Energy-Filtered Scanning Confocal Electron Microscopy

P.D. Nellist,P. Wang

DOI: https://doi.org/10.1017/s143192761201166x

IF: 4.0991

2012-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

What problem does this paper attempt to address?

Virtual Fluorescence Emission Difference Microscopy Based on Photon Reassignment.

Ye Ma,Cuifang Kuang,Yue Fang,Baoliang Ge,Dian Li,Xu Liu

DOI: https://doi.org/10.1364/ol.40.004627

2015-01-01

Abstract:A method for high-resolution imaging that we call virtual fluorescence emission difference microscopy (vFED) is presented. In vFED the analyzed samples are scanned only by a doughnut-shaped pattern and imaged by a detector array, which is very different from the previous FED system. By using photon reassignment, we can obtain imaging results with matched solid and hollow point spread functions, and the difference between them is used to estimate the spatial distribution of the analyzed sample. This method results in greatly simplified equipment in the configuration and enhanced imaging speed. Results show that the resolution can be enhanced by at least 27% compared with that in confocal microscopy with a point detector, or is 1.8-2-fold higher than that in wide-field microscopy. Plus, negative intensities can be avoided by using vFED during the subtraction process, leading to the elimination of the deformation in reconstructed images.
Image Scanning Fluorescence Emission Difference Microscopy Based On A Detector Array

Y. Li,S. Liu,D. Liu,S. Sun,C. Kuang,Z. Ding,X. Liu

DOI: https://doi.org/10.1111/jmi.12538

IF: 1.9522

2017-01-01

Journal of Microscopy

Abstract:We propose a novel imaging method that enables the enhancement of three-dimensional resolution of confocal microscopy significantly and achieve experimentally a new fluorescence emission difference method for the first time, based on the parallel detection with a detector array. Following the principles of photon reassignment in image scanning microscopy, images captured by the detector array were arranged. And by selecting appropriate reassign patterns, the imaging result with enhanced resolution can be achieved with the method of fluorescence emission difference. Two specific methods are proposed in this paper, showing that the difference between an image scanning microscopy image and a confocal image will achieve an improvement of transverse resolution by approximately 43% compared with that in confocal microscopy, and the axial resolution can also be enhanced by at least 22% experimentally and 35% theoretically. Moreover, the methods presented in this paper can improve the lateral resolution by around 10% than fluorescence emission difference and 15% than Airyscan. The mechanism of our methods is verified by numerical simulations and experimental results, and it has significant potential in biomedical applications.
Imaging scanning fluorescence emission difference microscopy based on a detector array

Shaocong Liu,Yicheng Li,Cuifang Kuang,Xu Liu

DOI: https://doi.org/10.1364/3d.2016.jt3a.61

2016-01-01

Abstract:Fluorescence emission difference microscopy (FED) is a method to improve the resolution implemented by the subtraction of two scanning images modulated by two different beams, and the resolution can be enhanced by a factor of 2 at most. For further improvement of the resolving ability of FED, a novel method is proposed in this paper utilizing the technique of imaging scan to realize the higher-resolution imaging, which we called imaging scanning fluorescence emission difference microscopy (ISFED). With a 32-element detector array, the subtraction between imaging results with imaging scanning microscopy and confocal microscopy can achieve higher resolution, including transverse direction and axial direction, and signal noise ratio (SNR) than that in FED microscopy.
Dynamic live-cell super-resolution imaging with parallelized fluorescence emission difference microscopy

Minfei He,Yubing Han,Yanhong Gan,Zhimin Zhang,Wenjie Liu,Liang Xu,Cuifang Kuang,Xiang Hao,Xu Liu

DOI: https://doi.org/10.1016/j.optcom.2019.125087

IF: 2.4

2020-01-01

Optics Communications

Abstract:The investigation of the cell biology with fluorescence microscopy remains challenging because of the requirement of both high temporal and spatial resolution. In this paper, parallelized fluorescence emission difference microscopy (pFED) is presented to provide 2-fold increasing imaging speed than conventional FED and achieve high spatial resolution (0.2 λ–0.3 λ) with a novel system design. The super-resolution images are obtained by aligning and subtracting two images, that are acquired simultaneously using parallelized scanning solid- and donut-shaped excitation beams with a lateral offset between two foci. Herein, we demonstrate the general applicability of pFED with time-lapse imaging of various subcellular dynamics in live cells over an extended period.
Light Sheet Microscopy Using Line Scan Confocal with Bidirectional Bessel Beam Illumination

Jiachen Zhang,youhua chen,Cuifang Kuang,Liang Xu,Zhimin Zhang,Fanghui Xu,Dongdong Ding,Chi Zheng

DOI: https://doi.org/10.2139/ssrn.4068688

2022-01-01

SSRN Electronic Journal

Abstract:In this paper, light sheet microscopy using line scan confocal with bidirectional Bessel beam illumination is presented. By matching the scanning of the Bessel beam with the line-by-line exposure of the sCMOS, we shape the active area of the sensor to a slit and use the slit as a spatial filter to suppress the background noise caused by the side lobe of the Bessel beam. The optimal signal-to-noise ratio is obtained by changing the width of the slit. The images of fluorescent particle samples and zebrafish samples obtained by using the in line confocal and wide field modes are compared to verify the ability of this method to suppress background noise. In addition, three-dimensional imaging is realized by cooperating with the movement of the sample translation stage. The system has the ability of in vivo imaging, which is confirmed by recording the heartbeat of a zebrafish and the flow of cells in blood vessels. Finally, an imaging of high-scattered Drosophila larvae confirms that bidirectional illumination can achieve uniform illumination in high-scattering samples.
Integrated Dual-Color Stimulated Emission Depletion (STED) Microscopy and Fluorescence Emission Difference (FED) Microscopy

Wensheng Wang,Guangyuan Zhao,Cuifang Kuang,Liang Xu,Shaocong Liu,Shiyi Sun,Ping Shentu,Yang (Michael) Yang,Yingke Xu,Xu Liu

DOI: https://doi.org/10.1016/j.optcom.2018.04.017

IF: 2.4

2018-01-01

Optics Communications

Abstract:We report on the design and implementation of an integrated dual-color stimulated emission depletion (STED) microscopy and fluorescence emission difference (FED) microscopy. This highly integrated system combines the respective advantages of STED and FED microscopies, enabling acquisition of super-resolution STED images with specific fluorophores and high laser power, or resolution-enhanced FED imaging for ordinary fluorescent dyes and other materials with moderate demand for laser power. The functional integration enables researchers to select the more appropriate microscopy according to practical scenario and requirements, giving full play to their respective strengths and satisfying the imaging demands maximally. The system's resolution is characterized by dual-color imaging of fluorescent particles. Its practical applicability is verified through imaging various kinds of samples, including several fixed cells stained with different organic dyes and a given organic material-organometallic halide perovskite.
Scanning Confocal Electron Microscopy (SCEM) Combined with Deconvolution Technique

M. Takeguchi,A. Hashimoto,K. Mitsuishi,X. Zhang,M. Shimojo,P. Wang,N.D. Peter,A.I. Kirkland

DOI: https://doi.org/10.1017/s1431927612003510

IF: 4.0991

2012-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope

Peng Wang,Angus I. Kirkland,Peter D. Nellist,Adrian J. D’Alfonso,Andrew J. Morgan,Leslie J. Allen,Ayako Hashimoto,Masaki Takeguchi,Kazutaka Mitsuishi,Masayuki Shimojo

DOI: https://doi.org/10.1017/s1431927612004515

IF: 4.0991

2012-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Contrast in Atomically Resolved EF-SCEM Imaging

Peng Wang,Adrian J. D'Alfonso,Ayako Hashimoto,Andrew J. Morgan,Masaki Takeguchi,Kazutaka Mitsuishi,Masayuki Shimojo,Angus I. Kirkland,Leslie J. Allen,Peter D. Nellist

DOI: https://doi.org/10.1016/j.ultramic.2013.06.007

IF: 2.994

2013-01-01

Ultramicroscopy

Abstract:Energy-filtered scanning confocal electron microscopy (EF-SCEM) is a technique that uses the reduced depth of field of an aberration-corrected transmission electron microscope to provide three-dimensional (3D) compositional information. Using a silicon sample in the <110> orientation, we show that EF-SCEM image data can be recorded that shows lattice resolution in the plane perpendicular to the incident beam direction. The confocal effect is demonstrated through the reduction of the mean intensity as the confocal plane is displaced from the sample mid-plane, unlike optical sectioning in high-angle annular dark-field scanning transmission electron microscopy (STEM). Simulations of the EF-SCEM data show agreement with the experimental data, and allow the interpretability of the data to be explored. The effects of channelling, absorption and delocalisation complicate the quantitative and qualitative interpretation of the data, highlighting the need for matching to simulations. Finally the effects of the finite detector pin-hole aperture size are explored, and we show that the EF-SCEM contrast in the plane perpendicular to the beam direction starts to resemble that of a STEM spectrum imaging experiment as the aperture size increases.
Application of Monochromated Electrons in EELS

W Sigle,L Gu,C Koch,V Srot,J Nelayah,PA Van Aken

DOI: https://doi.org/10.1017/s1431927608084420

IF: 4.0991

2008-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008
Three-Dimensional Resolution Limits and Image Contrast Mechanisms in Scanning Confocal Electron Microscopy

PD Nellist,P Wang,G Behan,AI Kirkland,A Hashimoto,M Shimojo,K Mitsuishi,M Takeguchi,E Cosgriff,AJ D'Alfonso,LJ Allen,SD Findlay

DOI: https://doi.org/10.1017/s1431927610057533

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
High-Spatial and High-Energy Resolution EELS Studies of Chemical and Electronic Properties of Interfaces and Nanostructures

K Dudeck,M Couillard,N Gauquelin,L Gunawan,S Hosseini Vajargah,S Lazar,D Rossouw,Y Shao,G Zhu,G Botton

DOI: https://doi.org/10.1017/s1431927611004843

IF: 4.0991

2011-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Establishment of Annular Dark-Field Scanning Confocal Electron Microscopy using a Double Aberration-Corrected Microscope

A Hashimoto,P Wang,M Shimojo,K Mitsuishi,AI Kirkland,PD Nellist,M Takeguchi

DOI: https://doi.org/10.1017/S1431927610058022

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Chromatic Confocal Electron Microscopy with A Finite Pinhole Size

P. Wang,A. I. Kirkland,P. D. Nellist

DOI: https://doi.org/10.1088/1742-6596/371/1/012002

2012-01-01

Journal of Physics Conference Series

Abstract:Scanning confocal electron microscopy (SCEM) is a new imaging mode in electron microscopy. Spherical aberration corrected electron microscope instruments fitted with two aberration correctors can be used in this mode which provides improved depth resolution and selectivity compared to optical sectioning in a conventional scanning transmission geometry. In this article, we consider the depth resolution and energy resolution in the confocal optical configuration for SCEM using inelastically scattered electrons with a finite pinhole size. We experimentally demonstrate energy-filtered optical sectioning in a double aberration-corrected instrument with uncorrected chromatic aberration without using a dedicated energy filter.
Scanning Nano Beam Electron Diffraction and Applications to Characterization of High Entropy Alloys

H. Xing,K. Kim,J.M. Zuo,M.A. Hemphill,G.Y. Wang,C.W. Tsai,J.W. Yeh,K.A. Dahmen,P.K. Liaw

DOI: https://doi.org/10.1017/s143192761300559x

IF: 4.0991

2013-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Optical Sectioning and Confocal Imaging and Analysis in the Transmission Electron Microscope

Peter D. Nellist,Peng Wang

DOI: https://doi.org/10.1146/annurev-matsci-070511-155016

2012-01-01

Abstract:Aberration correction in the transmission electron microscope has led to a reduction in the depth of focus for imaging. The depth of focus in a state-of-the-art scanning transmission electron microscope system, which is currently just a few nanometers, creates an opportunity to explore the three-dimensional structure of a sample by focusing on specific layers, an approach known as optical sectioning. In this article, we review the performance of optical sectioning in the scanning transmission electron microscope. Limitations in the simple optical sectioning approach are used to motivate discussion of confocal electron microscopy. Three imaging modes in scanning confocal electron microscopy have been investigated both theoretically and experimentally, and are reviewed here. The method of implementing a confocal arrangement in a microscope is discussed, along with its comparative performance with other methods for three-dimensional imaging and analysis. Finally, current and future potential applications are discussed.
A Slot Aperture Enabled High Efficient and Accurate EMCD from a Single Acquisition of Momentum Resolved EELS

Yuehui Li,Mei Wu,Ruochen Shi,Peng Gao

DOI: https://doi.org/10.1017/s1431927620022254

IF: 4.0991

2020-01-01

Microscopy and Microanalysis

Abstract:An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Energy filtering enables macromolecular MicroED data at sub-atomic resolution

Max T B Clabbers,Johan Hattne,Michael W Martynowycz,Tamir Gonen

DOI: https://doi.org/10.1101/2024.08.29.610380

2024-08-29

bioRxiv

Abstract:High resolution information is important for accurate structure modelling. However, this level of detail is typically difficult to attain in macromolecular crystallography because the diffracted intensities rapidly fade with increasing resolution. The problem cannot be circumvented by increasing the fluence as this leads to detrimental radiation damage. Previously, we demonstrated that high quality MicroED data can be obtained at low flux conditions using electron counting with direct electron detectors. The improved sensitivity and accuracy of these detectors essentially eliminate the read-out noise, such that the measurement of faint high-resolution reflections is limited by other sources of noise. Inelastic scattering is a major contributor of such noise, increasing background counts and broadening diffraction spots. Here, we demonstrate that a substantial improvement in signal-to-noise ratio can be achieved using an energy filter to largely remove the inelastically scattered electrons. This strategy resulted in sub-atomic resolution MicroED data from proteinase K crystals, enabling accurate structure modelling and the visualization of detailed features. Interestingly, filtering out the noise revealed diffuse scattering phenomena that can hold additional structural information. Our findings suggest that combining energy filtering and electron counting can provide more accurate measurements at higher resolution, providing better insights into protein function and facilitating more precise model refinement.
Imaging and Elemental Mapping of Biological Specimens with the Hitachi HD-2300A Dual-EDS Scanning Transmission Electron Microscope

JS Wu,AM Kim,RG Marvin,BD Myers,TK Woodruff,TV O'Halloran,VP Dravid,K McIlwrath,SY Li

DOI: https://doi.org/10.1017/s1431927610057648

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Mapping of Valence Energy Losses Via Energy-Filtered Annular Dark-Field Scanning Transmission Electron Microscopy

Lin Gu,Wilfried Sigle,Christoph T. Koch,Jaysen Nelayah,Vesna Srot,Peter A. van Aken

DOI: https://doi.org/10.1016/j.ultramic.2009.05.001

IF: 2.994

2009-01-01

Ultramicroscopy

Abstract:The advent of electron monochromators has opened new perspectives on electron energy-loss spectroscopy at low energy losses, including phenomena such as surface plasmon resonances or electron transitions from the valence to the conduction band. In this paper, we report first results making use of the combination of an energy filter and a post-filter annular dark-field detector. This instrumental design allows us to obtain energy-filtered (i.e. inelastic) annular dark-field images in scanning transmission electron microscopy of the 2-dimensional semiconductor band-gap distribution of a GaN/Al45Ga55N structure and of surface plasmon resonances of silver nanoprisms. In comparison to other approaches, the technique is less prone to inelastic delocalization and relativistic artefacts. The mixed contribution of elastic and inelastic contrast is discussed.

Energy-Filtered Scanning Confocal Electron Microscopy

Virtual Fluorescence Emission Difference Microscopy Based on Photon Reassignment.

Image Scanning Fluorescence Emission Difference Microscopy Based On A Detector Array

Imaging scanning fluorescence emission difference microscopy based on a detector array

Dynamic live-cell super-resolution imaging with parallelized fluorescence emission difference microscopy

Light Sheet Microscopy Using Line Scan Confocal with Bidirectional Bessel Beam Illumination

Integrated Dual-Color Stimulated Emission Depletion (STED) Microscopy and Fluorescence Emission Difference (FED) Microscopy

Scanning Confocal Electron Microscopy (SCEM) Combined with Deconvolution Technique

Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope

Contrast in Atomically Resolved EF-SCEM Imaging

Application of Monochromated Electrons in EELS

Three-Dimensional Resolution Limits and Image Contrast Mechanisms in Scanning Confocal Electron Microscopy

High-Spatial and High-Energy Resolution EELS Studies of Chemical and Electronic Properties of Interfaces and Nanostructures

Establishment of Annular Dark-Field Scanning Confocal Electron Microscopy using a Double Aberration-Corrected Microscope

Chromatic Confocal Electron Microscopy with A Finite Pinhole Size

Scanning Nano Beam Electron Diffraction and Applications to Characterization of High Entropy Alloys

Optical Sectioning and Confocal Imaging and Analysis in the Transmission Electron Microscope

A Slot Aperture Enabled High Efficient and Accurate EMCD from a Single Acquisition of Momentum Resolved EELS

Energy filtering enables macromolecular MicroED data at sub-atomic resolution

Imaging and Elemental Mapping of Biological Specimens with the Hitachi HD-2300A Dual-EDS Scanning Transmission Electron Microscope

Mapping of Valence Energy Losses Via Energy-Filtered Annular Dark-Field Scanning Transmission Electron Microscopy