Abstract:In aberration-corrected transmission electron microscopy, the image contrast depends sensitively on the focus value. With the point resolution extended to an information limit of below 0.1nm, even a focus change of as small as one nanometer could give a significant change in image contrast. Therefore, it is necessary to consider in detail the optimum focus condition in order to take full advantage of aberration-correction. In this study, the thickness dependence of the minimum contrast focus has been investigated by dynamical image simulations for amorphous model structures of carbon, germanium, and tungsten, which were constructed by molecular dynamics simulations. The calculation results show that the minimum contrast focus varies with the object thickness, supporting the use of an effective object plane close to the midplane instead of the exit plane of a sample, as suggested by Bonhomme and Beorchia [J. Phys. D: Appl. Phys. 16, 705 (1983)] and Lentzen [Microscopy and Microanalysis 12, 191 (2006)]. Thus supported particles and wedge-shaped crystals with symmetrical top and bottom surfaces could be imaged at a focus condition independent of the uneven bottom face. Image simulations of crystalline samples as a function of focus and thickness show: for an object thickness of less than 10nm, the optimum focus condition is matched better if the midplane of the object, instead of the exit plane, is chosen as reference plane.

Image Contrast in Aberration-Corrected Scanning Confocal Electron Microscopy

Aberrations in Structured Illumination Microscopy: A Theoretical Analysis

Contrast in Atomically Resolved EF-SCEM Imaging

Chromatic Confocal Electron Microscopy with A Finite Pinhole Size

Fluorescence emission difference with defocused surface plasmon-coupled emission microscopy.

Bright-field Scanning Confocal Electron Microscopy Using a Double Aberration-Corrected Transmission Electron Microscope

Optical Sectioning and Confocal Imaging and Analysis in the Transmission Electron Microscope

Contrast Reversal Confocal Microscopy

Three-dimensional imaging by optical sectioning in the aberration-corrected scanning transmission electron microscope

Optimization for Imaging Through Scattering Media for Confocal Microscopes with Divided Elliptical Apertures.

Design of Electrostatic Aberration Correctors for Scanning Transmission Electron Microscopy

Multidimensional Images and Aberrations in STEM

Aberration corrected STEM by means of diffraction gratings

Aberration corrected STEM and EELS: Atomic scale chemical mapping

Imaging, Core-Loss, and Low-Loss Electron-Energy-Loss Spectroscopy Mapping in Aberration-Corrected STEM

An electron microscope for the aberration-corrected era

Effective Object Planes for Aberration-Corrected Transmission Electron Microscopy

Three-Dimensional Resolution Limits and Image Contrast Mechanisms in Scanning Confocal Electron Microscopy

Space rocks and optimising scanning electron channelling contrast

Three-dimensional Observation of SiO2 Hollow Spheres with a Double-Shell Structure Using Aberration-Corrected Scanning Confocal Electron Microscopy

Optimizing Contrast in Automated 4D STEM Cryotomography