The Challenge of Imaging Hard/soft Matter Interfaces at Atomic Resolution

B. Barton,R. Buonsanti,A. Dong,D. Milliron,C.F. Kisielowski,L.P. Hansen,S. Helveg,B. Jiang

DOI: https://doi.org/10.1017/s1431927612009889

IF: 4.0991

2012-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

What problem does this paper attempt to address?

Physics of Hard Sphere Experiment: Scattering, Rheology and Microscopy Study of Colloidal Particles

Zhengdong Cheng,Jixiang Zhu,See-Eng Phan,William B. Russel,Paul Chaikin,William V. Meyer

2002-01-01

Abstract:The Physics of Hard Sphere Experiment has two incarnations: the first as a scattering and rheology experiment on STS-83 and STS-94 and the second as a microscopy experiment to be performed in the future on LMM on the space station. Here we describe some of the quantitative and qualitative results from previous flights on the dynamics of crystallization in microgravity and especially the observed interaction of growing crystallites in the coexistance regime. To clarify rheological measurements we also present ground based experiments on the low shear rate viscosity and diffusion coefficient of several hard sphere experiments at high volume fraction. We also show how these experiments will be performed with confocal microscopy and laser tweezers in our lab and as preparation for the phAse II experiments on LMM. One of the main aims of the microscopy study will be the control of colloidal samples using an array of applied fields with an eye toward colloidal architectures. Temperature gradients, electric field gradients, laser tweezers and a variety of switchable imposed surface patterns are used toward this control.
High-Spatial and High-Energy Resolution EELS Studies of Chemical and Electronic Properties of Interfaces and Nanostructures

K Dudeck,M Couillard,N Gauquelin,L Gunawan,S Hosseini Vajargah,S Lazar,D Rossouw,Y Shao,G Zhu,G Botton

DOI: https://doi.org/10.1017/s1431927611004843

IF: 4.0991

2011-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
From Hardness Testing Relying on Optical Imaging to Quantitative In-Situ Nanoindentation in a Transmission Electron Microscope

OL Warren,SA S Asif,AM Minor,Z Shan,EA Stach

DOI: https://doi.org/10.1017/s1431927606062726

IF: 4.0991

2006-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006
Three-Dimensional Resolution Limits and Image Contrast Mechanisms in Scanning Confocal Electron Microscopy

PD Nellist,P Wang,G Behan,AI Kirkland,A Hashimoto,M Shimojo,K Mitsuishi,M Takeguchi,E Cosgriff,AJ D'Alfonso,LJ Allen,SD Findlay

DOI: https://doi.org/10.1017/s1431927610057533

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Imaging and Elemental Mapping of Biological Specimens with the Hitachi HD-2300A Dual-EDS Scanning Transmission Electron Microscope

JS Wu,AM Kim,RG Marvin,BD Myers,TK Woodruff,TV O'Halloran,VP Dravid,K McIlwrath,SY Li

DOI: https://doi.org/10.1017/s1431927610057648

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Oxide Interfaces Under the Electron Microscope

M Varela,HM Christen,HN Lee,L Petit,T Schulthess,SJ Pennycook,W Luo,ST Pantelides,J Garcia-Barriocanal,C Leon,J Santamaria

DOI: https://doi.org/10.1017/S1431927608086194

IF: 4.0991

2008-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008
High-Resolution Scanning X-ray Diffraction Microscopy

Pierre Thibault,Martin Dierolf,Andreas Menzel,Oliver Bunk,Christian David,Franz Pfeiffer

DOI: https://doi.org/10.1126/science.1158573

IF: 56.9

2008-07-18

Science

Abstract:Coherent diffractive imaging (CDI) and scanning transmission x-ray microscopy (STXM) are two popular microscopy techniques that have evolved quite independently. CDI promises to reach resolutions below 10 nanometers, but the reconstruction procedures put stringent requirements on data quality and sample preparation. In contrast, STXM features straightforward data analysis, but its resolution is limited by the spot size on the specimen. We demonstrate a ptychographic imaging method that bridges the gap between CDI and STXM by measuring complete diffraction patterns at each point of a STXM scan. The high penetration power of x-rays in combination with the high spatial resolution will allow investigation of a wide range of complex mesoscopic life and material science specimens, such as embedded semiconductor devices or cellular networks.

multidisciplinary sciences
Determination of Atomic Structures of Crystal Defects, Interfaces and Surfaces Via Aberration-Corrected Transmission Electron Microscopy

J Zhu,R Yu,ZY Cheng,T Ling,N Lu,L Xie,ZD Cheng,HH Zhou,XY Zhong

DOI: https://doi.org/10.1017/s1431927610059131

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Direct Mapping of Confined Interfacial States in Oxides Using Aberration Corrected STEM and EELS

AB Shah,JM Zuo,QM Ramasse,JG Wen,X Zhai,A. Bhattacharya,JN Eckstein

DOI: https://doi.org/10.1017/s143192761005631x

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Towards Sub-Angström Ptychographic Diffractive Imaging

P. Wang,D.J. Batey,J.M. Rodenburg,H. Sawada,A.I. Kirkland

DOI: https://doi.org/10.1017/s1431927613005527

IF: 4.0991

2013-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Sub-wavelength surface IR imaging of soft-condensed matter

James H. Rice,Graeme A. Hill,Stephen R. Meech,Paulina Kuo,Konstantin Vodopyanov,Michael Reading

DOI: https://doi.org/10.1051/epjap/2010093

2010-10-28

Abstract:Outlined here is a technique for sub-wavelength infrared surface imaging performed using a phase matched optical parametric oscillator laser and an atomic force microscope as the detection mechanism. The technique uses a novel surface excitation illumination approach to perform simultaneously chemical mapping and AFM topography imaging with an image resolution of 200 nm. This method was demonstrated by imaging polystyrene micro-structures.

Biological Physics,Soft Condensed Matter,Instrumentation and Detectors
High-resolution ab initio three-dimensional X-ray diffraction microscopy

H. N. Chapman,A. Barty,S. Marchesini,A. Noy,C. Cui,M. R. Howells,R. Rosen,H. He,J. C. H. Spence,U. Weierstall,T. Beetz,C. Jacobsen,D. Shapiro

DOI: https://doi.org/10.1364/JOSAA.23.001179

2005-09-09

Abstract:Coherent X-ray diffraction microscopy is a method of imaging non-periodic isolated objects at resolutions only limited, in principle, by the largest scattering angles recorded. We demonstrate X-ray diffraction imaging with high resolution in all three dimensions, as determined by a quantitative analysis of the reconstructed volume images. These images are retrieved from the 3D diffraction data using no a priori knowledge about the shape or composition of the object, which has never before been demonstrated on a non-periodic object. We also construct 2D images of thick objects with infinite depth of focus (without loss of transverse spatial resolution). These methods can be used to image biological and materials science samples at high resolution using X-ray undulator radiation, and establishes the techniques to be used in atomic-resolution ultrafast imaging at X-ray free-electron laser sources.

Optics
Exploring the Mechanical Properties of Nanostructures and Nanomaterials inside a TEM

Zhi-Wei Shan,Andrew M. Minor,SA S Asif,Oden L. Warren

DOI: https://doi.org/10.1017/s1431927608085474

IF: 4.0991

2008-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008
Three-dimensional Hard X-ray Ptychographic Reflectometry Imaging on Extended Mesoscopic Surface Structures

Peco Myint,Ashish Tripathi,Michael J. Wojcik,Junjing Deng,Mathew J. Cherukara,Nicholas Schwarz,Suresh Narayanan,Jin Wang,Miaoqi Chu,Zhang Jiang

2024-02-10

Abstract:Many nano and quantum devices, with their sizes often spanning from millimeters down to sub-nanometer, have intricate low-dimensional, non-uniform, or hierarchical structures on surfaces and interfaces. Since their functionalities are dependent on these structures, high-resolution surface-sensitive characterization becomes imperative to gain a comprehensive understanding of the function-structure relationship. We thus developed hard X-ray ptychographic reflectometry imaging, a new technique that merges the high-resolution two-dimensional imaging capabilities of hard X-ray ptychography for extended objects, with the high-resolution depth profiling capabilities of X-ray reflectivity for layered structures. The synergy of these two methods fully leverages both amplitude and phase information from ptychography reconstruction to not only reveal surface topography and localized structures such as shapes and electron densities, but also yields statistical details such as interfacial roughness that is not readily accessible through coherent imaging solely. The hard X-ray ptychographic reflectometry imaging is well-suited for three-dimensional imaging of mesoscopic samples, particularly those comprising planar or layered nanostructures on opaque supports, and could also offer a high-resolution surface metrology and defect analysis on semiconductor devices such as integrated nanocircuits and lithographic photomasks for microchip fabrications.

Optics
Hard x-ray grazing-incidence ptychography: large field-of-view nanostructure imaging with ultra-high surface sensitivity

P. S. Jørgensen,L. Besley,A. M. Slyamov,A. Diaz,M. Guizar-Sicairos,M. Odstrčil,M. Holler,C. Silvestre,B. Chang,C. Detlefs,J. W. Andreasen

DOI: https://doi.org/10.1364/optica.505478

IF: 10.4

2024-02-03

Optica

Abstract:P. S. Jørgensen, L. Besley, A. M. Slyamov, A. Diaz, M. Guizar-Sicairos, M. Odstrčil, M. Holler, C. Silvestre, B. Chang, C. Detlefs, J. W. Andreasen The morphology and distribution of nanoscale structures, such as catalytic active nanoparticles and quantum dots on surfaces, have a ... [Optica 11, 197-204 (2024)]

optics
Multimodal hard x-ray imaging with resolution approaching 10 nm for studies in material science

Hanfei Yan,Nathalie Bouet,Juan Zhou,Xiaojing Huang,Evgeny Nazaretski,Weihe Xu,Alex P Cocco,Wilson K S Chiu,Kyle S Brinkman,Yong S Chu

DOI: https://doi.org/10.1088/2399-1984/aab25d

2018-03-01

Nano Futures

Abstract:Abstract We report multimodal scanning hard x-ray imaging with spatial resolution approaching 10 nm and its application to contemporary studies in the field of material science. The high spatial resolution is achieved by focusing hard x-rays with two crossed multilayer Laue lenses and raster-scanning a sample with respect to the nanofocusing optics. Various techniques are used to characterize and verify the achieved focus size and imaging resolution. The multimodal imaging is realized by utilizing simultaneously absorption-, phase-, and fluorescence-contrast mechanisms. The combination of high spatial resolution and multimodal imaging enables a comprehensive study of a sample on a very fine length scale. In this work, the unique multimodal imaging capability was used to investigate a mixed ionic-electronic conducting ceramic-based membrane material employed in solid oxide fuel cells and membrane separations (compound of Ce 0.8 Gd 0.2 O 2− x and CoFe 2 O 4 ) which revealed the existence of an emergent material phase and quantified the chemical complexity at the nanoscale.

materials science, multidisciplinary,physics, applied,nanoscience & nanotechnology
Direct imaging and Talbot Phase Imaging at the Matter in Extreme Conditions X-ray Imager of LCLS

Eric Galtier,Dimitri Khaghani,Nina Boiadjieva,Dileep Bhogadi,Gilliss Dyer,Phil Heimann,Arianna E. Gleason,Silvia Pandolfi,Mikako Makita,Frank Seiboth,Hae Ja Lee,Bob Nagler

2024-06-13

Abstract:The last decade has shown the great potential that X-ray Free Electron Lasers have to study High Energy Density matter. Experiments at FELs have made significant breakthroughs in Shock Physics and Dynamic Diffraction, Dense Plasma Physics and Warm Dense Matter Science, using techniques such as isochoric heating, inelastic scattering, small angle scattering and diffraction. In addition, and complementary to these techniques, the coherent properties of the beam can be used to image HED samples with high precision. We present new imaging diagnostics and techniques developed at the MEC instrument at LCLS over the last few years. We briefly show result of a previously used Phase Contrast Imaging setup, where the X-ray beam propagates from the target to a camera some distance away revealing its phase, as well as from a new direct imaging approach where the target is re-imaged on the camera with 300nm resolution. Last, we show a new Talbot Phase Imaging method that allows for both measuring the phase and intensity changes of the x-rays introduced by a target with sub-micron resolution.

Instrumentation and Detectors
Atomic Resolution Imaging of Light Elements in a Crystalline Environment using Dynamic Hollow-Cone Illumination Transmission Electron Microscopy

Hamish G. Brown,Jim Ciston

DOI: https://doi.org/10.1017/S1431927620001658

IF: 4.0991

2020-08-05

Microscopy and Microanalysis

Abstract:Multiple electron scattering and the nonintuitive nature of image formation with coherent radiation complicate the interpretation of conventional transmission electron microscopy images. Precession of the illuminating beam in transmission electron microscopy (TEM) can lead to more robust and interpretable images with some penalty to image contrast, a technique known as dynamic hollow-cone illumination TEM. We demonstrate direct and robust imaging of light and heavy atoms in a crystalline environment with this technique. This method is similar to the annular bright-field technique in scanning transmission electron microscopy, via the principle of reciprocity. Dynamic hollow-cone illumination TEM is challenging in practice due to sensitivity to the misalignment of the precession axis, microscope objective aperture, and crystal zone axis.

materials science, multidisciplinary,microscopy
True Atomic-Resolution Surface Imaging and Manipulation under Ambient Conditions via Conductive Atomic Force Microscopy

Saima A. Sumaiya,Jun Liu,Mehmet Z. Baykara

DOI: https://doi.org/10.1021/acsnano.2c08321

IF: 17.1

2022-10-27

ACS Nano

Abstract:A great number of chemical and mechanical phenomena, ranging from catalysis to friction, are dictated by the atomic-scale structure and properties of material surfaces. Yet, the principal tools utilized to characterize surfaces at the atomic level rely on strict environmental conditions such as ultrahigh vacuum and low temperature. Results obtained under such well-controlled, pristine conditions bear little relevance to the great majority of processes and applications that often occur under...

materials science, multidisciplinary,chemistry, physical,nanoscience & nanotechnology
Magnifying the Wave Function of Interacting Fermionic Atoms

Sandra Brandstetter,Carl Heintze,Keerthan Subramanian,Paul Hill,Philipp M. Preiss,Maciej Gałka,Selim Jochim

2024-09-28

Abstract:Understanding many body systems is a key challenge in physics. Single atom resolved imaging techniques have unlocked access to microscopic correlations in ultracold quantum gases. However they cannot be used when the relevant length scales are obscured by the resolution of the detection technique. We present a matterwave magnification scheme, based on evolutions in optical potentials, tailored to magnify the wave function of atoms, such that all length scales can be resolved. To showcase this method, we image atoms in the strongly interacting regime, establishing a new way to characterize correlated systems.

Quantum Gases,Quantum Physics

The Challenge of Imaging Hard/soft Matter Interfaces at Atomic Resolution

Physics of Hard Sphere Experiment: Scattering, Rheology and Microscopy Study of Colloidal Particles

High-Spatial and High-Energy Resolution EELS Studies of Chemical and Electronic Properties of Interfaces and Nanostructures

From Hardness Testing Relying on Optical Imaging to Quantitative In-Situ Nanoindentation in a Transmission Electron Microscope

Three-Dimensional Resolution Limits and Image Contrast Mechanisms in Scanning Confocal Electron Microscopy

Imaging and Elemental Mapping of Biological Specimens with the Hitachi HD-2300A Dual-EDS Scanning Transmission Electron Microscope

Oxide Interfaces Under the Electron Microscope

High-Resolution Scanning X-ray Diffraction Microscopy

Determination of Atomic Structures of Crystal Defects, Interfaces and Surfaces Via Aberration-Corrected Transmission Electron Microscopy

Direct Mapping of Confined Interfacial States in Oxides Using Aberration Corrected STEM and EELS

Towards Sub-Angström Ptychographic Diffractive Imaging

Sub-wavelength surface IR imaging of soft-condensed matter

High-resolution ab initio three-dimensional X-ray diffraction microscopy

Exploring the Mechanical Properties of Nanostructures and Nanomaterials inside a TEM

Three-dimensional Hard X-ray Ptychographic Reflectometry Imaging on Extended Mesoscopic Surface Structures

Hard x-ray grazing-incidence ptychography: large field-of-view nanostructure imaging with ultra-high surface sensitivity

Multimodal hard x-ray imaging with resolution approaching 10 nm for studies in material science

Direct imaging and Talbot Phase Imaging at the Matter in Extreme Conditions X-ray Imager of LCLS

Atomic Resolution Imaging of Light Elements in a Crystalline Environment using Dynamic Hollow-Cone Illumination Transmission Electron Microscopy

True Atomic-Resolution Surface Imaging and Manipulation under Ambient Conditions via Conductive Atomic Force Microscopy

Magnifying the Wave Function of Interacting Fermionic Atoms