Establishment of Annular Dark-Field Scanning Confocal Electron Microscopy using a Double Aberration-Corrected Microscope

A Hashimoto,P Wang,M Shimojo,K Mitsuishi,AI Kirkland,PD Nellist,M Takeguchi

DOI: https://doi.org/10.1017/S1431927610058022

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

What problem does this paper attempt to address?

Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope

Peng Wang,Angus I. Kirkland,Peter D. Nellist,Adrian J. D’Alfonso,Andrew J. Morgan,Leslie J. Allen,Ayako Hashimoto,Masaki Takeguchi,Kazutaka Mitsuishi,Masayuki Shimojo

DOI: https://doi.org/10.1017/s1431927612004515

IF: 4.0991

2012-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Focal modulation microscopy with annular apertures: a numerical study.

Wei Gong,Ke Si,Nanguang Chen,Colin J R Sheppard

DOI: https://doi.org/10.1002/jbio.200900110

IF: 3.3899

2010-01-01

Journal of Biophotonics

Abstract:Image formation of focal modulation microscopy with annular aperture (AFMM) is presented. The spatial resolution is discussed. Compared with confocal microscopy, AFMM can simultaneously enhance the axial and transverse resolution. By adjusting the width of the annular objective aperture, AFMM can be adjusted from best spatial resolution performance to highest signal level. The capability of background rejection is also investigated, showing AFMM has the potential to further increase the imaging penetration depth. Finally, an optimal configuration of AFMM is elaborated. [GRAPHICS] Radial spoke pattern at the focal plane for focal modulation microscopy with annular apertures (AFMM).
Three-Dimensional Resolution Limits and Image Contrast Mechanisms in Scanning Confocal Electron Microscopy

PD Nellist,P Wang,G Behan,AI Kirkland,A Hashimoto,M Shimojo,K Mitsuishi,M Takeguchi,E Cosgriff,AJ D'Alfonso,LJ Allen,SD Findlay

DOI: https://doi.org/10.1017/s1431927610057533

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Scanning Confocal Electron Microscopy (SCEM) Combined with Deconvolution Technique

M. Takeguchi,A. Hashimoto,K. Mitsuishi,X. Zhang,M. Shimojo,P. Wang,N.D. Peter,A.I. Kirkland

DOI: https://doi.org/10.1017/s1431927612003510

IF: 4.0991

2012-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Improvements of Axial Resolution in Confocal Microscopy with Fan-Shaped Apertures.

Ye Ma,Cuifang Kuang,Wei Gong,Xue Li,Yao Zheng,Yifan Wang,Ke Si,Li Xu

DOI: https://doi.org/10.1364/ao.54.001354

IF: 1.9

2015-01-01

Applied Optics

Abstract:Based on diffraction theory, this paper theoretically demonstrates improvements in axial resolution in confocal microscopy with fan-shaped apertures. It provides the optimal geometric parameters of the fan-shaped pupils to give the maximum axial resolution for a given pinhole size. To fully understand the overall performance, the signal-to-background ratio and the signal level with regard to the geometric parameters are discussed.
Annular Oblique Epi-Illumination Design for Ultra-Large-scale and High-Resolution Fluorescence Microscopy

Jing Hu,Yibing Shen

DOI: https://doi.org/10.1117/12.2326710

2018-01-01

Abstract:Biological processes are inherently multi-scale, and supramolecular complexes at the cellular scale. However, in their current form these modalities are limited by a highly constrained field of view (FOV) and field-dependent imaging resolution. New-generation photographic instruments with ultra-large-scale and high-resolution imaging capabilities are strongly demanded in life science and medicine research, ranging from neuroscience to oncology. In practice, the size and quality of images from above instruments are severely limited by several factors related to the illumination. In this work, we present an efficient illumination design for ultra-large-scale and high-resolution fluorescence microscopy to be used on samples of any thickness, yielding strikingly clearer images. Compared with traditional epi-illumination device of fluorescence microscopy, the annular light of our design whose radius is large enough is incident on the sample directly from outside of the objective, rather than through the objective lens, which effectively improves the utility of off-axis illumination. Our design simplifies the overall system and reduces aberrations induced from dichroic mirror because the dichroic mirror is not required any more to separate the illumination path and imaging path. Meanwhile, more uniform illumination can be provided due to the symmetry of annular illumination. No need to consider the lighting angle, the proposed design is especially suitable for fluorescence microscopy because the direction of emitting light is spherical, regardless of the direction of excitation light. The apparatus is simple, robust and inexpensive, making it broadly useful to biological and clinical researchers alike.
Atomic Cluster Structure Identification Using Aberration-corrected Scanning Transmission Electron Microscopy

D. He,A. Logsdail,R. Johnston,R. Palmer,F. Yin,Z. Li,R. Aveyard,J. Yuan

DOI: https://doi.org/10.1017/s1431927612004527

IF: 4.0991

2012-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Quantitative Aberration-corrected Transmission Electron Microscopy

L. Houben,C. L. Jia,K. Tillmann,K. Urban

DOI: https://doi.org/10.1017/s1431927604555745

IF: 4.0991

2004-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at the Pre-Meeting Congress: Materials Research in an Aberration-Free Environment, at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, July 31 and August 1, 2004.
Three Dimensional Characterization of a Silica Hollow Sphere with an Iron Oxide Core by Annular Dark Field Scanning Confocal Electron Microscopy

Masaki Takeguchi,Mitsuhiro Okuda,Ayako Hashimoto,Kazutaka Mitsuishi,Masayuki Shimojo,Xiaobin Zhang,Peng Wang,Peter D. Nellist,Angus I. Kirkland

DOI: https://doi.org/10.1017/s143192761005885x

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Determination of Atomic Structures of Crystal Defects, Interfaces and Surfaces Via Aberration-Corrected Transmission Electron Microscopy

J Zhu,R Yu,ZY Cheng,T Ling,N Lu,L Xie,ZD Cheng,HH Zhou,XY Zhong

DOI: https://doi.org/10.1017/s1431927610059131

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Bright-field Scanning Confocal Electron Microscopy Using a Double Aberration-Corrected Transmission Electron Microscope

Peng Wang,Gavin Behan,Angus I. Kirkland,Peter D. Nellist,Eireann C. Cosgriff,Adrian J. D'Alfonso,Andrew J. Morgan,Leslie J. Allen,Ayako Hashimoto,Masaki Takeguchi,Kazutaka Mitsuishi,Masayuki Shimojo

DOI: https://doi.org/10.1016/j.ultramic.2010.10.012

IF: 2.994

2011-01-01

Ultramicroscopy

Abstract:Scanning confocal electron microscopy (SCEM) offers a mechanism for three-dimensional imaging of materials, which makes use of the reduced depth of field in an aberration-corrected transmission electron microscope. The simplest configuration of SCEM is the bright-field mode. In this paper we present experimental data and simulations showing the form of bright-field SCEM images. We show that the depth dependence of the three-dimensional image can be explained in terms of two-dimensional images formed in the detector plane. For a crystalline sample, this so-called probe image is shown to be similar to a conventional diffraction pattern. Experimental results and simulations show how the diffracted probes in this image are elongated in thicker crystals and the use of this elongation to estimate sample thickness is explored. (C) 2010 Elsevier B.V. All rights reserved.
High-Resolution Imaging with an Aberration-Corrected Transmission Electron Micrscope

M. Lentzen,B. Jahnen,C.L. Jia,K. Urban

DOI: https://doi.org/10.1017/s1431927600030592

IF: 4.0991

2001-01-01

Microscopy and Microanalysis

Abstract:In electron microscopy high-resolution imaging of finest object structures is generally hampered by the influence of aberrations of the lens system, especially the high spherical aberration of the objective lens. The delocalization of contrast details induced by aberrations is especially strong for microscopes equipped with a field emission gun providing a high spatial coherence. in recent years a prototype of an aberration correction system has been constructed by Haider et al., following a suggestion by Rose, consisting of two hexapole elements and four additional round lenses. The correction system was adapted to a Philips CM 200 FEG ST microscope with an information limit of 0.13 nm. The alignment is carried out using aberration measurements deduced from Zemlin tableaus. By appropriately exciting the hexapole elements it is possible to reduce or even fully compensate the spherical aberration of the objective lens. With the freedom of a variable spherical aberration C s new operation modes can be accessed that are not available in standard microscopes. with C s = 0 and defocus Z = 0 pure amplitude contrast occurs, together with a vanishing contrast delocalization; phase contrast with a single, narrow pass-band up to the information limit can still be achieved by Z = ±7 nm, which introduces a delocalization of R = 0.13 nm. with Cs = 97 μm and Z = −18 nm the broad Scherzer pass-band for phase contrast can be extended to the information limit, with R = 0.35 nm. For the CM 200 C s = 43 fim and Z = −12 nm still produces a high level of phase contrast, comparable with the extended Scherzer pass-band, but with R = 0.08 nm only. in the latter mode Scherzer’s defocus equals Lichte's defocus of least confusion.
Direct Mapping of Confined Interfacial States in Oxides Using Aberration Corrected STEM and EELS

AB Shah,JM Zuo,QM Ramasse,JG Wen,X Zhai,A. Bhattacharya,JN Eckstein

DOI: https://doi.org/10.1017/s143192761005631x

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Chromatic Confocal Electron Microscopy with A Finite Pinhole Size

P. Wang,A. I. Kirkland,P. D. Nellist

DOI: https://doi.org/10.1088/1742-6596/371/1/012002

2012-01-01

Journal of Physics Conference Series

Abstract:Scanning confocal electron microscopy (SCEM) is a new imaging mode in electron microscopy. Spherical aberration corrected electron microscope instruments fitted with two aberration correctors can be used in this mode which provides improved depth resolution and selectivity compared to optical sectioning in a conventional scanning transmission geometry. In this article, we consider the depth resolution and energy resolution in the confocal optical configuration for SCEM using inelastically scattered electrons with a finite pinhole size. We experimentally demonstrate energy-filtered optical sectioning in a double aberration-corrected instrument with uncorrected chromatic aberration without using a dedicated energy filter.
Benefits of Aberration-corrected STEM and EELS in the Study of Nanoscale Materials for Energy and Photonic Applications

F. Nan,S. Hosseini Vajargah,D. Rossouw,S.Y. Woo,M. Bugnet,M.C. Chan,N. Gauquelin,S. Stambula,G. Zhu,G. Botton

DOI: https://doi.org/10.1017/s1431927612003534

IF: 4.0991

2012-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Compact Dark-Field Confocal Microscopy Based on an Annular Beam with Orbital Angular Momentum

Jian Liu,Zijie Hua,Chenguang Liu

DOI: https://doi.org/10.1364/ol.439711

2021-01-01

Abstract:This study proposes a dark-field confocal microscopy (DFCM) based on fiber-mode excitation-assisted orbital angular momentum annular beam generation with a two-mode fiber to avoid diffraction distortion. The application of optical fibers compresses the DFCM volume, providing new ideas for system miniaturization. System adjustment difficulty is reduced and feasibility is verified by imaging 2D and 3D samples. High imaging contrast is achieved by fully blocking the reflected light and annular illumination with a steady central dark-spot within a propagation distance of 3 m. The application of our scheme can be further extended to detect subsurface defects in optical components and high-contrast biological imaging.
Strategies for Aberration Control in Sub-Angstrom HRTEM

A Thust,J Barthel,L Houben,C L Jia,M Lentzen,K Tillmann,K Urban

DOI: https://doi.org/10.1017/s1431927605503386

IF: 4.0991

2005-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005
Energy-Filtered Scanning Confocal Electron Microscopy

P.D. Nellist,P. Wang

DOI: https://doi.org/10.1017/s143192761201166x

IF: 4.0991

2012-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Imaging and Elemental Mapping of Biological Specimens with the Hitachi HD-2300A Dual-EDS Scanning Transmission Electron Microscope

JS Wu,AM Kim,RG Marvin,BD Myers,TK Woodruff,TV O'Halloran,VP Dravid,K McIlwrath,SY Li

DOI: https://doi.org/10.1017/s1431927610057648

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Scanning Nano Beam Electron Diffraction and Applications to Characterization of High Entropy Alloys

H. Xing,K. Kim,J.M. Zuo,M.A. Hemphill,G.Y. Wang,C.W. Tsai,J.W. Yeh,K.A. Dahmen,P.K. Liaw

DOI: https://doi.org/10.1017/s143192761300559x

IF: 4.0991

2013-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Establishment of Annular Dark-Field Scanning Confocal Electron Microscopy using a Double Aberration-Corrected Microscope

Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope

Focal modulation microscopy with annular apertures: a numerical study.

Three-Dimensional Resolution Limits and Image Contrast Mechanisms in Scanning Confocal Electron Microscopy

Scanning Confocal Electron Microscopy (SCEM) Combined with Deconvolution Technique

Improvements of Axial Resolution in Confocal Microscopy with Fan-Shaped Apertures.

Annular Oblique Epi-Illumination Design for Ultra-Large-scale and High-Resolution Fluorescence Microscopy

Atomic Cluster Structure Identification Using Aberration-corrected Scanning Transmission Electron Microscopy

Quantitative Aberration-corrected Transmission Electron Microscopy

Three Dimensional Characterization of a Silica Hollow Sphere with an Iron Oxide Core by Annular Dark Field Scanning Confocal Electron Microscopy

Determination of Atomic Structures of Crystal Defects, Interfaces and Surfaces Via Aberration-Corrected Transmission Electron Microscopy

Bright-field Scanning Confocal Electron Microscopy Using a Double Aberration-Corrected Transmission Electron Microscope

High-Resolution Imaging with an Aberration-Corrected Transmission Electron Micrscope

Direct Mapping of Confined Interfacial States in Oxides Using Aberration Corrected STEM and EELS

Chromatic Confocal Electron Microscopy with A Finite Pinhole Size

Benefits of Aberration-corrected STEM and EELS in the Study of Nanoscale Materials for Energy and Photonic Applications

Compact Dark-Field Confocal Microscopy Based on an Annular Beam with Orbital Angular Momentum

Strategies for Aberration Control in Sub-Angstrom HRTEM

Energy-Filtered Scanning Confocal Electron Microscopy

Imaging and Elemental Mapping of Biological Specimens with the Hitachi HD-2300A Dual-EDS Scanning Transmission Electron Microscope

Scanning Nano Beam Electron Diffraction and Applications to Characterization of High Entropy Alloys