Scanning Confocal Electron Microscopy (SCEM) Combined with Deconvolution Technique

M. Takeguchi,A. Hashimoto,K. Mitsuishi,X. Zhang,M. Shimojo,P. Wang,N.D. Peter,A.I. Kirkland

DOI: https://doi.org/10.1017/s1431927612003510

IF: 4.0991

2012-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

What problem does this paper attempt to address?

Image Scanning Fluorescence Emission Difference Microscopy Based On A Detector Array

Y. Li,S. Liu,D. Liu,S. Sun,C. Kuang,Z. Ding,X. Liu

DOI: https://doi.org/10.1111/jmi.12538

IF: 1.9522

2017-01-01

Journal of Microscopy

Abstract:We propose a novel imaging method that enables the enhancement of three-dimensional resolution of confocal microscopy significantly and achieve experimentally a new fluorescence emission difference method for the first time, based on the parallel detection with a detector array. Following the principles of photon reassignment in image scanning microscopy, images captured by the detector array were arranged. And by selecting appropriate reassign patterns, the imaging result with enhanced resolution can be achieved with the method of fluorescence emission difference. Two specific methods are proposed in this paper, showing that the difference between an image scanning microscopy image and a confocal image will achieve an improvement of transverse resolution by approximately 43% compared with that in confocal microscopy, and the axial resolution can also be enhanced by at least 22% experimentally and 35% theoretically. Moreover, the methods presented in this paper can improve the lateral resolution by around 10% than fluorescence emission difference and 15% than Airyscan. The mechanism of our methods is verified by numerical simulations and experimental results, and it has significant potential in biomedical applications.
Modulated Pattern Scanning Microscopy

Yuxuan Qiu,Yuran Huang,Xin Liu,Yusen Zhang,Xiang Hao,Cuifang Kuang,Xu Liu

DOI: https://doi.org/10.1364/ol.451958

2022-01-01

Abstract:In confocal microscopy, the effective optical transfer function (OTFeff) with Gaussian plane wave illumination covers very few high-frequency components, which prohibits further improvement of the resolution. We propose modulated pattern scanning microscopy (MPSM) to achieve super-resolution imaging. In MPSM, the phase of the illumination beam is modulated to reassign the OTFeff in the Fourier domain. The phase mask is designed using an optimization algorithm to obtain the fluorescence emission pattern with rich high-frequency components. Then, the postprocessing algorithms are adapted to retrieve the super-resolved images from the modulated recordings. Simulation and experiment demonstrate that MPSM increases the resolution approximately 1.3 times better than confocal microscopy. Compared with conventional deconvolution, MPSM exhibits a higher signal-to-noise ratio.
Image Scanning Difference Microscopy

Yuchen Chen,Shaocong Liu,Chengfeng Zhang,Zhimin Zhang,Cuifang Kuang,Xiang Hao,Xu Liu

DOI: https://doi.org/10.1111/jmi.12840

IF: 1.9522

2019-01-01

Journal of Microscopy

Abstract:Here, we propose a novel imaging method, which is called image scanning difference microscopy (ISDM), for superresolution imaging. In ISDM, we implement a detector array composed of 19 avalanche photodiodes (APD) rather than single‐point detector in standard confocal microscopy for reconstructing superresolved images with higher signal‐to‐noise ratio (SNR). Combining with our former proposed fluorescence emission difference (FED) method, we have achieved a lateral resolution of 111 nm (∼λ/6) without the damage of image quality, the highest FED resolution to the best of our knowledge. With its simple setup and remarkable performance, we believe that ISDM can become a versatile observation tool in biology and other fundamental studies.
Integrated Dual-Color Stimulated Emission Depletion (STED) Microscopy and Fluorescence Emission Difference (FED) Microscopy

Wensheng Wang,Guangyuan Zhao,Cuifang Kuang,Liang Xu,Shaocong Liu,Shiyi Sun,Ping Shentu,Yang (Michael) Yang,Yingke Xu,Xu Liu

DOI: https://doi.org/10.1016/j.optcom.2018.04.017

IF: 2.4

2018-01-01

Optics Communications

Abstract:We report on the design and implementation of an integrated dual-color stimulated emission depletion (STED) microscopy and fluorescence emission difference (FED) microscopy. This highly integrated system combines the respective advantages of STED and FED microscopies, enabling acquisition of super-resolution STED images with specific fluorophores and high laser power, or resolution-enhanced FED imaging for ordinary fluorescent dyes and other materials with moderate demand for laser power. The functional integration enables researchers to select the more appropriate microscopy according to practical scenario and requirements, giving full play to their respective strengths and satisfying the imaging demands maximally. The system's resolution is characterized by dual-color imaging of fluorescent particles. Its practical applicability is verified through imaging various kinds of samples, including several fixed cells stained with different organic dyes and a given organic material-organometallic halide perovskite.
Bright-field Scanning Confocal Electron Microscopy Using a Double Aberration-Corrected Transmission Electron Microscope

Peng Wang,Gavin Behan,Angus I. Kirkland,Peter D. Nellist,Eireann C. Cosgriff,Adrian J. D'Alfonso,Andrew J. Morgan,Leslie J. Allen,Ayako Hashimoto,Masaki Takeguchi,Kazutaka Mitsuishi,Masayuki Shimojo

DOI: https://doi.org/10.1016/j.ultramic.2010.10.012

IF: 2.994

2011-01-01

Ultramicroscopy

Abstract:Scanning confocal electron microscopy (SCEM) offers a mechanism for three-dimensional imaging of materials, which makes use of the reduced depth of field in an aberration-corrected transmission electron microscope. The simplest configuration of SCEM is the bright-field mode. In this paper we present experimental data and simulations showing the form of bright-field SCEM images. We show that the depth dependence of the three-dimensional image can be explained in terms of two-dimensional images formed in the detector plane. For a crystalline sample, this so-called probe image is shown to be similar to a conventional diffraction pattern. Experimental results and simulations show how the diffracted probes in this image are elongated in thicker crystals and the use of this elongation to estimate sample thickness is explored. (C) 2010 Elsevier B.V. All rights reserved.
Chromatic Confocal Electron Microscopy with A Finite Pinhole Size

P. Wang,A. I. Kirkland,P. D. Nellist

DOI: https://doi.org/10.1088/1742-6596/371/1/012002

2012-01-01

Journal of Physics Conference Series

Abstract:Scanning confocal electron microscopy (SCEM) is a new imaging mode in electron microscopy. Spherical aberration corrected electron microscope instruments fitted with two aberration correctors can be used in this mode which provides improved depth resolution and selectivity compared to optical sectioning in a conventional scanning transmission geometry. In this article, we consider the depth resolution and energy resolution in the confocal optical configuration for SCEM using inelastically scattered electrons with a finite pinhole size. We experimentally demonstrate energy-filtered optical sectioning in a double aberration-corrected instrument with uncorrected chromatic aberration without using a dedicated energy filter.
Contrast in Atomically Resolved EF-SCEM Imaging

Peng Wang,Adrian J. D'Alfonso,Ayako Hashimoto,Andrew J. Morgan,Masaki Takeguchi,Kazutaka Mitsuishi,Masayuki Shimojo,Angus I. Kirkland,Leslie J. Allen,Peter D. Nellist

DOI: https://doi.org/10.1016/j.ultramic.2013.06.007

IF: 2.994

2013-01-01

Ultramicroscopy

Abstract:Energy-filtered scanning confocal electron microscopy (EF-SCEM) is a technique that uses the reduced depth of field of an aberration-corrected transmission electron microscope to provide three-dimensional (3D) compositional information. Using a silicon sample in the <110> orientation, we show that EF-SCEM image data can be recorded that shows lattice resolution in the plane perpendicular to the incident beam direction. The confocal effect is demonstrated through the reduction of the mean intensity as the confocal plane is displaced from the sample mid-plane, unlike optical sectioning in high-angle annular dark-field scanning transmission electron microscopy (STEM). Simulations of the EF-SCEM data show agreement with the experimental data, and allow the interpretability of the data to be explored. The effects of channelling, absorption and delocalisation complicate the quantitative and qualitative interpretation of the data, highlighting the need for matching to simulations. Finally the effects of the finite detector pin-hole aperture size are explored, and we show that the EF-SCEM contrast in the plane perpendicular to the beam direction starts to resemble that of a STEM spectrum imaging experiment as the aperture size increases.
Optimization for Imaging Through Scattering Media for Confocal Microscopes with Divided Elliptical Apertures.

Hengjie Tang,Chenxue Wu,Wei Gong,Yao Zheng,Xinpei Zhu,Jiahao Wang,Ke Si

DOI: https://doi.org/10.1002/jbio.201700293

IF: 3.3899

2018-01-01

Journal of Biophotonics

Abstract:We develop a confocal system equipped with optimal elliptical apertures to improve axial point spread function and signal-to-background ratio (SBR) for different detector sizes. By adjusting the parameters of the elliptical apertures, the axial half width at half-maximum can be reduced to 4.986 (described in optical coordinates) and SBR can be improved to 0.176. We evaluate this system with the 1951 USAF resolution test chart and the primary cultured neuron from SD rat stained by Map-2, and observe better imaging performance, which indicates the potential applications in biological science.
Scanning Electrochemical Microscopy in the 21st Century. Update 1: Five Years After.

Michael V. Mirkin,Wojciech Nogala,Jeyavel Velmurugan,Yixian Wang

DOI: https://doi.org/10.1039/c1cp22376c

2011-01-01

Abstract:This Perspective is an update to our more extensive survey of scanning electrochemical microscopy (SECM) published in 2007. During this time, the SECM field retained its momentum by expanding into new areas and meeting the emerging scientific and technological challenges. Here we focus on most prominent developments such as high-resolution imaging, investigation of structures and processes on the nanoscale, alternative energy applications, and new approaches to solving "real world" problems. The fabrication of novel SECM probes and related theoretical advances are also discussed.
Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope

Peng Wang,Angus I. Kirkland,Peter D. Nellist,Adrian J. D’Alfonso,Andrew J. Morgan,Leslie J. Allen,Ayako Hashimoto,Masaki Takeguchi,Kazutaka Mitsuishi,Masayuki Shimojo

DOI: https://doi.org/10.1017/s1431927612004515

IF: 4.0991

2012-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Electron Transfer/Ion Transfer Mode of Scanning Electrochemical Microscopy (secm): A New Tool for Imaging and Kinetic Studies

Yixian Wang,Kaan Kececi,Jeyavel Velmurugan,Michael V. Mirkin

DOI: https://doi.org/10.1039/c3sc50825k

IF: 8.4

2013-01-01

Chemical Science

Abstract:A new mode of the scanning electrochemical microscope (SECM) operation was developed that combines reagent delivery from the nanopipette with electron transfer at the conductive substrate and ion transfer across the liquid/liquid interface supported at the nanopipette tip. This approach offers potential advantages for measurements of heterogeneous electron transfer kinetics and reaction rate imaging by enabling straightforward separation of the contributions of surface topography and reactivity features to the tip current. It addresses some other long-standing technical issues, including sensitive probing of low signal sources (e. g., immobilized enzymes or catalyst particles) without diffusional broadening and the elimination of the elevated background signal in generation/collection-type experiments. The high spatial resolution attainable in electron transfer/ion transfer mode experiments and the absence of redox mediator species in the bulk solution are advantageous for studies of biological cells.
Establishment of Annular Dark-Field Scanning Confocal Electron Microscopy using a Double Aberration-Corrected Microscope

A Hashimoto,P Wang,M Shimojo,K Mitsuishi,AI Kirkland,PD Nellist,M Takeguchi

DOI: https://doi.org/10.1017/S1431927610058022

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Three-Dimensional Resolution Limits and Image Contrast Mechanisms in Scanning Confocal Electron Microscopy

PD Nellist,P Wang,G Behan,AI Kirkland,A Hashimoto,M Shimojo,K Mitsuishi,M Takeguchi,E Cosgriff,AJ D'Alfonso,LJ Allen,SD Findlay

DOI: https://doi.org/10.1017/s1431927610057533

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Energy-Filtered Scanning Confocal Electron Microscopy

P.D. Nellist,P. Wang

DOI: https://doi.org/10.1017/s143192761201166x

IF: 4.0991

2012-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Imaging and Elemental Mapping of Biological Specimens with the Hitachi HD-2300A Dual-EDS Scanning Transmission Electron Microscope

JS Wu,AM Kim,RG Marvin,BD Myers,TK Woodruff,TV O'Halloran,VP Dravid,K McIlwrath,SY Li

DOI: https://doi.org/10.1017/s1431927610057648

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Three-dimensional Observation of SiO2 Hollow Spheres with a Double-Shell Structure Using Aberration-Corrected Scanning Confocal Electron Microscopy

Xiaobin Zhang,Masaki Takeguchi,Ayako Hashimoto,Kazutaka Mitsuishi,Peng Wang,Peter D. Nellist,Angus I. Kirkland,Meguru Tezuka,Masayuki Shimojo

DOI: https://doi.org/10.1093/jmicro/dfs039

2012-01-01

Microscopy

Abstract:Optical sectioning using scanning confocal electron microscopy (SCEM) is a new three-dimensional (3D) imaging technique which promises improved depth resolution, particularly for laterally extended objects. Using a stage-scanning system to move the specimen in three dimensions, two-dimensional (2D) images sliced from any plane in XYZ space can be obtained in shorter acquisition times than those required for conventional electron tomography. In this paper, a double aberration-corrected SCEM used in annular dark-field mode was used to observe the 3D structure of SiO(2) hollow spheres fabricated by a carbon template method. The double-shell structure of the sample was clearly reflected in both XY- and XZ-sliced images. However, elongation along the optical axis was still evident in the XZ-sliced images even when double aberration correctors were used. Application of a deconvolution technique to the experimental XZ-sliced images reduced the elongated shell thicknesses of the SiO(2) sphere by 40-50% and the selectivity of information at a certain sample depth was also enhanced. Subsequently, 3D reconstruction by stacking the deconvoluted slice images restored the spherical surface of a SiO(2) sphere.
Image Contrast in Aberration-Corrected Scanning Confocal Electron Microscopy

E.C. Cosgriff,Peter D. Nellist,Adrian J. D’Alfonso,S.D. Findlay,G. Behan,Peng Wang,L. J. Allen,Angus I. Kirkland

DOI: https://doi.org/10.1016/s1076-5670(10)62002-2

2010-01-01

Advances in Imaging and Electron Physics

Abstract:The larger objective lens numerical aperture allowed by spherical aberration correction in electron optics leads to a reduced depth of focus, which typically becomes less than the thickness of the sample. Although this may complicate image interpretation, it leads to an opportunity to measure three‐dimensional information though the technique of optical sectioning. This chapter presents a theoretical analysis of transfer functions and image contrast for aberration‐corrected scanning confocal electron microscopy (SCEM). A comparison is made to optical sectioning using conventional scanning transmission electron microscopy (STEM). It is shown that for bright‐field SCEM there is little contrast, and a missing cone in the transfer function that is also seen for STEM. Energy‐filtered SCEM is seen to have strong transfer and no missing cone in the transfer function.
Super-resolution Optical Microscopy Based on Scannable Cantilever-Combined Microsphere

Shuying Wang,Dongxian Zhang,Haijun Zhang,Xu Han,Rui Xu

DOI: https://doi.org/10.1002/jemt.22595

2015-01-01

Microscopy Research and Technique

Abstract:We report an ingenious method of super-resolution optical microscopy utilizing scannable cantilever-combined microsphere. By scanning the microsphere over the sample surface in a cantilever-combined microsphere-sample contact state, super-resolution images can be acquired at arbitrary sample regions through near-field information collection by the microsphere. In addition, such a state can effectively reduce the possibility of breaking the cantilever and damaging the microsphere or sample surface. This work has developed a new method and technique of sub-diffraction-limit optical microscopy, and can be practically applied in various fields of micro/nanoscopy.
Scanning Nano Beam Electron Diffraction and Applications to Characterization of High Entropy Alloys

H. Xing,K. Kim,J.M. Zuo,M.A. Hemphill,G.Y. Wang,C.W. Tsai,J.W. Yeh,K.A. Dahmen,P.K. Liaw

DOI: https://doi.org/10.1017/s143192761300559x

IF: 4.0991

2013-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Scan-less confocal phase microscopy based on dual comb spectroscopy of two-dimensional-image-encoding optical frequency comb

Eiji Hase,Takeo Minamikawa,Shuji Miyamoto,Ryuji Ichikawa,Yi-Da Hsieh,Kyuki Shibuya,Yoshiaki Nakajima,Akifumi Asahara,Kaoru Minoshima,Yasuhiro Mizutani,Tetsuo Iwata,Hirotsugu Yamamoto,Takeshi Yasui

DOI: https://doi.org/10.1364/OPTICA.5.000634

2017-05-20

Abstract:Confocal imaging and phase imaging are powerful tools in life science research and industrial inspection. To coherently link the two techniques with different depth resolutions, we introduce an optical frequency comb (OFC) to microscopy. Two-dimensional (2D) image pixels of a sample were encoded onto OFC modes via 2D spectral encoding, in which OFC acted as an optical carrier with a vast number of discrete frequency channels. Then, a scan-less full-field confocal image with a depth resolution of 62.4 um was decoded from a mode-resolved OFC amplitude spectrum obtained by dual-comb spectroscopy. Furthermore, a phase image with a depth resolution of 13.7 nm was decoded from a mode-resolved OFC phase spectrum under the above confocality. The phase wrapping ambiguity can be removed by the match between the confocal depth resolution and the phase wrapping period. The proposed hybrid microscopy approach will be a powerful tool for a variety of applications.

Optics

Scanning Confocal Electron Microscopy (SCEM) Combined with Deconvolution Technique

Image Scanning Fluorescence Emission Difference Microscopy Based On A Detector Array

Modulated Pattern Scanning Microscopy

Image Scanning Difference Microscopy

Integrated Dual-Color Stimulated Emission Depletion (STED) Microscopy and Fluorescence Emission Difference (FED) Microscopy

Bright-field Scanning Confocal Electron Microscopy Using a Double Aberration-Corrected Transmission Electron Microscope

Chromatic Confocal Electron Microscopy with A Finite Pinhole Size

Contrast in Atomically Resolved EF-SCEM Imaging

Optimization for Imaging Through Scattering Media for Confocal Microscopes with Divided Elliptical Apertures.

Scanning Electrochemical Microscopy in the 21st Century. Update 1: Five Years After.

Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope

Electron Transfer/Ion Transfer Mode of Scanning Electrochemical Microscopy (secm): A New Tool for Imaging and Kinetic Studies

Establishment of Annular Dark-Field Scanning Confocal Electron Microscopy using a Double Aberration-Corrected Microscope

Three-Dimensional Resolution Limits and Image Contrast Mechanisms in Scanning Confocal Electron Microscopy

Energy-Filtered Scanning Confocal Electron Microscopy

Imaging and Elemental Mapping of Biological Specimens with the Hitachi HD-2300A Dual-EDS Scanning Transmission Electron Microscope

Three-dimensional Observation of SiO2 Hollow Spheres with a Double-Shell Structure Using Aberration-Corrected Scanning Confocal Electron Microscopy

Image Contrast in Aberration-Corrected Scanning Confocal Electron Microscopy

Super-resolution Optical Microscopy Based on Scannable Cantilever-Combined Microsphere

Scanning Nano Beam Electron Diffraction and Applications to Characterization of High Entropy Alloys

Scan-less confocal phase microscopy based on dual comb spectroscopy of two-dimensional-image-encoding optical frequency comb