TEM Based High Resolution Electron Diffraction Techniques for Three-dimensional Nanostructure Determination
Jian-Min Zuo,Yifei Meng,Piyush Vivek Deshpande,Yang Hu,Kyou-Hyun Kim,Hui Xing,Peng Zhang,Haifeng Wang
DOI: https://doi.org/10.1017/s1431927615006261
IF: 4.0991
2015-01-01
Microscopy and Microanalysis
Abstract:Journal Article TEM Based High Resolution Electron Diffraction Techniques for Three-dimensional Nanostructure Determination Get access Jian-Min Zuo, Jian-Min Zuo Dept of Materials Science and Engineering, University of Illinois, Urbana-Champaign, IL 61801Frederick Seitz Materials Research Laboratory, University of Illinois, Urbana-Champaign, IL 618013 Search for other works by this author on: Oxford Academic Google Scholar Yifei Meng, Yifei Meng Dept of Materials Science and Engineering, University of Illinois, Urbana-Champaign, IL 61801Frederick Seitz Materials Research Laboratory, University of Illinois, Urbana-Champaign, IL 618013 Search for other works by this author on: Oxford Academic Google Scholar Piyush Vivek Deshpande, Piyush Vivek Deshpande Dept of Materials Science and Engineering, University of Illinois, Urbana-Champaign, IL 61801Frederick Seitz Materials Research Laboratory, University of Illinois, Urbana-Champaign, IL 618013 Search for other works by this author on: Oxford Academic Google Scholar Yang Hu, Yang Hu Dept of Materials Science and Engineering, University of Illinois, Urbana-Champaign, IL 61801Frederick Seitz Materials Research Laboratory, University of Illinois, Urbana-Champaign, IL 618013 Search for other works by this author on: Oxford Academic Google Scholar Kyou-Hyun Kim, Kyou-Hyun Kim Dept of Materials Science and Engineering, University of Illinois, Urbana-Champaign, IL 61801Frederick Seitz Materials Research Laboratory, University of Illinois, Urbana-Champaign, IL 618013 Search for other works by this author on: Oxford Academic Google Scholar Hui Xing, Hui Xing Dept of Materials Science and Engineering, University of Illinois, Urbana-Champaign, IL 61801Frederick Seitz Materials Research Laboratory, University of Illinois, Urbana-Champaign, IL 618013School of Materials Science and Engineering, Shanghai Jiaotong University, China Search for other works by this author on: Oxford Academic Google Scholar Peng Zhang, Peng Zhang Western Digital Technologies, Inc., 44200 Osgood Road, Fremont CA, 94539 Search for other works by this author on: Oxford Academic Google Scholar Haifeng Wang Haifeng Wang Western Digital Technologies, Inc., 44200 Osgood Road, Fremont CA, 94539 Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 21, Issue S3, 1 August 2015, Pages 1095–1096, https://doi.org/10.1017/S1431927615006261 Published: 23 September 2015