Understanding the resolution and sensitivity in photothermal nanoscale chemical imaging - a point spread function approach

Georg Ramer,Yide Zhang,Bernhard Lendl,Ufuk Yilmaz,Liam O’Faolain,Gustavo Vinicius Bassi Lukasievicz

DOI: https://doi.org/10.26434/chemrxiv-2024-qlgdz-v3

2024-01-24

Abstract:Atomic force microscopy-infrared spectroscopy (AFM-IR) is a photothermal scanning probe technique that combines nanoscale spatial resolution with the chemical analysis capability of mid-infrared spectroscopy. Using this hybrid technique, chemical identification down to the single molecule level has been demonstrated. However, the mechanism at the heart of AFM-IR, the transduction of local photothermal heating to cantilever deflection, is still not fully understood. Existing physical models only describe this process in few special cases but not in many of the types of sample geometries encountered in the practical use of AFM-IR. In this work an analytical expression for modeling the temperature and photothermal expansion process is introduced, verified with finite element simulations and validated with AFM-IR experiments. This method describes AFM-IR signal amplitudes in vertically and laterally heterogeneous samples and allows us study the effect of position and size of an absorber, laser repetition rate and pulse width on AFM-IR signal amplitudes and spatial resolution. The analytical can be used to identify optimal AFM-IR experimental settings in conventional and advanced AFM-IR modes (e.g., tapping mode, surface sensitive mode). It also paves the way for signal inversion based super-resolution AFM-IR.

Chemistry

What problem does this paper attempt to address?

### Problems Addressed by the Paper

This paper primarily addresses the issues of signal characteristics and spatial resolution in Atomic Force Microscopy Infrared Spectroscopy (AFM-IR) for complex samples. Specifically:

1. **Understanding the Working Mechanism of AFM-IR**:
- Existing physical models can only describe how local photothermal effects convert to cantilever deflection in a few special cases and cannot fully explain the various sample geometries encountered in practical applications. This paper proposes an analytical model to describe the temperature changes and photothermal expansion process, validated through finite element simulations.

2. **Optimizing Experimental Setup**:
- The model can be used to identify the optimal experimental settings (such as contact mode, surface-sensitive mode, etc.) under traditional and advanced AFM-IR modes, thereby improving experimental efficiency and accuracy.

3. **Super-Resolution Imaging**:
- The super-resolution AFM-IR imaging method based on signal inversion is also discussed, providing new ideas for future research.

4. **Analysis of Influencing Factors**:
- The model also studies the effects of factors such as the position and size of the absorber, pump laser repetition rate, and pulse width on the AFM-IR signal amplitude and spatial resolution.

Through this work, researchers can better understand and optimize the application of AFM-IR technology, especially in the field of chemical imaging.