Photothermal AFM-IR Depth Sensitivity: An Original Pathway to Tomographic Reconstruction

Alexandre Dazzi,Jeremie Mathurin,Philippe Leclere,Pierre Nickmilder,Peter De Wolf,Martin Wagner,Qichi Hu,Ariane Deniset-Besseau
DOI: https://doi.org/10.1021/acs.analchem.4c01969
IF: 7.4
2024-11-02
Analytical Chemistry
Abstract:Photothermal atomic force microscopy-infrared (AFM-IR) enables label-free chemical imaging and spectroscopy with nanometer-scale spatial resolution through the integration of atomic force microscopy (AFM) and infrared radiation. The capability for subsurface and three-dimensional (3D) tomographic material analysis remains, however, largely unexplored. Here, we establish a simple and robust empirical relationship between the probing depth and laser repetition rate for three important modes of...
chemistry, analytical
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