Full Field Electron Spectromicroscopy Applied To Ferroelectric Materials

n barrett,j e rault,j l wang,c mathieu,andrea locatelli,t o mentes,m a nino,s fusil,m bibes,agnes barthelemy,d sando,wei ren,s a prosandeev,laurent m bellaiche,b vilquin,a petraru,i krug,c m schneider
DOI: https://doi.org/10.1063/1.4801968
IF: 2.877
2013-01-01
Journal of Applied Physics
Abstract:The application of PhotoEmission Electron Microscopy (PEEM) and Low Energy Electron Microscopy (LEEM) techniques to the study of the electronic and chemical structures of ferroelectric materials is reviewed. Electron optics in both techniques gives spatial resolution of a few tens of nanometres. PEEM images photoelectrons, whereas LEEM images reflected and elastically backscattered electrons. Both PEEM and LEEM can be used in direct and reciprocal space imaging. Together, they provide access to surface charge, work function, topography, chemical mapping, surface crystallinity, and band structure. Examples of applications for the study of ferroelectric thin films and single crystals are presented. (C) 2013 AIP Publishing LLC
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