Abstract:Surfaces of metal oxides are of crucial importance for a variety of technological applications such as heterogeneous catalysis, thin film growth, gas sensing, and corrosion prevention [1]. Due to the complexities of oxides in crystal structure and electronic structure, however, the surface science of oxides lags far behind that of metals or semiconductors. Conventional surface-science techniques, typically scanning tunneling microscopy (STM) and low energy electron diffraction (LEED), are usually limited to surfaces of single crystals with relatively simple structures. Metal oxides are usually good insulators, either band insulators or Mott insulators, making them not suitable for STM, LEED, and most of spectroscopic methods using low energy electrons as probes. On the other hand, the complex atomic structures of oxides results in too many structural parameters to be determined by spectroscopy or diffraction methods. Recent developments in high-resolution transmission electron microscopy (TEM) provide us opportunities to overcome the above difficulties. With the realization of aberration-correction, the point resolution of TEM has been improved into the milestone 1 Angstrom scale. In addition, the correction of the spherical aberration has almost eliminated the contrast delocalization in high-resolution images. Therefore, high resolution TEM becomes an even more powerful tool than before for materials research at a truly atomic-scale. Here, we will present our recent works on atomic and electronic structure of oxide surfaces [2-3]. We will show that the structure and dynamics of oxide surfaces can be directly imaged and measured at the sub-angstrom scale with an accuracy of picometers, comparable to that obtained by conventional surface science techniques on single crystals.

Pulsed-Laser Atom-Probe and Field-Ion Microscope Study of Solid-Surfaces

Atom-probe Field Ion Microscope Analysis of Surfaces of Materials

Surface Profile Measurement of Micro-Optics by Using a Long Stroke Atomic Force Microscope

Single-shot imaging of surface molecular ionization in nanosystems

Laser microstructuring of Si surfaces for low-threshold field-electron emission

Atomic Force Microscope in Liquid with A Specially Designed Probe for Practical Application

Ion microscopy based on laser-cooled cesium atoms

High-Precision Multiphoton Ionization of Accelerated Laser-Ablated Species

Strong field ionization of molecules on the surface of nanosystems

A Three-Dimensional Atom Probe Microscope Incorporating a Wavelength-Tuneable Femtosecond-Pulsed Coherent Extreme Ultraviolet Light Source

Direct Atomic Imaging of Oxide Surfaces

Real-space observation of surface structuring induced by ultra-fast-laser illumination far below the melting threshold

Direct observation of atomic steps and atomic structures in the reconstruction of Pt and Ir surfaces

Coincidence Imaging Of Photoelectrons And Photo-Ions Of Molecules In Strong Laser Fields

Atomic-scale imaging of laser-driven electron dynamics in solids

High Irradiance Laser Ionization Mass Spectrometry

Atom probe tomography: a local probe for chemical bonds in solids

Femtosecond Laser Ionization and Fragmentation of Molecules for Environmental Sensing

(Sub-)picosecond surface correlations of femtosecond laser excited Al-coated multilayers observed by grazing-incidence x-ray scattering

New insights into the laser-assisted photoelectric effect from solid-state surfaces

Probing Liquid Surfaces under Vacuum Using SEM and ToF-SIMS.