Application of Monochromated Electrons in EELS

W Sigle,L Gu,C Koch,V Srot,J Nelayah,PA Van Aken

DOI: https://doi.org/10.1017/s1431927608084420

IF: 4.0991

2008-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

What problem does this paper attempt to address?

Low-loss EELS with Monochromated Electrons

Sigle W,Gu L,Srot V,Koch Ch,Aken P A van

DOI: https://doi.org/10.1017/s1431927607080270

IF: 4.0991

2007-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007
High-Spatial and High-Energy Resolution EELS Studies of Chemical and Electronic Properties of Interfaces and Nanostructures

K Dudeck,M Couillard,N Gauquelin,L Gunawan,S Hosseini Vajargah,S Lazar,D Rossouw,Y Shao,G Zhu,G Botton

DOI: https://doi.org/10.1017/s1431927611004843

IF: 4.0991

2011-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Energy-Filtered Scanning Confocal Electron Microscopy

P.D. Nellist,P. Wang

DOI: https://doi.org/10.1017/s143192761201166x

IF: 4.0991

2012-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Imaging and Elemental Mapping of Biological Specimens with the Hitachi HD-2300A Dual-EDS Scanning Transmission Electron Microscope

JS Wu,AM Kim,RG Marvin,BD Myers,TK Woodruff,TV O'Halloran,VP Dravid,K McIlwrath,SY Li

DOI: https://doi.org/10.1017/s1431927610057648

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Event-based hyperspectral EELS: towards nanosecond temporal resolution

Yves Auad,Michael Walls,Jean-Denis Blazit,Odile Stéphan,Luiz H. G. Tizei,Mathieu Kociak,Francisco De la Peña,Marcel Tencé

DOI: https://doi.org/10.1017/S1431927622010030

2022-05-03

Abstract:The acquisition of a hyperspectral image is nowadays a standard technique used in the scanning transmission electron microscope. It relates the spatial position of the electron probe to the spectral data associated with it. In the case of electron energy loss spectroscopy (EELS), frame-based hyperspectral acquisition is much slower than the achievable rastering time of the scan unit (SU), which sometimes leads to undesirable effects in the sample, such as electron irradiation damage, that goes unperceived during frame acquisition. In this work, we have developed an event-based hyperspectral EELS by using a Timepix3 application-specific integrated circuit detector with two supplementary time-to-digital (TDC) lines embedded. In such a system, electron events are characterized by their positional and temporal coordinates, but TDC events only by temporal ones. By sending reference signals from the SU to the TDC line, it is possible to reconstruct the entire spectral image with SU-limited scanning pixel dwell time and thus acquire, with no additional cost, a hyperspectral image at the same rate as that of a single channel detector, such as annular dark-field. To exemplify the possibilities behind event-based hyperspectral EELS, we have studied the decomposition of calcite (CaCO$_3$) into calcium oxide (CaO) and carbon dioxide (CO$_2$) under the electron beam irradiation.

Instrumentation and Detectors,Materials Science
Scanning Nano Beam Electron Diffraction and Applications to Characterization of High Entropy Alloys

H. Xing,K. Kim,J.M. Zuo,M.A. Hemphill,G.Y. Wang,C.W. Tsai,J.W. Yeh,K.A. Dahmen,P.K. Liaw

DOI: https://doi.org/10.1017/s143192761300559x

IF: 4.0991

2013-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Electron Magnetic Linear Dichroism (EMLD) and Electron Magnetic Circular Dichroism (EMCD) in Electron Energy-Loss Spectroscopy

P A van Aken,L Gu,D Goll,G Schütz

DOI: https://doi.org/10.1017/s143192760708213x

IF: 4.0991

2007-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007
Full Field Electron Spectromicroscopy Applied To Ferroelectric Materials

n barrett,j e rault,j l wang,c mathieu,andrea locatelli,t o mentes,m a nino,s fusil,m bibes,agnes barthelemy,d sando,wei ren,s a prosandeev,laurent m bellaiche,b vilquin,a petraru,i krug,c m schneider

DOI: https://doi.org/10.1063/1.4801968

IF: 2.877

2013-01-01

Journal of Applied Physics

Abstract:The application of PhotoEmission Electron Microscopy (PEEM) and Low Energy Electron Microscopy (LEEM) techniques to the study of the electronic and chemical structures of ferroelectric materials is reviewed. Electron optics in both techniques gives spatial resolution of a few tens of nanometres. PEEM images photoelectrons, whereas LEEM images reflected and elastically backscattered electrons. Both PEEM and LEEM can be used in direct and reciprocal space imaging. Together, they provide access to surface charge, work function, topography, chemical mapping, surface crystallinity, and band structure. Examples of applications for the study of ferroelectric thin films and single crystals are presented. (C) 2013 AIP Publishing LLC
Electron Microscopy of Nanodevices: in Situ and Ex Situ Characterization of Structure and Transport Properties of Carbon Nanotubes

JM Zuo,T Kim,Q Chen,LM Peng,EA Olson

DOI: https://doi.org/10.1017/s1431927608082445

IF: 4.0991

2008-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008
Sub-0.5 eV EFTEM Mapping using the Zeiss SESAM

C. T. Koch,W. Sigle,J. Nelayah,L. Gu,V. Srot,P. A. Aken

DOI: https://doi.org/10.1007/978-3-540-85156-1_224

2008-01-01

Abstract:Being equipped with a monochromator and a high-transmissivity energy filter (MANDOLINE filter, T0.5eV = 3250 nm2/sr) the Sub-Electron-Volt-Sub-Ångstrom-Microscope (SESAM) [1] recently developed by Zeiss SMT is an ideal tool for EFTEM and EELS applications requiring high energy and spatial resolution. Figure 1 shows the instrument itself and the shape of the zero-loss peak, having a width of 77 meV. Although an energy-resolution of < 50 meV has already been achieved [2], the spectrum shown here is more representative for the instruments everyday performance.
A Slot Aperture Enabled High Efficient and Accurate EMCD from a Single Acquisition of Momentum Resolved EELS

Yuehui Li,Mei Wu,Ruochen Shi,Peng Gao

DOI: https://doi.org/10.1017/s1431927620022254

IF: 4.0991

2020-01-01

Microscopy and Microanalysis

Abstract:An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Determination of Atomic Structures of Crystal Defects, Interfaces and Surfaces Via Aberration-Corrected Transmission Electron Microscopy

J Zhu,R Yu,ZY Cheng,T Ling,N Lu,L Xie,ZD Cheng,HH Zhou,XY Zhong

DOI: https://doi.org/10.1017/s1431927610059131

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Imaging at the mesoscale (LEEM, PEEM)

Alessandro Sala

DOI: https://doi.org/10.48550/arXiv.1812.01610

2018-12-05

Abstract:*To be published in Springer Handbook of Surface Science (Springer Verlag) [Preprint]* The capability to display images containing chemical, magnetic and structural information and to perform spectroscopy and diffraction from a {\mu}m-sized area makes cathode lens electron microscopy one of the most used and reliable techniques to analyze surfaces at the mesoscale. Thanks to its versatility, LEEM/PEEM systems are currently employed to study model systems in the fields of nanotechnology, nanomagnetism, material science, catalysis, energy storage, thin films and 2D materials. In the following chapter, we will present a brief but complete review of this class of instruments. After an historical digression in the introducing section, we will show first the basic operating principles of a simple setup and then the elements that can be added to improve the performances. Later, two sections will be dedicated to LEEM and PEEM respectively. In both cases, a theoretical discussion on the contrast mechanisms will prelude to a showcase of the operating modes of the instrument, with clear examples that will show the best performances available nowadays. Finally, a brief discussion about the future developments of cathode lens electron microscopy will close the chapter.

Mesoscale and Nanoscale Physics,Instrumentation and Detectors
3D Complete-Tilt Electron Tomography of Semiconductor Nanowires

Jinsong Wu,Sujing Xie,Eric R. Hemesath,Lincoln J. Lauhon,Vinayak P. Dravid

DOI: https://doi.org/10.1017/s1431927610057302

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
A New Path to Nanoscale Cellular Analysis with Monochromated Electron Energy-Loss Spectroscopy

Jordan A. Hachtel,Jacek Jakowski,Jingsong Huang,Santa Jansone-Popova,Ilja Popovs,Elizabeth A. Richardson,Barbara R. Evans,Peter Rez,Eric V. Formo

DOI: https://doi.org/10.48550/arXiv.2206.04191

2022-06-09

Abstract:High-spatial-resolution vibrational spectroscopy is one of the principal techniques for nanoscale compositional analysis in biological materials. Here, we present a new method for the analysis of whole-cell biological specimens through nanoscale vibrational electron energy-loss spectroscopy (EELS) in the monochromated scanning transmission electron microscope. Using the combined spatial and spectral resolution of the technique, we examine the vascular system of a cucumber stem and identify clear physical and vibrational signatures from the different cellular regions with high spatial resolution. Furthermore, using first-principles calculations combined with optical and EELS spectroscopy on the individual components that make up the cucumber stem, we unravel the physical mechanisms of the vibrational signatures and directly assign compositional origins to the cell walls and bodies of different cellular regions. These results demonstrate that monochromated electron energy-loss spectroscopy is a promising technique for nanoscale spatial mapping of the chemical composition of biological materials.

Biological Physics
Applications of Aberration-corrected TEM and STEM in Complex Oxides and Nanostructured Materials

S Lazar,L-Y Chang,L Gunawan,Y Shao,GA Botton

DOI: https://doi.org/10.1017/S1431927609098663

IF: 4.0991

2009-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisition

Fulin Wang,McLean P Echlin,Aidan A Taylor,Jungho Shin,Benjamin Bammes,Barnaby D A Levin,Marc De Graef,Tresa M Pollock,Daniel S Gianola,McLean P. Echlin,Aidan A. Taylor,Barnaby D.A. Levin,Tresa M. Pollock,Daniel S. Gianola

DOI: https://doi.org/10.1016/j.ultramic.2020.113160

IF: 2.994

2021-01-01

Ultramicroscopy

Abstract:<p>A monolithic active pixel sensor based direct detector that is optimized for the primary beam energies in scanning electron microscopes is implemented for electron back-scattered diffraction (EBSD) applications. The high detection efficiency of the detector and its large array of pixels allow sensitive and accurate detection of Kikuchi bands arising from primary electron beam excitation energies of 4 keV to 28 keV, with the optimal contrast occurring in the range of 8-16 keV. The diffraction pattern acquisition speed is substantially improved via a sparse sampling mode, resulting from the acquisition of a reduced number of pixels on the detector. Standard inpainting algorithms are implemented to effectively estimate the information in the skipped regions in the acquired diffraction pattern. For EBSD mapping, an acquisition speed as high as 5988 scan points per second is demonstrated, with a tolerable fraction of indexed points and accuracy. The collective capabilities spanning from high angular resolution EBSD pattern to high speed pattern acquisition are achieved on the same detector, facilitating simultaneous detection modalities that enable a multitude of advanced EBSD applications, including lattice strain mapping, structural refinement, low-dose characterization, 3D-EBSD and dynamic in situ EBSD.</p>

microscopy
In Situ Electron Microscopy Characterization of Optoelectronic Nanostructures and Nanodevices

M Gao,C Li,W Li,Z Liu,L-M Peng

DOI: https://doi.org/10.1017/s1431927610059842

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Atomic Cluster Structure Identification Using Aberration-corrected Scanning Transmission Electron Microscopy

D. He,A. Logsdail,R. Johnston,R. Palmer,F. Yin,Z. Li,R. Aveyard,J. Yuan

DOI: https://doi.org/10.1017/s1431927612004527

IF: 4.0991

2012-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Establishment of Annular Dark-Field Scanning Confocal Electron Microscopy using a Double Aberration-Corrected Microscope

A Hashimoto,P Wang,M Shimojo,K Mitsuishi,AI Kirkland,PD Nellist,M Takeguchi

DOI: https://doi.org/10.1017/S1431927610058022

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Application of Monochromated Electrons in EELS

Low-loss EELS with Monochromated Electrons

High-Spatial and High-Energy Resolution EELS Studies of Chemical and Electronic Properties of Interfaces and Nanostructures

Energy-Filtered Scanning Confocal Electron Microscopy

Imaging and Elemental Mapping of Biological Specimens with the Hitachi HD-2300A Dual-EDS Scanning Transmission Electron Microscope

Event-based hyperspectral EELS: towards nanosecond temporal resolution

Scanning Nano Beam Electron Diffraction and Applications to Characterization of High Entropy Alloys

Electron Magnetic Linear Dichroism (EMLD) and Electron Magnetic Circular Dichroism (EMCD) in Electron Energy-Loss Spectroscopy

Full Field Electron Spectromicroscopy Applied To Ferroelectric Materials

Electron Microscopy of Nanodevices: in Situ and Ex Situ Characterization of Structure and Transport Properties of Carbon Nanotubes

Sub-0.5 eV EFTEM Mapping using the Zeiss SESAM

A Slot Aperture Enabled High Efficient and Accurate EMCD from a Single Acquisition of Momentum Resolved EELS

Determination of Atomic Structures of Crystal Defects, Interfaces and Surfaces Via Aberration-Corrected Transmission Electron Microscopy

Imaging at the mesoscale (LEEM, PEEM)

3D Complete-Tilt Electron Tomography of Semiconductor Nanowires

A New Path to Nanoscale Cellular Analysis with Monochromated Electron Energy-Loss Spectroscopy

Applications of Aberration-corrected TEM and STEM in Complex Oxides and Nanostructured Materials

Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisition

In Situ Electron Microscopy Characterization of Optoelectronic Nanostructures and Nanodevices

Atomic Cluster Structure Identification Using Aberration-corrected Scanning Transmission Electron Microscopy

Establishment of Annular Dark-Field Scanning Confocal Electron Microscopy using a Double Aberration-Corrected Microscope