Solving Three-Dimensional Structures of Nano- and Intergrown Porous Silicates by Combining Electron Crystallography and Powder X-ray Diffraction

Xiaodong Zou,Tom Willhammar,Wei Wan,Junliang Sunand Peter Oleynikov
DOI: https://doi.org/10.1107/s0108767312097991
2012-01-01
Abstract:Electron crystallography has two main advantages in structure solution compared to X-ray diffraction: 1) crystals millions times smaller than what is needed for X-ray diffraction can be studied and 2) the crystallographic structure factor phases are present in high resolution transmission electron microscopy (HRTEM) images [1].In order to make electron crystallography more feasible for non-TEM experts, we have developed two methods; 1)rotation electron diffraction (RED) [2] for collectingcomplete 3D electron diffraction data that transforms a TEM into a single nano-crystal diffractometer and 2)structure projection reconstruction [3] that determines the defocus values from a through-focus series of HRTEM images.Each image in the series is corrected for the effects of contrast transfer function and then combined into a structure projection image.The method works for both crystalline and non-crystalline objects.Here we show how these two methods are used to solve the structures of complex intergrown zeolites ITQ-39 [4].The structure was confirmed by simulations of powder X-ray diffraction from the disordered model.The methods are general and can be applied to any crystalline materials, where the crystals are too small or the structures too complicated to be solved by X-ray powder diffraction alone, especially for those crystals containing defects.
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