Abstract:Diffraction-before-destruction imaging with single ultrashort X-ray pulses has the potential to visualise non-equilibrium processes, such as chemical reactions, at the nanoscale with sub-femtosecond resolution in the native environment without the need of crystallization. Here, a nanospecimen partially diffracts a single X-ray flash before sample damage occurs. The structural information of the sample can be reconstructed from the coherent X-ray interference image. State-of-art spatial resolution of such snapshots from individual heavy element nanoparticles is limited to a few nanometers. Further improvement of spatial resolution requires higher image brightness which is ultimately limited by bleaching effects of the sample. We compared snapshots from individual 100 nm Xe nanoparticles as a function of the X-ray pulse duration and incoming X-ray intensity in the vicinity of the Xe M-shell resonance. Surprisingly, images recorded with few femtosecond and sub-femtosecond pulses are up to 10 times brighter than the static linear model predicts. Our Monte-Carlo simulation and statistical analysis of the entire data set confirms these findings and attributes the effect to transient resonances. Our simulation suggests that ultrafast form factor changes during the exposure can increase the brightness of X-ray images by several orders of magnitude. Our study guides the way towards imaging with unprecedented combination of spatial and temporal resolution at the nanoscale.

Event-based hyperspectral EELS: towards nanosecond temporal resolution

Coincidence Detection of EELS and EDX Spectral Events in the Electron Microscope

Using Electron Energy-Loss Spectroscopy to Measure Nanoscale Electronic and Vibrational Dynamics in a TEM

Spectroscopic coincidence experiments in transmission electron microscopy

Hybrid pixel direct detector for electron energy loss spectroscopy

Calcium Quantitation with A Parallel EELS/Cooled CCD System

Transient X‐Ray Absorption Near Edge Structure Spectroscopy Using Broadband Free‐Electron Laser Pulses

Tracking Atomic Positions in Molecular Reactions by Picosecond X-ray Scattering at the ESRF

A high-sensitivity CCD system for parallel electron energy-loss spectroscopy (CCD for EELS).

Fast reconstruction of atomic-scale STEM-EELS images from sparse sampling

Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisition

Ghost-imaging-enhanced noninvasive spectral characterization of stochastic x-ray free-electron-laser pulses

Hyperspectral X-Ray Imaging For Nanometrology

Microsecond time-resolved X-ray scattering by utilizing MHz repetition rate at second-generation XFELs

Femtosecond MeV Electron Energy-Loss Spectroscopy

Hyperspectral mapping-combining cathodoluminescence and X-ray collection in an electron microprobe

Secondary Electron Imaging of Nanostructures Using Extreme Ultra‐Violet Attosecond Pulse Trains and Infra‐Red Femtosecond Pulses

Photoemission electron microscopy using extreme ultraviolet attosecond pulse trains.

Development of Electron Energy-Loss Spectroscopy for Nanoscience.

Surface Atomic Diffusion Processes Observed at Milliseconds Time Resolution Using Environmental TEM

Enhanced ultrafast X-ray diffraction by transient resonances