data

Solving complex nanostructures with ptychographic atomic electron tomography

The First Stable High Silica Zeolite with Extra-Large 24-Ring Channels

Crystal Structure Study for Nano-Sized Zeolites with Rotation Electron Diffraction

Collecting 3d Electron Diffraction Data by the Rotation Method

Structure Determination of Submicron-Sized Porous Materials by EM and XRD

A New Principle Of Orientation Determination For 3d Electron Diffraction Microscopy