Sub-wavelength surface IR imaging of soft-condensed matter

James H. Rice,Graeme A. Hill,Stephen R. Meech,Paulina Kuo,Konstantin Vodopyanov,Michael Reading
DOI: https://doi.org/10.1051/epjap/2010093
2010-10-28
Abstract:Outlined here is a technique for sub-wavelength infrared surface imaging performed using a phase matched optical parametric oscillator laser and an atomic force microscope as the detection mechanism. The technique uses a novel surface excitation illumination approach to perform simultaneously chemical mapping and AFM topography imaging with an image resolution of 200 nm. This method was demonstrated by imaging polystyrene micro-structures.
Biological Physics,Soft Condensed Matter,Instrumentation and Detectors
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