Interface Structure-Property Relations Through Aberration-Corrected STEM

SJ Pennycook,AY Borisevich,M Varela,AR Lupini,HJ Chang,DN Leonard,TJ Pennycook,MP Oxley,JC Idrobo,H Yurdakul,S Turan,P Yu,R Ramesh,ST Pantelides

DOI: https://doi.org/10.1017/s1431927610059787

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

What problem does this paper attempt to address?

Aberrations in Structured Illumination Microscopy: A Theoretical Analysis

Xin Liu,Shijie Tu,Yan Xu,Hongya Song,Wenjie Liu,Qiulan Liu,Cuifang Kuang,Xu Liu,Xiang Hao

DOI: https://doi.org/10.3389/fphy.2019.00254

IF: 3.718

2020-01-01

Frontiers in Physics

Abstract:In super-resolution optical microscopes, aberrations often compromise the image performances by reducing its resolution and contrast. In previous works, the aberrations in stimulated emission depletion (STED) microscopy and single-molecule localization microscopy (SMLM) have been well-investigated, while the research on the aberrations in structured illumination microscopy (SIM) is not sufficient, the researchers always poured attention into aberrations only in the detection path. In this paper, we investigate the aberrations in SIM in a comprehensive manner, and their causes and effects on both the illumination and the detection paths are discussed. The aberrations in the illumination path may distort illumination patterns, and deteriorate the final images, together with the aberrations in the detection path. In addition, several non-aberration-related factors, especially the misalignment of the incident beams with respect to the objective pupil, can also dramatically influence the performances of SIM. The analysis provides the theoretical basis and for optimizing a SIM system.
Untangling Coupled Order Parameters at Complex Oxide Interfaces with Aberration-Corrected STEM and EELS

A.Y. Borisevich,Y. Kim,M.P. Oxley,S.J. Pennycook,S.V. Kalinin,A. Morozovska,E. Eliseev,Y. Chu,P. Yu

DOI: https://doi.org/10.1017/s1431927612003443

IF: 4.0991

2012-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Multidimensional Images and Aberrations in STEM

Eric R. Hoglund,Andrew R. Lupini

DOI: https://doi.org/10.1088/1674-1056/ad73b2

2024-08-30

Chinese Physics B

Abstract:Recent advances in scanning transmission electron microscopy (STEM) have led to increased development of multi-dimensional STEM imaging modalities and novel image reconstruction methods. This interest arises because the main electron lens in a modern transmission electron microscope usually has a diffraction-space information limit that is significantly better than the real-space resolution of the same lens. This state-of-affairs is sometimes shared by other scattering methods in modern physics and contributes to a broader excitement surrounding multidimensional techniques that scan a probe while recording diffraction-space images, such as ptychography and scanning nano-beam diffraction. However, the contrasting resolution in the two spaces raises the question as to what is limiting their effective performance. Here, we examine this paradox by considering the effects of aberrations in both image and diffraction planes, and likewise separate the contributions of pre- and post-sample aberrations. This consideration provides insight into aberration-measurement techniques and might also indicate improvements for super-resolution techniques.

physics, multidisciplinary
Atomic Cluster Structure Identification Using Aberration-corrected Scanning Transmission Electron Microscopy

D. He,A. Logsdail,R. Johnston,R. Palmer,F. Yin,Z. Li,R. Aveyard,J. Yuan

DOI: https://doi.org/10.1017/s1431927612004527

IF: 4.0991

2012-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Materials Structure, Properties and Dynamics through Scanning Transmission Electron Microscopy

Stephen J. Pennycook,Changjian Li,Mengsha Li,Chunhua Tang,Eiji Okunishi,Maria Varela,Young-Min Kim,Jae Hyuck Jang

DOI: https://doi.org/10.1186/s40543-018-0142-4

2019-08-20

Abstract:Scanning transmission electron microscopy (STEM) has advanced rapidly in the last decade thanks to the ability to correct the major aberrations of the probe forming lens. Now atomic-sized beams are routine, even at accelerating voltages as low as 40 kV, allowing knock-on damage to be minimized in beam sensitive materials. The aberration-corrected probes can contain sufficient current for high quality, simultaneous, imaging and analysis in multiple modes. Atomic positions can be mapped with picometer precision, revealing ferroelectric domain structures, composition can be mapped by energy dispersive X-ray spectroscopy (EDX) and electron energy loss spectroscopy (EELS) and charge transfer can be tracked unit cell by unit cell using the EELS fine structure. Furthermore, dynamics of point defects can be investigated through rapid acquisition of multiple image scans. Today STEM has become an indispensable tool for analytical science at the atomic level, providing a whole new level of insights into the complex interplays that control materials properties.

Materials Science
Determination of Atomic Structures of Crystal Defects, Interfaces and Surfaces Via Aberration-Corrected Transmission Electron Microscopy

J Zhu,R Yu,ZY Cheng,T Ling,N Lu,L Xie,ZD Cheng,HH Zhou,XY Zhong

DOI: https://doi.org/10.1017/s1431927610059131

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Applications of Aberration-corrected TEM and STEM in Complex Oxides and Nanostructured Materials

S Lazar,L-Y Chang,L Gunawan,Y Shao,GA Botton

DOI: https://doi.org/10.1017/S1431927609098663

IF: 4.0991

2009-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Progress and Prospects of Aberration-Corrected STEM for Functional Materials.

Haijun Wu,Xiaoxu Zhao,Dongsheng Song,Feng Tian,John Wang,Kian Ping Loh,Stephen J Pennycook

DOI: https://doi.org/10.1016/j.ultramic.2018.08.007

IF: 2.994

2018-01-01

Ultramicroscopy

Abstract:Aberration-corrected scanning transmission electron microscopy (STEM) provides real space imaging and spectroscopy at atomic resolution with a new level of sensitivity to structure, bonding, elemental valence and even dynamics. It has developed into the most powerful characterization and even fabrication platform for all materials, especially for functional materials with complex structural features that dynamically respond to external fields. Several representative examples of functional materials are shown, including piezoelectric and photoelectric materials, functional oxide interfaces, metal-organic framework (MOF)-derived transition metal oxide/phosphide catalysts and two-dimensional (2D) materials. In piezoelectric systems, atomic-resolution polarization mapping by Z-contrast imaging shows the intimate coexistence of two ferroelectric phases inside nanodomains. Quantitative STEM imaging and EELS spectroscopy reveal the underlying mechanism of the exotic coupling between polarization and charge at a functional oxide interface. Under the low-voltage STEM, defects in 2D materials are clearly visible, for example novel edges and single atom dopants. The dynamic behavior of single atoms in vacancies of monolayer MoS2 is shown to highlight the electron-beam induced nanofabrication ability of aberration-corrected STEM. Thanks to the rapid development of segmented/pixelated detectors, differential phase contrast and 4D STEM techniques are promising for the near future, providing more opportunities to understand the link between structure and functionality.
Material structure, properties, and dynamics through scanning transmission electron microscopy

Stephen J. Pennycook,Changjian Li,Mengsha Li,Chunhua Tang,Eiji Okunishi,Maria Varela,Young-Min Kim,Jae Hyuck Jang

DOI: https://doi.org/10.1186/s40543-018-0142-4

2018-04-11

Abstract:Scanning transmission electron microscopy (STEM) has advanced rapidly in the last decade thanks to the ability to correct the major aberrations of the probe-forming lens. Now, atomic-sized beams are routine, even at accelerating voltages as low as 40 kV, allowing knock-on damage to be minimized in beam sensitive materials. The aberration-corrected probes can contain sufficient current for high-quality, simultaneous, imaging and analysis in multiple modes. Atomic positions can be mapped with picometer precision, revealing ferroelectric domain structures, composition can be mapped by energy-dispersive X-ray spectroscopy (EDX) and electron energy loss spectroscopy (EELS), and charge transfer can be tracked unit cell by unit cell using the EELS fine structure. Furthermore, dynamics of point defects can be investigated through rapid acquisition of multiple image scans. Today STEM has become an indispensable tool for analytical science at the atomic level, providing a whole new level of insights into the complex interplays that control material properties.

chemistry, analytical
An electron microscope for the aberration-corrected era

O.L. Krivanek,G.J. Corbin,N. Dellby,B.F. Elston,R.J. Keyse,M.F. Murfitt,C.S. Own,Z.S. Szilagyi,J.W. Woodruff

DOI: https://doi.org/10.1016/j.ultramic.2007.07.010

IF: 2.994

2008-02-01

Ultramicroscopy

Abstract:Improved resolution made possible by aberration correction has greatly increased the demands on the performance of all parts of high-end electron microscopes. In order to meet these demands, we have designed and built an entirely new scanning transmission electron microscope (STEM). The microscope includes a flexible illumination system that allows the properties of its probe to be changed on-the-fly, a third-generation aberration corrector which corrects all geometric aberrations up to fifth order, an ultra-responsive yet stable five-axis sample stage, and a flexible configuration of optimized detectors. The microscope features many innovations, such as a modular column assembled from building blocks that can be stacked in almost any order, in situ storage and cleaning facilities for up to five samples, computer-controlled loading of samples into the column, and self-diagnosing electronics. The microscope construction is described, and examples of its capabilities are shown.

microscopy
Design of Electrostatic Aberration Correctors for Scanning Transmission Electron Microscopy

Stephanie M. Ribet,Steven E. Zeltmann,Karen C. Bustillo,Rohan Dhall,Peter Denes,Andrew M. Minor,Roberto dos Reis,Vinayak P. Dravid,Colin Ophus

2023-03-17

Abstract:In a scanning transmission electron microscope (STEM), producing a high-resolution image generally requires an electron beam focused to the smallest point possible. However, the magnetic lenses used to focus the beam are unavoidably imperfect, introducing aberrations that limit resolution. Modern STEMs overcome this by using hardware aberration correctors comprised of many multipole lenses, but these devices are complex, expensive, and can be difficult to tune. We demonstrate a design for an electrostatic phase plate that can act as an aberration corrector. The corrector is comprised of annular segments, each of which is an independent two-terminal device that can apply a constant or ramped phase shift to a portion of the electron beam. We show the improvement in image resolution using an electrostatic corrector. Engineering criteria impose that much of the beam within the probe-forming aperture be blocked by support bars, leading to large probe tails for the corrected probe that sample the specimen beyond the central lobe. We also show how this device can be used to create other STEM beam profiles such as vortex beams and beams with a high degree of phase diversity, which improve information transfer in ptychographic reconstructions.

Materials Science
Aberration corrected STEM and EELS: Atomic scale chemical mapping

A. L. Bleloch,M. Gass,L. Jiang,B. Mendis,K. Sader,P. Wang

DOI: https://doi.org/10.1007/978-3-540-85156-1_1

2008-01-01

Imaging & Microscopy

Abstract:Scanning transmission electron microscopy (STEM) has enjoyed a recent surge in activity for two reasons. A long awaited improvement in the STEM performance of conventional TEM/STEM instruments coincided with the advent of aberration correction. This improvement was not for any fundamental reason — from the principle of reciprocity, the STEM resolution should be at least as good as the TEM resolution for the same objective lens. Lattice resolution high angle annular dark field (HAADF) STEM images are now a much more routine part of the analytical arsenal applied to materials characterisation.
Applications of Aberration Corrected TEM and Exit Wavefunction Reconstruction to Materials Science

Angus Kirkland,Judy Kim,Jamie Warner,Konstantin Borisenko,Sarah Haigh,Neil Young,Peng Wang,Peter Nellist

DOI: https://doi.org/10.1017/s1431927614006370

IF: 4.0991

2014-01-01

Microscopy and Microanalysis

Abstract:The initial announcement of two successful alternative geometries of successful aberration correctors for TEM [1] and STEM [2] in 1997 has led to significant improvements in spatial resolution and the availability of higher probe current densities for analysis. There are now in excess of 400 aberration correctors installed worldwide. The Oxford-JEOL 2200MCO was the first instrument fitted with two aberration correctors, installed in 2003 [3] and this instrument has more recently been upgraded with a monochromated source [4].
Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope

Peng Wang,Angus I. Kirkland,Peter D. Nellist,Adrian J. D’Alfonso,Andrew J. Morgan,Leslie J. Allen,Ayako Hashimoto,Masaki Takeguchi,Kazutaka Mitsuishi,Masayuki Shimojo

DOI: https://doi.org/10.1017/s1431927612004515

IF: 4.0991

2012-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
B23-O-04Probing the Atomic and Electronic Structure in Materials Through Aberration-Corrected Scanning Transmission Electron Microscopy

Lin Gu,Xin-An Yang

DOI: https://doi.org/10.1093/jmicro/dfv162

2015-01-01

Microscopy

Abstract:Atoms are the basic building block of materials, understanding materials on a fundamental level requires probing the locations and properties of all the atoms [ 1 ] . The success of aberration correction has revolutionized the transmission electron microscopy, both imaging and spectroscopy in aberration-corrected electron microscopy with atomic resolution have been achieved [ 2 ] . In particular, the advent of annular bright field imaging (ABF) in aberration-corrected scanning transmission electron microscopy (STEM) has enabled direct visualization of the configuration of light atoms that play a non-trivial role in relevant materials [ 3 ] , which provides an unprecedented opportunity to identify both light and heavy atoms in materials when combined with high angle annular dark field (HAADF) imaging in STEM sensitive to heavy atoms [ 4 ] . In this talk, we will present our recent efforts on probing the atomic and electronic structure of materials (energy storage materials, catalysts, strongly correlated oxides, etc.) using a suit of techniques based on aberration-corrected STEM.
Aberration corrected STEM by means of diffraction gratings

Martin Linck,Peter A Ercius,Jordan S Pierce,Benjamin J McMorran

DOI: https://doi.org/10.1016/j.ultramic.2017.06.008

IF: 2.994

Ultramicroscopy

Abstract:In the past 15 years, the advent of aberration correction technology in electron microscopy has enabled materials analysis on the atomic scale. This is made possible by precise arrangements of multipole electrodes and magnetic solenoids to compensate the aberrations inherent to any focusing element of an electron microscope. Here, we describe an alternative method to correct for the spherical aberration of the objective lens in scanning transmission electron microscopy (STEM) using a passive, nanofabricated diffractive optical element. This holographic device is installed in the probe forming aperture of a conventional electron microscope and can be designed to remove arbitrarily complex aberrations from the electron's wave front. In this work, we show a proof-of-principle experiment that demonstrates successful correction of the spherical aberration in STEM by means of such a grating corrector (GCOR). Our GCOR enables us to record aberration-corrected high-resolution high-angle annular dark field (HAADF-) STEM images, although yet without advancement in probe current and resolution. Improvements in this technology could provide an economical solution for aberration-corrected high-resolution STEM in certain use scenarios.
Aberration-corrected Scanning Transmission Electron Microscopy for Complex Transition Metal Oxides

Qing-Hua Zhang,Dong-Dong Xiao,Lin Gu

DOI: https://doi.org/10.1088/1674-1056/25/6/066803

2016-01-01

Chinese Physics B

Abstract:Lattice, charge, orbital, and spin are the four fundamental degrees of freedom in condensed matter, of which the interactive coupling derives tremendous novel physical phenomena, such as high-temperature superconductivity (high-T-c SC) and colossal magnetoresistance (CMR) in strongly correlated electronic system. Direct experimental observation of these freedoms is essential to understanding the structure-property relationship and the physics behind it, and also indispensable for designing new materials and devices. Scanning transmission electron microscopy (STEM) integrating multiple techniques of structure imaging and spectrum analysis, is a comprehensive platform for providing structural, chemical and electronic information of materials with a high spatial resolution. Benefiting from the development of aberration correctors, STEM has taken a big breakthrough towards sub-angstrom resolution in last decade and always steps forward to improve the capability of material characterization; many improvements have been achieved in recent years, thereby giving an in-depth insight into material research. Here, we present a brief review of the recent advances of STEM by some representative examples of perovskite transition metal oxides; atomic-scale mapping of ferroelectric polarization, octahedral distortions and rotations, valence state, coordination and spin ordering are presented. We expect that this brief introduction about the current capability of STEM could facilitate the understanding of the relationship between functional properties and these fundamental degrees of freedom in complex oxides.
Establishment of Annular Dark-Field Scanning Confocal Electron Microscopy using a Double Aberration-Corrected Microscope

A Hashimoto,P Wang,M Shimojo,K Mitsuishi,AI Kirkland,PD Nellist,M Takeguchi

DOI: https://doi.org/10.1017/S1431927610058022

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Three-Dimensional Resolution Limits and Image Contrast Mechanisms in Scanning Confocal Electron Microscopy

PD Nellist,P Wang,G Behan,AI Kirkland,A Hashimoto,M Shimojo,K Mitsuishi,M Takeguchi,E Cosgriff,AJ D'Alfonso,LJ Allen,SD Findlay

DOI: https://doi.org/10.1017/s1431927610057533

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Making the link between ADF and 4D STEM: Resolution, transfer and coherence

Peter D. Nellist,Timothy J. Pennycook

DOI: https://doi.org/10.1088/1674-1056/ad8554

2024-10-12

Chinese Physics B

Abstract:Steve Pennycook is a pioneer in the application of high-resolution scanning transmission electron microscopy (STEM) and in particular the use of annular dark-field (ADF) imaging. Here we show how a general framework for 4D STEM allows clear links to be made between ADF imaging and the emerging methods for reconstructing images from 4D STEM data sets. We show that both ADF imaging and ptychographical reconstruction can be thought of in terms of integrating over the overlap regions of diffracted discs in the detector plane. This approach allows the similarities in parts of their transfer functions to be understood, though we note the transfer functions for ptychographic imaging cannot be used as a measure of information transfer. We also show that conditions of partial spatial and temporal coherence affect ADF imaging and ptychography similarly, showing that achromatic interference can always contribute to the image in both cases leading to a robustness to partial temporal coherence that has enabled high-resolution imaging.

physics, multidisciplinary

Interface Structure-Property Relations Through Aberration-Corrected STEM

Aberrations in Structured Illumination Microscopy: A Theoretical Analysis

Untangling Coupled Order Parameters at Complex Oxide Interfaces with Aberration-Corrected STEM and EELS

Multidimensional Images and Aberrations in STEM

Atomic Cluster Structure Identification Using Aberration-corrected Scanning Transmission Electron Microscopy

Materials Structure, Properties and Dynamics through Scanning Transmission Electron Microscopy

Determination of Atomic Structures of Crystal Defects, Interfaces and Surfaces Via Aberration-Corrected Transmission Electron Microscopy

Applications of Aberration-corrected TEM and STEM in Complex Oxides and Nanostructured Materials

Progress and Prospects of Aberration-Corrected STEM for Functional Materials.

Material structure, properties, and dynamics through scanning transmission electron microscopy

An electron microscope for the aberration-corrected era

Design of Electrostatic Aberration Correctors for Scanning Transmission Electron Microscopy

Aberration corrected STEM and EELS: Atomic scale chemical mapping

Applications of Aberration Corrected TEM and Exit Wavefunction Reconstruction to Materials Science

Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope

B23-O-04Probing the Atomic and Electronic Structure in Materials Through Aberration-Corrected Scanning Transmission Electron Microscopy

Aberration corrected STEM by means of diffraction gratings

Aberration-corrected Scanning Transmission Electron Microscopy for Complex Transition Metal Oxides

Establishment of Annular Dark-Field Scanning Confocal Electron Microscopy using a Double Aberration-Corrected Microscope

Three-Dimensional Resolution Limits and Image Contrast Mechanisms in Scanning Confocal Electron Microscopy

Making the link between ADF and 4D STEM: Resolution, transfer and coherence