Imaging and Elemental Mapping of Biological Specimens with the Hitachi HD-2300A Dual-EDS Scanning Transmission Electron Microscope

JS Wu,AM Kim,RG Marvin,BD Myers,TK Woodruff,TV O'Halloran,VP Dravid,K McIlwrath,SY Li

DOI: https://doi.org/10.1017/s1431927610057648

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

What problem does this paper attempt to address?

Imaging and elemental mapping of biological specimens with a dual-EDS dedicated scanning transmission electron microscope.

J S Wu,A M Kim,R Bleher,B D Myers,R G Marvin,H Inada,K Nakamura,X F Zhang,E Roth,S Y Li,T K Woodruff,T V O'Halloran,Vinayak P Dravid

DOI: https://doi.org/10.1016/j.ultramic.2013.01.004

IF: 2.994

2013-01-01

Ultramicroscopy

Abstract:A dedicated analytical scanning transmission electron microscope (STEM) with dual energy dispersive spectroscopy (EDS) detectors has been designed for complementary high performance imaging as well as high sensitivity elemental analysis and mapping of biological structures. The performance of this new design, based on a Hitachi HD-2300A model, was evaluated using a variety of biological specimens. With three imaging detectors, both the surface and internal structure of cells can be examined simultaneously. The whole-cell elemental mapping, especially of heavier metal species that have low cross-section for electron energy loss spectroscopy (EELS), can be faithfully obtained. Optimization of STEM imaging conditions is applied to thick sections as well as thin sections of biological cells under low-dose conditions at room and cryogenic temperatures. Such multimodal capabilities applied to soft/biological structures usher a new era for analytical studies in biological systems.
Three-Dimensional Resolution Limits and Image Contrast Mechanisms in Scanning Confocal Electron Microscopy

PD Nellist,P Wang,G Behan,AI Kirkland,A Hashimoto,M Shimojo,K Mitsuishi,M Takeguchi,E Cosgriff,AJ D'Alfonso,LJ Allen,SD Findlay

DOI: https://doi.org/10.1017/s1431927610057533

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
High-Spatial and High-Energy Resolution EELS Studies of Chemical and Electronic Properties of Interfaces and Nanostructures

K Dudeck,M Couillard,N Gauquelin,L Gunawan,S Hosseini Vajargah,S Lazar,D Rossouw,Y Shao,G Zhu,G Botton

DOI: https://doi.org/10.1017/s1431927611004843

IF: 4.0991

2011-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Scanning Confocal Electron Microscopy (SCEM) Combined with Deconvolution Technique

M. Takeguchi,A. Hashimoto,K. Mitsuishi,X. Zhang,M. Shimojo,P. Wang,N.D. Peter,A.I. Kirkland

DOI: https://doi.org/10.1017/s1431927612003510

IF: 4.0991

2012-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Establishment of Annular Dark-Field Scanning Confocal Electron Microscopy using a Double Aberration-Corrected Microscope

A Hashimoto,P Wang,M Shimojo,K Mitsuishi,AI Kirkland,PD Nellist,M Takeguchi

DOI: https://doi.org/10.1017/S1431927610058022

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Application of Monochromated Electrons in EELS

W Sigle,L Gu,C Koch,V Srot,J Nelayah,PA Van Aken

DOI: https://doi.org/10.1017/s1431927608084420

IF: 4.0991

2008-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008
Advanced Techniques in Automated High Resolution Scanning Transmission Electron Microscopy

Alexander Pattison,Cassio C.S. Pedroso,Bruce E. Cohen,Justin C. Ondry,A. Paul Alivisatos,Wolfgang Theis,Peter Ercius

2023-08-01

Abstract:Scanning transmission electron microscopy is a common tool used to study the atomic structure of materials. It is an inherently multimodal tool allowing for the simultaneous acquisition of multiple information channels. Despite its versatility, however, experimental workflows currently rely heavily on experienced human operators and can only acquire data from small regions of a sample at a time. Here, we demonstrate a flexible pipeline-based system for high-throughput acquisition of atomic-resolution structural data using a custom built sample stage and automation program. The program is capable of operating over many hours without human intervention improving the statistics of high-resolution experiments.

Instrumentation and Detectors
High-resolution, high-throughput imaging with a multibeam scanning electron microscope

A.L. EBERLE,S. MIKULA,R. SCHALEK,J. LICHTMAN,M.L. KNOTHE TATE,D. ZEIDLER

DOI: https://doi.org/10.1111/jmi.12224

IF: 1.9522

2015-01-27

Journal of Microscopy

Abstract:Electron-electron interactions and detector bandwidth limit the maximal imaging speed of single-beam scanning electron microscopes. We use multiple electron beams in a single column and detect secondary electrons in parallel to increase the imaging speed by close to two orders of magnitude and demonstrate imaging for a variety of samples ranging from biological brain tissue to semiconductor wafers.

microscopy
Determination of Atomic Structures of Crystal Defects, Interfaces and Surfaces Via Aberration-Corrected Transmission Electron Microscopy

J Zhu,R Yu,ZY Cheng,T Ling,N Lu,L Xie,ZD Cheng,HH Zhou,XY Zhong

DOI: https://doi.org/10.1017/s1431927610059131

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope

Peng Wang,Angus I. Kirkland,Peter D. Nellist,Adrian J. D’Alfonso,Andrew J. Morgan,Leslie J. Allen,Ayako Hashimoto,Masaki Takeguchi,Kazutaka Mitsuishi,Masayuki Shimojo

DOI: https://doi.org/10.1017/s1431927612004515

IF: 4.0991

2012-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Scanning Nano Beam Electron Diffraction and Applications to Characterization of High Entropy Alloys

H. Xing,K. Kim,J.M. Zuo,M.A. Hemphill,G.Y. Wang,C.W. Tsai,J.W. Yeh,K.A. Dahmen,P.K. Liaw

DOI: https://doi.org/10.1017/s143192761300559x

IF: 4.0991

2013-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
3D Complete-Tilt Electron Tomography of Semiconductor Nanowires

Jinsong Wu,Sujing Xie,Eric R. Hemesath,Lincoln J. Lauhon,Vinayak P. Dravid

DOI: https://doi.org/10.1017/s1431927610057302

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
High-Resolution Scanning X-ray Diffraction Microscopy

Pierre Thibault,Martin Dierolf,Andreas Menzel,Oliver Bunk,Christian David,Franz Pfeiffer

DOI: https://doi.org/10.1126/science.1158573

IF: 56.9

2008-07-18

Science

Abstract:Coherent diffractive imaging (CDI) and scanning transmission x-ray microscopy (STXM) are two popular microscopy techniques that have evolved quite independently. CDI promises to reach resolutions below 10 nanometers, but the reconstruction procedures put stringent requirements on data quality and sample preparation. In contrast, STXM features straightforward data analysis, but its resolution is limited by the spot size on the specimen. We demonstrate a ptychographic imaging method that bridges the gap between CDI and STXM by measuring complete diffraction patterns at each point of a STXM scan. The high penetration power of x-rays in combination with the high spatial resolution will allow investigation of a wide range of complex mesoscopic life and material science specimens, such as embedded semiconductor devices or cellular networks.

multidisciplinary sciences
The Challenge of Imaging Hard/soft Matter Interfaces at Atomic Resolution

B. Barton,R. Buonsanti,A. Dong,D. Milliron,C.F. Kisielowski,L.P. Hansen,S. Helveg,B. Jiang

DOI: https://doi.org/10.1017/s1431927612009889

IF: 4.0991

2012-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Atomic Cluster Structure Identification Using Aberration-corrected Scanning Transmission Electron Microscopy

D. He,A. Logsdail,R. Johnston,R. Palmer,F. Yin,Z. Li,R. Aveyard,J. Yuan

DOI: https://doi.org/10.1017/s1431927612004527

IF: 4.0991

2012-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
The Use of Digital/electronic Holography for Biological Applications

HY Sun,MA Player,J Watson,DC Hendry,RG Perkins,G Gust,DM Paterson

DOI: https://doi.org/10.1088/1464-4258/7/6/022

2005-01-01

Abstract:This paper presents the performance of electronic holography for imaging applications of biological and medical interest involving turbid media. It demonstrates that digital holography is useful for biological studies in the areas of estuary sediment erosion and imaging unstained living cells. In particular, we demonstrate the recording geometries of classical 'in-line' back illumination using a collimated beam for measuring micro-panicles eroded in a cylindrical observation chamber; we also demonstrate a phase contrast set-up using a magnifying lens for observing biomedical micro-objects of unstained living cells in physiological saline. Practical results are presented for the studies of sediment erosion and transport, which provide information about how polymeric substances produced by the organisms in sediment and erosion shear velocity affect the sediment particle size when erosive stresses are applied to sediment beds.
Energy-Filtered Scanning Confocal Electron Microscopy

P.D. Nellist,P. Wang

DOI: https://doi.org/10.1017/s143192761201166x

IF: 4.0991

2012-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Progress in environmental high-voltage transmission electron microscopy for nanomaterials

Nobuo Tanaka,Takeshi Fujita,Yoshimasa Takahashi,Jun Yamasaki,Kazuyoshi Murata,Shigeo Arai

DOI: https://doi.org/10.1098/rsta.2019.0602

2020-10-26

Abstract:A new environmental high-voltage transmission electron microscope (E-HVEM) was developed by Nagoya University in collaboration with JEOL Ltd. An open-type environmental cell was employed to enable in-situ observations of chemical reactions on catalyst particles as well as mechanical deformation in gaseous conditions. One of the reasons for success was the application of high-voltage transmission electron microscopy to environmental (in-situ) observations in the gas atmosphere because of high transmission of electrons through gas layers and thick samples. Knock-on damages to samples by high-energy electrons were carefully considered. In this paper, we describe the detailed design of the E-HVEM, recent developments and various applications. This article is part of a discussion meeting issue ‘Dynamic in situ microscopy relating structure and function'.
Materials Structure, Properties and Dynamics through Scanning Transmission Electron Microscopy

Stephen J. Pennycook,Changjian Li,Mengsha Li,Chunhua Tang,Eiji Okunishi,Maria Varela,Young-Min Kim,Jae Hyuck Jang

DOI: https://doi.org/10.1186/s40543-018-0142-4

2019-08-20

Abstract:Scanning transmission electron microscopy (STEM) has advanced rapidly in the last decade thanks to the ability to correct the major aberrations of the probe forming lens. Now atomic-sized beams are routine, even at accelerating voltages as low as 40 kV, allowing knock-on damage to be minimized in beam sensitive materials. The aberration-corrected probes can contain sufficient current for high quality, simultaneous, imaging and analysis in multiple modes. Atomic positions can be mapped with picometer precision, revealing ferroelectric domain structures, composition can be mapped by energy dispersive X-ray spectroscopy (EDX) and electron energy loss spectroscopy (EELS) and charge transfer can be tracked unit cell by unit cell using the EELS fine structure. Furthermore, dynamics of point defects can be investigated through rapid acquisition of multiple image scans. Today STEM has become an indispensable tool for analytical science at the atomic level, providing a whole new level of insights into the complex interplays that control materials properties.

Materials Science
Imaging with a Commercial Electron Backscatter Diffraction (EBSD) Camera in a Scanning Electron Microscope: A Review

Nicolas Brodusch,Hendrix Demers,Raynald Gauvin

DOI: https://doi.org/10.3390/jimaging4070088

2018-07-01

Journal of Imaging

Abstract:Scanning electron microscopy is widespread in field of material science and research, especially because of its high surface sensitivity due to the increased interactions of electrons with the target material’s atoms compared to X-ray-oriented methods. Among the available techniques in scanning electron microscopy (SEM), electron backscatter diffraction (EBSD) is used to gather information regarding the crystallinity and the chemistry of crystalline and amorphous regions of a specimen. When post-processing the diffraction patterns or the image captured by the EBSD detector screen which was obtained in this manner, specific imaging contrasts are generated and can be used to understand some of the mechanisms involved in several imaging modes. In this manuscript, we reviewed the benefits of this procedure regarding topographic, compositional, diffraction, and magnetic domain contrasts. This work shows preliminary and encouraging results regarding the non-conventional use of the EBSD detector. The method is becoming viable with the advent of new EBSD camera technologies, allowing acquisition speed close to imaging rates. This method, named dark-field electron backscatter diffraction imaging, is described in detail, and several application examples are given in reflection as well as in transmission modes.

Imaging and Elemental Mapping of Biological Specimens with the Hitachi HD-2300A Dual-EDS Scanning Transmission Electron Microscope

Imaging and elemental mapping of biological specimens with a dual-EDS dedicated scanning transmission electron microscope.

Three-Dimensional Resolution Limits and Image Contrast Mechanisms in Scanning Confocal Electron Microscopy

High-Spatial and High-Energy Resolution EELS Studies of Chemical and Electronic Properties of Interfaces and Nanostructures

Scanning Confocal Electron Microscopy (SCEM) Combined with Deconvolution Technique

Establishment of Annular Dark-Field Scanning Confocal Electron Microscopy using a Double Aberration-Corrected Microscope

Application of Monochromated Electrons in EELS

Advanced Techniques in Automated High Resolution Scanning Transmission Electron Microscopy

High-resolution, high-throughput imaging with a multibeam scanning electron microscope

Determination of Atomic Structures of Crystal Defects, Interfaces and Surfaces Via Aberration-Corrected Transmission Electron Microscopy

Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope

Scanning Nano Beam Electron Diffraction and Applications to Characterization of High Entropy Alloys

3D Complete-Tilt Electron Tomography of Semiconductor Nanowires

High-Resolution Scanning X-ray Diffraction Microscopy

The Challenge of Imaging Hard/soft Matter Interfaces at Atomic Resolution

Atomic Cluster Structure Identification Using Aberration-corrected Scanning Transmission Electron Microscopy

The Use of Digital/electronic Holography for Biological Applications

Energy-Filtered Scanning Confocal Electron Microscopy

Progress in environmental high-voltage transmission electron microscopy for nanomaterials

Materials Structure, Properties and Dynamics through Scanning Transmission Electron Microscopy

Imaging with a Commercial Electron Backscatter Diffraction (EBSD) Camera in a Scanning Electron Microscope: A Review